Uv 2401pc spectrometer
The UV-2401PC spectrometer is a high-performance UV-Vis spectrophotometer designed for analytical applications. It features a wide wavelength range, high-resolution optics, and advanced data processing capabilities. The instrument is capable of performing accurate measurements of absorption, transmittance, and reflectance spectra across a variety of samples.
Lab products found in correlation
29 protocols using uv 2401pc spectrometer
Comprehensive Structural Elucidation Protocol
Optimizing UV Exposure for Cell Viability
Spectroscopic Analysis of Organic Compounds
Comprehensive Analytical Characterization
Compound 5 Protein Binding Assay
Analytical Techniques for Natural Product Characterization
Purification and Characterization of Natural Compounds
Spectroscopic Characterization of Chemical Compounds
Characterization of Organic Compounds
Characterizing SWCNT-based Transparent Conductive Films
SWCNT-TCF transparency
was assessed by measuring the visible light transmittance (T %) at 550 nm in a Shimadzu UV-2401PC spectrometer. The
film thickness was calibrated with a Bruker Stylus Profiler model
Dektak XT.
The sheet resistance was measured in a two-probe
configuration using a Keithley 4200 unit provided with tungsten needles.
Two silver electrodes were painted along the longest sides of each
SWCNT-PET and SWNCT-PVDF film. Sheet resistance (Rs) values were calculated taking into account the film
geometry, given by the distance between the electrodes and their length.
The homogeneity of the films and the changes caused by the immersion
treatment were evaluated by Raman spectroscopy and microscopy techniques.
Raman spectra were acquired under ambient conditions using a LabRAM
HR Raman spectrometer (Horiba Jobin-Yvon) with a laser excitation
energy of 2.33 eV (532 nm). Raman maps of 400 data points were collected
with lateral steps of 1 μm, in both X and Y directions, on rectangular areas. Microscopic characterization
was conducted in a field emission scanning electron microscope (SEM)
model MERLIN (Carl Zeiss, Switzerland), whereas atomic force microscopy
(AFM) measurements were carried out in Multimode SPM equipment from
Veeco Instruments (Santa Barbara, U.S.).
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