The absorbance spectra of the NGQDs were recorded using a UV–vis–near-infrared spectrophotometer (Carry-5000, Agilent Technologies). The PL spectra were recorded at excitation wavelengths (λex) of 379 and 405 nm using a PL spectrophotometer (Darsa, PSI Trading Co. Ltd.) with a Xe lamp. Time-resolved PL decay was measured via the time-correlated single-photon counting (TCSPC) technique using a time-resolved spectroscopy system (TRSS, Fluo Time 200, PicoQuant). A laser with an excitation wavelength of 379 nm was used to excite all of the NGQD samples. A photomultiplier tube (PMT) was used for the detection of the emitted light by the NGQD samples. To study the atomic structure of the NGQDs, HRTEM (HF-3300/NB5000/S-4800, Hitachi) was utilized. The elemental composition of the NGQDs was determined via XPS (ESCALAB 250Xi, Thermo Fisher Scientific). The XPS peaks were calibrated using the C1s peak. The Raman spectra were recorded using a confocal Raman spectrometer (Nicolet Almega XR, Thermo Fisher Scientific) with a λex value of 532 nm.
Nicolet almega xr
Manufactured by Thermo Fisher Scientific
Sourced in United States
The Nicolet Almega XR is a high-performance Raman spectrometer designed for advanced materials analysis. It features a compact and modular design, providing users with a versatile and reliable instrument for a wide range of applications. The core function of the Nicolet Almega XR is to accurately measure and analyze the molecular composition and structure of various materials through Raman spectroscopy.
Automatically generated - may contain errors
Lab products found in correlation
Escalab 250xi, by Thermo Fisher Scientific (2 mentions)
Hf 3300 nb5000 s 4800, by Hitachi (1 mentions)
Carry 5000, by Agilent Technologies (1 mentions)
Fluotime 200, by PicoQuant (1 mentions)
Phenom prox, by Thermo Fisher Scientific (1 mentions)
Em uc7, by Leica (1 mentions)
Fe sem s 4800, by Hitachi (1 mentions)
Em 002b, by Topcon (1 mentions)
Su8020, by Hitachi (1 mentions)
D max 2550 pc xrd, by Rigaku (1 mentions)
Hf 3300, by Hitachi (1 mentions)
Ds 11, by DeNovix (1 mentions)
Jem 2010, by JEOL (1 mentions)
Sigma 300, by Zeiss (1 mentions)
Su8230, by Hitachi (1 mentions)
Orion nanofab, by Zeiss (1 mentions)
Xe 150, by Park Systems (1 mentions)
9 protocols using nicolet almega xr
1
Characterization of Nitrogen-Doped Graphene Quantum Dots
2
Microstructural Characterization of Pickering Emulsions
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The evolution of Pickering emulsions from droplets to microparticles was monitored under optical microscopic observation starting from 5 min after the addition of the oil phase into the aqueous phase, and afterward, every 10 min until the end of the fabrication process (3 h). These aliquots were deposed on glass microscope slides and directly observed in transmission mode using the Livenhuk 320 microscope (Levenhuk, Inc., Tampa, FL, USA).
The formed microparticles were characterized using scanning electron microscopy (SEM) (Phenom ProX, Thermo Fisher Scientific, Waltham, MA, USA) equipped with energy-dispersive X-ray spectroscopy (EDX). Microparticles’ cross-sections were obtained using the ultramicrotome Leica EM UC7 (Leica Microsystems, Wetzlar, Germany) equipped with glass knives. The particles were fixed in epoxy resin (UHU Plus Schnellfest, Baden, Germany) before the slicing.
The distribution of components within microparticles was studied by using a dispersive Raman spectrometer (Nicolet Almega XR, Thermo Fisher Scientific, Waltham, MA, USA). Spectra and spectral maps were registered using an exciting laser with a wavelength of 532 nm. A microscopic 50× (n.a. 0.75) microobjective was used. A 5 µm step was used in the surface mapping mode measuring.
The formed microparticles were characterized using scanning electron microscopy (SEM) (Phenom ProX, Thermo Fisher Scientific, Waltham, MA, USA) equipped with energy-dispersive X-ray spectroscopy (EDX). Microparticles’ cross-sections were obtained using the ultramicrotome Leica EM UC7 (Leica Microsystems, Wetzlar, Germany) equipped with glass knives. The particles were fixed in epoxy resin (UHU Plus Schnellfest, Baden, Germany) before the slicing.
The distribution of components within microparticles was studied by using a dispersive Raman spectrometer (Nicolet Almega XR, Thermo Fisher Scientific, Waltham, MA, USA). Spectra and spectral maps were registered using an exciting laser with a wavelength of 532 nm. A microscopic 50× (n.a. 0.75) microobjective was used. A 5 µm step was used in the surface mapping mode measuring.
3
Characterization of Dispersed CNT Structures
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Scanning electron microscopy (SEM) (FE-SEM S-4800, Hitachi High-Technologies Co.) was performed to observe the dispersed CNT structures. The specimens for SEM were made by spin-coating the CNT-MIBK dispersions on Si substrates. Transmission electron microscopy (TEM) (EM-002B, TOPCON Corp.) was used to investigate the dispersion morphology in more detail. Sonication treatments are commonly used for preparing TEM specimens of CNTs. Since this step may lead to the structural changes of original CNT dispersion, we diluted the dispersion solution and dropped directly on TEM grids. Laser diffraction (LD) measurement was performed to estimate the sizes of the dispersed tubes or bundles using an LD analyzer (MT3300EX, NIKKISO Co., Ltd.). The CNT dispersions were diluted with MIBK before the measurements. Raman spectra of the CNT-MIBK dispersions, which were drop-cast onto glass-slides were obtained using a Raman spectrometer (Nicolet Almega XR, Thermo Fisher Scientific Inc.) with laser excitation at a wavelength of 532 nm.
