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Gemini 300 microscope

Manufactured by Zeiss

The Zeiss Gemini 300 is a high-performance scanning electron microscope (SEM) designed for advanced material analysis. It features a field emission electron source and advanced imaging capabilities, providing high-resolution, low-voltage imaging of a wide range of samples.

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4 protocols using gemini 300 microscope

1

Crystallization Analysis of Glass Samples

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Each powdered glass sample was set to undergo the same heat treatment process as the DTA test in a routine furnace to prepare the corresponding crystallized samples for further identification of the crystals. The above obtained DTA curves of 10 °C/min were used as the reference. Each powdered glass sample was heated from 30 °C to the end temperature of the exothermic peak, and then, quenched by air. The heating rate of this process was 10 °C/min. The crystals in these heat-treated samples were tested first via XRD. The morphology and phase composition were tested using a scanning electron microscope (SEM) and an energy dispersive X-ray spectrometer (EDS). All of the crystallized samples were divided into two parts. One part was ground into powder to undergo XRD measurement using an X’Pert PRO MPD X-ray diffractometer. The other part was used to prepare the SEM sample by being embedded with resin and polished to expose the cross-section. After being coated with Pt, this sample was used to perform an SEM-EDS test to analyze the crystal phases’ composition and morphology. The SEM-EDS tests were carried out using a Gemini 300 microscope manufactured by Zeiss matching an EDS (model: Ultim MAX, OXFORD).
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2

Advanced Material Characterization Techniques

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Scanning electron microscopy was performed using a Zeiss Gemini 300 microscope at a voltage of 3 kV. Transmission electron microscopy was conducted on a Hitachi HT 7700 operating at 120 kV. Powder X-ray diffraction characterization was carried out using a Bruker D8 Advance X-ray diffractometer with Cu Kα radiation. Photoluminescence emission profiles and decay curves were obtained using an FSL-1000 (Edinburgh Instruments Ltd.). PLQY measurements were performed on a C9920-02G system (Hamamatsu). Radioluminescence emission profiles were acquired using an Edinburgh FS5 fluorescence spectrophotometer (Edinburgh Instruments Ltd.), equipped with an external miniature X-ray source from AMPEK, Inc.
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3

Evaluating Degradation of Composite Scaffolds

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For the degradation evaluation, VMT NSs (100 mg) were immersed in phosphate-buffered saline (PBS, 10 mL, pH = 7.4) for 7 days, and the supernatant liquid was collected and exchanged at 1, 2, 3, 4, 5, 6, and 7 days. Similarly, the composite scaffolds with an average area of 2.5 × 5 cm2 were sealed in PBS solution (10 mL, pH = 7.4) for 14 days, and the mixture solutions were withdrawn and refreshed at 1, 2, 4, 7, 10, and 14 days. All samples were incubated at 37 °C in a shaker at a speed of 100 rpm. The supernatant was assayed by ICP for Mg and Si elemental concentration analysis, and the morphological changes of composite scaffolds were observed by SEM (Zeiss Gemini 300 microscope).
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4

Comprehensive Material Characterization

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Transmission electron microscopy (TEM) images and energy-dispersive spectroscopy (EDS) profiles were obtained on JEOL JEM 2100 F microscope. Scanning electron microscopy (SEM) images and element mappings were acquired by Zeiss Gemini 300 microscope. Fourier transform infrared (FTIR) spectra were recorded in the range of 4000–400 cm−1 on an FTIR spectrometer (Thermo Scientific Nicolet iS20). X-ray diffraction (XRD) patterns were recorded on a Bruker D8 Advanced diffractometer with Cu Kα irradiation in an ambient atmosphere under constant conditions (40 kV, 40 mA, scanning range 10–65° 2θ, scanning speed 0.5°/min).
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