The morphology of the synthesized ZnO NRs was investigated via field-emission scanning electron microscopy (FE-SEM, Hitachi-S-4200) and transmission electron microscopy (TEM, TEM, Phillips CM-200). X-ray diffraction (XRD; Philips X’Pert diffractometer) with CuKα radiation (λ = 1.5418 Å) was used to study phase and crystallinity of a ZnO seed layer. Furthermore, atomic force microscopy (AFM, Bruker Nanoscope Multimode IV a) was used to obtain the surface roughness.
Nanoscope multimode iva
Manufactured by Bruker
Sourced in United States
The Nanoscope Multimode IVa is a versatile atomic force microscope (AFM) system designed for high-resolution imaging and characterization of surfaces at the nanoscale. It provides a stable and flexible platform for a wide range of AFM techniques, including contact mode, tapping mode, and phase imaging, among others.
Automatically generated - may contain errors
Lab products found in correlation
K alpha, by Thermo Fisher Scientific (4 mentions)
X pert diffractometer, by Philips (1 mentions)
Cm200, by Philips (1 mentions)
S 4200, by Hitachi (1 mentions)
Nanoscope software, by Veeco (1 mentions)
Vertex 80v, by Bruker (1 mentions)
Dv420a oe, by Oxford Instruments (1 mentions)
Jem 2100f, by JEOL (1 mentions)
Ultimate 3000, by Thermo Fisher Scientific (1 mentions)
Nx10 afm, by Park Systems (1 mentions)
5 protocols using nanoscope multimode iva
1
ZnO Nanorod Morphology Characterization
2
Atomic Force Microscopy Protocol
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The surface topology and phase were determined using AFM (Nanoscope Multimode IVa, Bruker, Billerica, MA, USA) in tapping mode. Images were analyzed using NanoScope software (5.31r1, Veeco Instruments, Inc., Plainview, NY, USA).
3
Comprehensive Characterization of PEDOT:Tos Films
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The surface morphology, roughness, and thickness of the PEDOT:Tos specimen were evaluated by AFM (Nanoscope Multimode IVa, Bruker). Optical properties, such as transmittance and reflectance, were examined by UV–vis spectroscopy (Varian Cary 500 Scan UV–Vis spectrophotometer, Varian). Raman spectroscopy (Ramanforce, Nanophoton) was used to analyze the chemical structure of the films with a laser wavelength of 532 nm. XPS (K-Alpha, Thermo scientific) was performed using a monochromated Al Kα X-ray source to examine the chemical composition of the films and the doped state of tosylate ions in PEDOT. ATR FT-IR spectroscopy (VERTEX 80 V, Bruker) was used to quantify the ratio of benzenoid and quinoid moieties in thiophene of the PEDOT:Tos films.
4
Characterization of Perovskite Nanowires
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The morphologies of samples were measured using a field emission scanning electron microscope (Hitachi, Tokyo, Japan, SU 8010/S-4300), atomic force microscope with noncontact mode (Nanoscope Multimode Iva, Bruker, Billerica, MA, USA), and NX-10 AFM (Park system, Suwon, South Korea). PbI2 and MAPbI3 nanowires’ crystal structures were examined by a transmission electron microscope (JEOL, Akishima City, Japan, JEM2100F, 200 kV). A photoluminescence (EX-upright) spectrometer equipped with a charge-coupled device (CCD) optical microscope (Andor, Belfast, UK, DV420A-OE) was used to measure the optical properties of PbI2 and MAPbI3 with the laser wavelength of 532 nm with the power of 5 mW. For TEM and PL measurements, the nanowires were dry-transferred to a TEM grid (Ted Pella, Redding, CA, USA, #01810, Carbon Type-B, 200 mesh) or SiO2 substrate (300 nm thermal oxide layer on <100> Si, HI-solar, Gwangju, South Korea).
5
Polymer Characterization by Advanced Analytical Techniques
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Size exclusion chromatography (SEC) was conducted using a Thermo Scientific UltiMate 3000 chromatography system employing THF as the eluent at 35 °C with a flow rate of 1 mL min−1. Obtained chromatograms were analyzed with the calibration using nine standard polystyrene (PS) samples with molecular weights of 1–1400 kg mol−1). 1H-NMR spectra were obtained using a JEOL JNM-ECZ400S 400 MHz spectrometer with CDCl3 containing TMS as an internal reference. AFM was conducted to examine the surfaces of crosslinked mats and brush films with noncontact tapping mode using a Nanoscope Multimode Iva (Bruker) and NX-10 AFM (Park systems). The film thicknesses were measured using a spectroscopic ellipsometer (SE MG-1000, Nano-view Co., Ltd.) in the 350–840 nm wavelength range. X-ray photoelectron spectroscopy (XPS) was performed using a Thermo Scientific K-Alpha. Water contact angles were measured using an SEO Phoenix 300.
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