Ir 2000 spectrometer

The UV–vis–NIR absorption spectra of the samples were obtained using a Jasco V-770 spectrophotometer, and Fourier transform infrared (FT-IR) spectra were recorded using a Thermo-Nicolet IR 2000 spectrometer with KBr pellet. XRD patterns were acquired by a Scintag X-ray diffractometer (PAD X), equipped with Cu Kα photon source (45 kV, 40 mA) at a scanning rate of 3° min⁻¹. X-ray photoelectron spectra (XPS) were recorded by a PerkinElmer PHI 5600 ci X-ray photoelectron spectrometer.

UV-vis-NIR absorption spectra were recorded on a Varian Carry 50 Bio UV–vis spectrophotometer and FTIR spectra were acquired using Thermo-Nicolet IR 2000 spectrometer with KBr. Raman spectra were measured with Raman System (R-3000QE) in the backscattering configuration using an Argon ion laser having wavelength of 85 nm. The XRD were recorded on a Scintag X-ray diffractometer, model PAD X, equipped with Cu Kα photon source (45 kV, 40 mA) at scanning rate of 3°/min. Scanning electron microscopy (SEM) measurements were carried out on a JEOL JXA-8900 scanning electron microscope and transmission electron microscopy (TEM) images were obtained with Hitachi H-8100 microscope at 200 kV. The x-ray energy dispersive spectroscopy (EDS) measurements were made using ThermoNoran EDS System 6 equipped with SEM.