where IC and IA refer to the cumulative diffraction intensity of the crystallized region and the amorphous region, respectively.
D8 advance
The D8 Advance is an X-ray diffractometer designed for phase identification, quantification, and structural analysis of materials. It features a sealed X-ray tube, a goniometer for precise sample positioning, and a high-resolution detector. The core function of the D8 Advance is to obtain detailed information about the crystallographic structure and composition of various materials.
Lab products found in correlation
7 protocols using d8 advance
Crystalline Structure Analysis via XRD
where IC and IA refer to the cumulative diffraction intensity of the crystallized region and the amorphous region, respectively.
Comprehensive Instrumentation for Advanced Materials Analysis
All the instruments used in this study were: Field Emission Scanning Electron Microscopy/FESEM (MIRA3 TESCAN), EXD (MIRA3 TESCAN), Transmission Electron Microscopy/TEM (JEOL JEM-1010), Fourier Transform Infrared spectroscopy/FTIR (FT-IR Perkin Elmer Spectrum 100 spectrometer), X-ray diffraction/XRD (Bruker D8 Advance), Zetasizer (Malvern), Polymerase Chain Reaction/PCR (Thermocycler), ELISA microplate reader (BioTek China), Fluorescence microscope (LSM 510, Carl by Zeiss European Molecular Biology Laboratory), Fluorescence-activated cell sorting (FACS) (BD FACScan, USA), Ultraviolet-Visible (UV-Vis) spectrophotometer (Lambda 950, PerkinElmer, UK), Heating magnetic stirrer (IKA-RCT-B, IKA China), Franz diffusion cell (China).
X-ray Diffraction Analysis of Adhesive Samples
Chemical and Structural Analysis of Powder Samples
The powder X-ray diffraction patterns of the samples were registered by using X-ray powder diffractometer (XRD) (D8 Advance) operating at 50 kV and 40 mA in a step size of 0.02° in the range of 10° to 100°, and a X’Pert Pro, PANalytical code was used to do the Rietveld refinement of the XRD patterns with a step size of 0.01° using the same operating voltage and current. The lattice constants a and c were directly obtained from the refinement of the X-ray data using the Jade software.
Differential scanning calorimeter (DSC) is conducted in a Netzch STA 449 F3 Jupiter equipped with a TASC414/4 controller. The instrument is calibrated from a standard list. The sample of the powder (x = 0.15) is loaded into an open alumina crucible. The measurement is performed between ~300 K to ~820 K with a heating rate of 5 K min−1 in Ar atmosphere.
Comprehensive Chemical and Structural Analysis of Powders
The structural analysis of the powders was made by powder X-ray diffractometer (D8 Advance) operating at 50 kV and 40 mA at Cu Kα radiation (λ = 0.15406 nm) in the 2θ range from 10° to 110° with a step size of 0.02°, and a X'Pert Pro, PANalytical code was used to do the Rietveld refinement of the XRD patterns with a step size of 0.01° using the same operating voltage and current. The lattice constants a and c were directly obtained from the refinement of the XRD patterns using Jade software (Highscore (plus) Software version 4.0 by PANalytical B.V; Almelo, The Netherlands)32 (link) with an error less than 10%.
Differential Scanning calorimeter (DSC) and thermogravimetry (TG) were conducted in a Netzch STA 449 F3 Jupiter equipped with a TASC414/4 controller. The instrument was calibrated from a standard list. The sample of the powder (x = 0) was loaded into an open alumina crucible. The measurement was performed after the samples were heated up to ∼850 K with a heating rate of 5 K min−1 in Ar atmosphere.
Characterization of Silver Nanoparticle-Chitosan Composite Spheres
Structural Analysis of Cu2-xSbxGa4Te7
The chemical compositions of the samples Cu2−xSbxGa4Te7 (x = 0, 0.2) were checked using an electron probe micro-analyzer (EPMA) (S-4800, Hitachi, Japan) with an accuracy of >97%.
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