This method was employed in accordance with that described above [31 (link), 56 (link)]. Specimen were imaged with a Nanowirzard-II BioAFM (JPK Instruments AG, Berlin, Germany, www.jpk.com ) operating in dynamic mode and using non-contact Si cantilevers (NSG11, NT-MDT–Moscow, Russia, www.ntmdt.com or ARROW-NCR, Nano World-Neuchȃtel, Switzerland, www.nanoworld.com ) with tip radii of <7–10 nm, spring constants of 20–40 N/m, and resonance frequencies of 285–325 kHz. After fibrillization, 5–10μL samples were spread onto a freshly cleaved mica sheet and left to adhere for 10-20min. Samples were then washed with distilled H2O and dried naturally. The images were acquired at line scan rates of 0.5–1 Hz at room temperature (RT). The AFM free oscillation amplitudes ranged from 25nm to 40nm, with characteristic set points ranging from 75% to 90%. AFM data were analyzed with Gwyddion (www.gwyddion.net ).
Arrow ncr
Manufactured by NanoWorld
Sourced in Switzerland
The ARROW-NCR is a high-resolution atomic force microscope (AFM) designed for nanoscale imaging and analysis. It features a compact and stable design, making it suitable for a wide range of applications in materials science, nanotechnology, and surface characterization.
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Lab products found in correlation
2 protocols using arrow ncr
1
Nanoscale Imaging of Protein Fibrillization
2
ATR-FTIR and Tapping Mode AFM Analysis
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ATR-FTIR spectra were obtained in a Varian 660 spectrometer equipped with an attenuated total reflection (ATR) accessory (MIRacle ATR, Pike technologies) with a ZnSe prism. In all cases, each spectrum was the result of 256 scans taken with a resolution of 2 cm -1 .
Tapping ® mode AFM (Nanoscope V; Bruker, Santa Barbara, CA) in topographic mode was used to characterize the substrates, using silicon tips (Arrow™ NCR; NanoWorld, Neuchâtel, Switzerland) (spring constant, 42 N/m; resonance frequency, 285 kHz). Nanoscope 7.30 and Nanoscope Analyis 1.5 softwares were employed to obtain the images (Bruker).
Tapping ® mode AFM (Nanoscope V; Bruker, Santa Barbara, CA) in topographic mode was used to characterize the substrates, using silicon tips (Arrow™ NCR; NanoWorld, Neuchâtel, Switzerland) (spring constant, 42 N/m; resonance frequency, 285 kHz). Nanoscope 7.30 and Nanoscope Analyis 1.5 softwares were employed to obtain the images (Bruker).
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