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D2 phaser 2nd gen

Manufactured by Bruker
Sourced in United States

The D2 Phaser 2nd Gen is a compact, fully automated X-ray diffractometer designed for routine phase analysis and material characterization. It features a sealed X-ray tube, a highly sensitive detector, and advanced software for data acquisition and analysis.

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6 protocols using d2 phaser 2nd gen

1

Structural Analysis of Green Synthesized AgNPs

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The structure and crystallinity of the green synthesized AgNPs were analyzed using an XRD apparatus equipped (Bruker D2 Phaser 2nd Gen, American) with a Cu (Ka) (1.5406 Å) radiation source. XRD spectra were recorded over 2θ angles ranging from 10° to 60°. The average crystallite size of the nanoparticles was calculated from the XRD pattern using the Deby‐Seherrer formula D = 0.9λ/ β Cosθ, where λ is the wavelength of the X-rays used for diffraction and β is full width at half maximum (FWHM) of a peak [13 (link)].
The value of d- spacing has been calculated using Bragg’s Law, 2dSinθ = nλ, where n is the order of diffraction pattern. n is equal to 1. To estimate FWHM, observed peaks were fitted with a Gaussian function using origin 8.5. [14 (link)].
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2

Structural Properties of CNPs via XRD

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The structural properties of CNPs were elucidated using XRD, which is a vital practice for discovering the XRD pattern. The diffractometer (Bruker D2 Phaser 2nd Gen) was used, by which, the X-ray works with a Cu anode having 30 kV and 10 mA. The intensity of diffraction was determined at 25.7 °C with 2°/min of scanning rate for 2θ = 10–50 of Khan et al.83 (link).
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3

Structural Analysis of Collagen-NPs

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An X-ray diffractometer (Bruker D2 PHASER 2nd Gen) was used to record the XRD spectra of collagen powder and collagen-NPs at room temperature. Monochromatic Cu/K radiations (λ = 1.5405) were used to irradiate the samples at a scanning rate of 2 min−1, with diffraction angles ranging from 10° to 80°.
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4

Analyzing Bacterial Nanocellulose Crystallinity

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XRD was employed to evaluate the pattern and crystallinity degree of the bacterial nanocellulose. At ambient temperature, the X-ray diffraction patterns were recorded Ni-filtered Cu Kα radiation (λ = 1.54 A°). Diffractmeter Type: Bruker D2 Phaser 2nd Gen. The generator current (mA) and operating voltage (kV) were 30 and 10; respectively. Data were collected at a rate of two degrees per minute between 5 and 60 degrees 2θ. The degree of crystallinity of bacterial nanocellulose sample was determined using the empirical method proposed by Segal et al.47 (link) equation from the diffracted intensity data: CrIXRD(%)=I002-IamI002×100
I002 is the intensity value for the crystalline cellulose, and Iam is the intensity value for the amorphous cellulose.
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5

Crystallographic Analysis of Samples

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Crystallographic analysis of the different samples was performed using an X-ray diffractometer (mod. D2 PHASER 2nd Gen, Bruker AXS, Inc., Madison, WI, USA) with a Cu sealed tube source. Samples were placed in the holder and flattened with a glass slide to ensure a good surface texture. The measuring conditions were as follows: Ni-filtered CuKα radiation, λ = 1.54 A, and 2θ angle range of 5–70° with a scan rate of 3 s/step and a step size of 0.02°.
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6

Characterization of Activated Carbon Surface

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Fourier transform infrared (FTIR) spectroscopy was used to determine the presence of surface functional groups and chemical interaction for the treated g leaf activated carbon using a Perkin Elmer Spectrum One spectrometer with universal attenuated total re ectance sampling for the range of 400-4000 cm - 1 .
Cu K radiation with a wavelength of 1.54184, X-ray powder diffraction (XRD) in a Bruker D2 Phaser 2nd Gen apparatus, and a Lynxeye detector (ID mode). The adsorbent was characterized also by scanning electron microscope (SEM) and the speci c surface area by the Brunauer-Emmett-Teller (BET).
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