The surface work function of the samples deposited on a Au-coated Si substrate was measured by an atomic force microscope (MFP-3D AFM, Asylum Research) equipped with a sealed electrochemistry cell filled with argon gas. The KPFM experiments were conducted using Ti/Ir-coated Si probe (ASYELEC.01-R2, Asylum Research) with a force constant of 2.8 N m–1 and a resonance frequency of 75 kHz. The work function of this probe was calibrated using a highly ordered pyrolytic graphite (HOPG) reference sample with a well-defined work function (4.6 eV)43 . During the KPFM scanning process, the scan rate and set point were 0.8 Hz and 0.5 V, respectively. Furthermore, an a.c. voltage Va.c. = 1 V was applied to the tip, and the tip was lifted up 30 nm from the sample surface. The other scanning parameters were also optimized for obtaining high-quality images. The similarity between the measured work-function value (2.88 eV) and the calculated one (2.78 eV) for the [Gd2C]2+·2e− electride ensures the reliability of the extremely low work function of negatively charged Cu NPs.
Asyelec 01 r2
Manufactured by Oxford Instruments
The ASYELEC.01-R2 is a lab equipment product from Oxford Instruments. It is designed for electrical characterization applications. The device provides advanced measurement capabilities for researchers and scientists.
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4 protocols using asyelec 01 r2
1
Measuring Work Function of Electride Samples
2
Characterizing Graphene Surfaces with c-AFM
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The c-AFM measurements were carried out in an Asylum Research Cypher AFM with conductive probes in ambient conditions (temperature ∼26°C, relative humidity ∼50%). A constant voltage bias was applied between the sample and the probe. The typical spring constant and resonance frequency of the conductive probe coated with Ti/Ir (ASYELEC.01-R2, Asylum Research) are 2.8 N/m and 75 kHz, respectively. To exclude the possibility of an extra moiré pattern in top multilayer graphene created during the transfer process, we also carried out c-AFM measurements on suspended graphene near the graphite edge without the bottom graphite substrate (Fig. S3 ). In our c-AFM experiments, measurements were intentionally conducted in the inner regions of graphene far away from the graphite edge, where the strain induced by the SiO2/Si substrate was minimized (Fig. S4 ). The Raman spectra were obtained using a Horiba LabRAM HR Evolution Raman microscope with a 532 nm He-Ne laser as the excitation source.
3
Piezoresponse Force Microscopy Characterization
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Before the PFM test, the conductive silver glue was applied to the iron sheet, the substrate side of the sample was glued to the iron sheet, and the sample was heated to 60 °C and baked for 20 min. Surface morphology, the domain writing, hysteresis loops and out-of-plane amplitude/phase images were collected using the lithography PFM and the Dual AC Resonance Tracking (DART) mode at room-temperature (Cypher, Asylum Research). A DART model can relieve the topographic characteristics interference. Conductive Ti/Ir-coated silicon cantilevers (Asylum Research, ASYELEC-01-R2) were used for PFM measurements70 (link). The typical tip radius is about 7 nm and the force constant is ∼ 2 N m−1. The coercive voltage is calculated from the equation: where U+ and U- represent the voltage corresponding to the lowest point in the amplitude loops, respectively.
4
Atomic Force Microscopy Techniques Comparison
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All atomic force microscopy (AFM), scanning Kelvin probe force microscopy (sKPFM), piezo force microscopy (PFM), and amplitude modulated force microscopy (AMFM) experiments were carried out on an Asylum Research model MFP-3D SPM. PFM experiments were conducted using dual-AC resonance tracking (DART-PFM) mode. Three sets of cantilevers consisting of six individual probes of varying spring constants were used: ASYELEC-01 R2 (R2), Asylum Research, are iridium-coated conductive silicon probes with a 70.0 ± 19.5 kHz free air resonance frequency, and a ∼280 kHz contact resonance. The R2 has a free air spring constant of 2.8 ± 1.4 N m−1. HQ: NSC36/PT (NSC: A, B, and C), MikroMasch, are platinum-coated conductive silicon probes with three independent levers per chip. The levers have a 90 ± 65, 130 ± 98, 65 ± 45 kHz free air resonance frequency for levers A, B and C respectively, giving a ∼340, 520, and 260 kHz contact resonance for each lever. The NSC levers have a free air spring constant of 1.0 ± 2, 2.0 ± 4.5, and 0.6 ± 1.25 N m−1. TR400PB (TR: S and L), Asylum Research, are gold-coated conductive silicon nitride probes with a 32.0 ± 14.5 and 10.0 ± 7 kHz free air resonance frequency, but a ∼120 and 40 kHz contact resonance. The TR levers have a free air spring constant of 0.09 ± 0.12 and 0.02 ± 0.02 N m−1 respectively.
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