Jem2100f japan

The mycosynthesized nano-Ag was purified by the centrifugation of solution of nano-Ag at 14,000 rpm for 20 min with continuous washing the pellet with sterile Milli Q water. The final pellet was dried in hot air oven at 50 °C for 3 hr, and the pure powder obtained was used for XRD, TEM, SEM, EDX, FTIR analysis and other studies. X-ray diffraction patterns of the Ag nano-powders were obtained using Schimadzu 7000 diffractometer operating with Cu Kα₁ radiation(λ = 0.15406 nm) generated at 30 kV and 30 mA with scan rate of 2°/min for 2θ values between 20° and 80° and its chemical composition was performed with an energy dispersiveX-Ray (EDS) analyzer combined with scanning electron microscope. The morphologies and size of nano-Ag were obtained from transmission electron microscope (TEM): JEOL JEM2100F- Japan and scanning electronmicroscopy (SEM) (JEOL JSM 6360LA, Japan). Finally FTIR analysis was carried out to study the functional groups possibly involved in the synthesis and stabilization of nano-Ag. The FTIR spectrums were measured using Shimadzu FTIR-8400 S, Japan, over the wave length range 400–4000 cm⁻¹.

The initial characterization for prepared nano-MgO was monitored by measuring the UV–vis absorbance spectrum by using a UV-Visible Spectroscopy (Shimadzu, Tokyo, Japan) to detect the surface plasmon resonance band^{6 ,8 (link)–10 (link)}. The structural properties (real estate properties) of the nano-MgO were analyzed by transmission electron microscope (JEOL JEM2100F- Japan), scanning electronmicroscopy (SEM) (JEOL JSM 6360LA, Japan), scientific particle size analyzer (PSA) and its chemical composition was demonstrated by an energy dispersive X-Ray (EDX) analyzer. The FTIR spectrums were measured using Shimadzu FTIR-8400 S, Japan, over the wavelength range 400–4000 cm⁻¹. X-ray diffraction patterns were obtained using Schimadzu 7000 diffractometer operating with Cu Kα₁ radiation(λ = 0.15406 nm) generated at 30 kV and 30 mA with the scan rate of 2°/min for 2θ values between 20° and 80°. The average particle size was estimated using the Scherrer formula Eq. (1). $$\mathbf{D}=k\mathbf{\lambda }/\mathbf{\beta }\cos \mathbf{\theta }$$ where D is particle diameter, k is a constant equals 0.9, λ is wavelength of X-ray source (0.1541 nm), β is the full width at half maximum (FWHM) and θ is the half diffraction angle.