Axs d8 advance

The characterization by X-ray powder diffraction was carried out using a Bruker AXS D8 Advance (Bruker, Germany) diffractometer in the range 1–30° 2Θ using CuKα (λ = 0.154178 nm) radiation.
Infrared (IR) spectra were measured in transmission mode using Tensor 27 FTIR spectrometer (Bruker, Germany) equipped with an MCT (Mercury-Cadmium-Telluride) detector at spectral resolution of 2 cm⁻¹. Before measurement a sample was deposited on an IR-transparent silicon wafer (pure for electronic purposes) by placing its ethanol solution directly on the disc and evaporating the solvent. The wafer was placed in an IR cell with KBr windows and slowly heated under constant pumping (10⁻³ Torr) to 50°C (with the drug present) or 100°C (pure MOF).
Scanning Electron Microscopy (SEM) analysis was performed using Nova Nano SEM 200 (FEI Europe B.V.) cooperating with the Element Energy Dispersive Spectroscopy (EDS) analyzer (EDAX Inc., U.S.A.) using secondary electrons in low vacuum conditions (60 Pa). Samples of MOF without treatment, MOF after milling and MOF after milling and sonication were analyzed.
The particle size distribution of the powder samples was measured in terms of particle diameter at 50% in the cumulative distribution (Dx (38 (link))) using laser diffraction particle size analyzer Mastersizer 3000 (Malvern Instruments Ltd., United Kingdom).

Powder diffractograms were recorded on a Bruker AXS D8 Advance diffractometer in the Bragg-Brentano geometry, with Cu K_α1 radiation λ = 1.5406 Å, in the 2θ range from 6 to 60°. The reference data was taken from the Inorganic Crystal Structure Database (ICSD). The composition of prepared materials was analysed by Inductively Coupled Plasma-Optical Emission Spectrometer Varian ICP-OES VISTA-MPX and EA Vario EL III. Transmission-electron-microscopy (TEM) images were recorded on an FEI Tecnai G2 20 X-TWIN transmission electron microscope, which used an accelerating voltage of 200 kV. Fourier transform infrared spectra (FT-IR) were recorded using a JASCO 4200 FT-IR spectrophotometer. DLS and zeta potential measurements were performed by using a Malvern Zetasizer Nano ZS instrument.
The luminescence characteristics (excitation, emission spectra, luminescence decays) of the prepared samples were measured on a QuantaMaster^TM 40 spectrophotometer equipped with an Opolette 355LD UVDM tunable laser, with a repetition rate of 20 Hz and a Hamamatsu R928 photomultiplier used as a detector for emission/excitation spectra and decay time measurements. A continuous Dragon Lasers DPSS 980 nm laser was used as the excitation source, coupled to a 200 µm optical fibre and collimator to determine dependencies between emission intensity and laser power.

The static powder XRD as a function of temperature was measured in Debye-Scherrer geometry on a Bruker AXS D8 Advance (Mo-K_α radiation selected with a focusing Göbel mirror) equipped with a MRI high temperature capillary furnace and a high-energy LynxEye detector. The flake form Ti₃O₅ powder sample^{14 (link)} was sealed in a quartz capillary of 0.3 mm in diameter.

Low temperature N₂ adsorption/desorption measurements were performed using the Micromeritics ASAP 2020 instrument (Norcross, GA, USA). Prior to the analysis, the sample (ca. 100 mg) was outgassed at 373 K under vacuum (<1.3 Pa) for 20 h. The surface area of samples was calculated using the BET method, with a measurement error of less than 2 m² g⁻¹. Pore volume and diameter were determined by DFT method.
XRD measurements were performed using a Bruker AXS D8 Advance diffractometer (Bruker, Karlsruhe, Germany) with Cu Kα radiation (λ = 0.154 nm) at a step of 0.05° s⁻¹.
Elemental analyses of the solids were carried out with Elementar Analyser Vario EL III (Elementar Analysensysteme GmbH, Hanau, Germany).
UV-VIS spectra were recorded using a Varian-Cary 300 Scan UV-Visible Spectrophotometer (Candela, Warszawa, Poland)

Brunauer–Emmett–Teller (BET) surface area, pore volume, pore size, and the adsorption–desorption isotherms were measured by using a Micromeritics ASAP 2020. The X-ray diffraction (XRD) patterns of samples were recorded on a Bruker AXS D8 Advance X-ray diffractometer using Cu (Kα) radiation with 0.02° step in the 2θ range from 10 to 80°. Diffuse-reflectance UV-vis spectra (UV-vis DRS) were obtained in the range of 200–700 nm with a Shimadzu UV-3600 Plus Spectrometer, using BaSO₄ as reference. The Raman spectra of the samples were recorded on a Renishaw Micro Raman Spectrometer in the range from 200 to 1200 cm⁻¹ (excitation line: 785 nm of diode solid-state laser). Transmission electron microscopy (TEM) images of the catalysts were taken in a Tecnai G2 F30 S-Twin TEM operating at 200 kV. The XPS data were collected using X-ray photoelectron spectrometer Thermo SCIENTIFIC ESCALAB 250xi with an Al-Kα (1486.8 eV) X-ray source. ICP-OES were performed on an Agilent 5100 inductively coupled plasma-optical emission spectrometer.