4
Characterization of Carboxymethyl Cellulose Nanoflowers
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A high-resolution transmission electron microscope (HR-TEM, Hitachi/HF-3300) was utilized to determine the morphology and composition of NFs. The surface morphology and structure of CMC NFs were assessed using a high-resolution field-emission SEM (HR-FE-SEM, Hitachi/SU8020). Then, the absorption spectrum of FA–CMC NFs was acquired with a nanodrop (DS-11+, DeNovix, USA) spectrophotometer, in which the absorbance of the surface-modified NFs was studied as a function of wavelength. The X-ray diffraction (XRD, D/max-2550 PC XRD, Rigaku) technique was used to determine the crystallinity of CMC NFs at 2θ values of 10–80°. The purity and surface oxidation were demonstrated using an X-ray photoelectron spectrometer (XPS) in the fabricated CMC NFs (Thermo Scientific/ESCALAB 250Xi). The Raman spectrum of the nanoflower was obtained using a inVia-Reflex micro-Raman spectroscopy (Thermo Scientific/Nicolet Almega XR) system using a laser with a wavelength of 532 nm.
5
Characterization of PAA/ZnO/Ag Composite
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The synthesized
PAA/ZnO/Ag composite
material was analyzed by TEM and high-resolution TEM (HRTEM) (Tecnai
F20) under a 200 kV operating voltage. The high-angle annular dark-field
(HAADF) image and elemental mapping image were obtained under an American
FEI Tecnai G2 F30 S-TWIN field emission transmission electron
microscope (at 300 kV). The optical properties were determined using
a Lambda 35 UV–vis spectrometer. The SERS signal was recorded
using a Thermo Nicolet Almega XR with 514 nm laser excitation with
an integration time of 0.2 s.
PAA/ZnO/Ag composite
material was analyzed by TEM and high-resolution TEM (HRTEM) (Tecnai
F20) under a 200 kV operating voltage. The high-angle annular dark-field
(HAADF) image and elemental mapping image were obtained under an American
FEI Tecnai G2 F30 S-TWIN field emission transmission electron
microscope (at 300 kV). The optical properties were determined using
a Lambda 35 UV–vis spectrometer. The SERS signal was recorded
using a Thermo Nicolet Almega XR with 514 nm laser excitation with
an integration time of 0.2 s.
6
Comprehensive Characterization of LiFePO4/C Composite
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Powder X-ray diffraction (PXRD) analysis of the powdered samples was performed using a Bruker D8-Advantage powder diffractometer with Cu Kα radiation (λ = 1.5405 Å, 45 kV, 50 mA) between 10° and 80° in reflection geometry mode. The morphology and microstructure of the samples were characterized using a scanning electron microscope (SEM, Sigma 300, ZEISS) equipped with an energy dispersive spectrometer (EDS, Oxford). The carbon coating layer was characterized using a high-resolution transmission electron microscope (HRTEM, JEOL JEM-2010). The carbon layer on the surface of LiFePO4/C was characterized using a Raman spectrometer (Thermo Fisher Scientific, Nicolet Almega XR) and an argon ion laser operating at 632.8 nm. The carbon content of LiFePO4/C was determined using a high-frequency infrared carbon–sulfur analyzer (HCS-800B). The specific surface area was measured by a nitrogen adsorption method using a Brunauer–Emmett–Teller (BET) analyzer (3H-2000PSA2, BeiShiDe Instruments, China). The electronic conductivity of LiFePO4/C composites was measured using a multifunction digital four-probe tester (Suzhou Jingge Electronic Co., Ltd) under 2 MPa.
7
SERS Evaluation of Nanostructured Scales
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For SERS evaluation, we used the Nicolet Almega XR, Thermo Fisher Scientific, with an excitation wavelength of 633 nm unless described otherwise. The aperture size was 100 μm with × 50 objective lens. The power setting of 670 µW was chosen to prevent photo damage. Whenever a new data set was to be taken for a particular type of scale prepared, two scales were probed at five randomly selected locations. The exposure time was 1 s, averaged over 16 measurements. For calculations of error bars showing the standard deviation, spectra obtained from five randomly selected spots of two separate scales, thus a total of ten spectra were used. For the investigation into polarization angle dependence, a single scale was selected and placed on a rotating stage. The relative angle between the polarization direction and the long axis of the scales was changed from 0 to 90 degrees at an increment of 30 degrees.
8
Characterization of TIMs Surface
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The surface morphology of the TIMs was observed using field-emission scanning electron microscopy (FE-SEM, SU8230, Hitachi). Their Raman spectra were observed using a Raman spectroscopy system (Nicolet Almega XR, Thermo Scientific) with a laser wavelength of 532 nm. The surface roughness was characterized by a profilometer (Alpha-Step, KLA Tencor).
9
Multimodal Characterization of Cells
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For HIM imaging, HIM measurements were performed on an Orion NanoFab instrument (Carl Zeiss, USA) at 30 keV of beam energy and 0.3–0.9 pA of probe current. Electron flood gun was used to compensate charging effects for biological samples without graphene or metal coating. For Raman spectroscopy analysis, graphene transferred on cells and the same region treated by air-plasma afterward were analyzed (Nicolet Almega XR, Thermo Scientific, USA) using a 532 nm laser source. For atomic force microscopy (AFM), topographical images of air-dried cells, graphene-covered cells, and graphene-removed cells over 90 × 90 μm2 with 256 × 256 pixels were acquired by large sample atomic force microscope (XE-150, Park Systems, Korea) at 0.3 Hz scan rate.
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