Ve 8800 scanning electron microscope

The X-ray diffraction (XRD) measurement for TiO₂/Ti was performed by using a SmartLab XRD system (Rigaku, Tokyo, Japan). The thickness of the TiO₂ on the Ti substrate was measured by using a SE-2000 spectroscopic ellipsometer (Semilab Japan, Tokyo, Japan). The EGFET in this study was assembled by using a 2N7000 N-channel enhancement-type MOSFET (ON Semiconductor, Phoenix, AZ, USA). The pH and glucose measurements of our EGFETs were performed by using an RE-1B Ag/AgCl reference electrode (ALS, Tokyo, Japan) and a B1500A semiconductor device analyzer (Keysight, Tokyo, Japan). The pH change in the PBS during measurement was monitored by using an AT-610ST titrator equipped with a C171 glass electrode (Kyoto Electronics, Kyoto, Japan). The thickness, roughness, optical absorption, and surface morphology of the SF membrane were measured by using a DektakXTS-0K1704 stylus-type step profiler (Bruker Japan, Kanagawa, Japan), an SPM9700 atomic force microscope (AFM) (Shimazu, Kyoto, Japan), an FTIR-8400S Fourier transform infrared spectrometer (FTIR) with a DRS-8000A diffuse reflector (Shimazu, Kyoto, Japan), and a VE8800 scanning electron microscope (SEM) (Keyence, Osaka, Japan), respectively.

The apatite-forming ability of the samples was evaluated using an SBF [42 (link),43 ] that contained ions at concentrations (Na⁺, 142.0 mM; K⁺, 5.0 mM; Ca²⁺, 2.5 mM; Mg²⁺, 1.5 mM; Cl⁻, 147.8 mM; HCO₃⁻, 4.2 mM; HPO₄²⁻: 1.0 mM; SO₄²⁻, 0.5 mM) nearly identical to those found in human blood plasma. We prepared the SBF according to the ISO 23317:2014 [43 ] protocol. All chemicals used for SBF formulation were purchased from Nacalai Tesque, Inc. (Kyoto, Japan). A volume of 30 mL of the prepared SBF was dispensed into an ECK-50ML-R centrifuge tube. The samples were immersed in the SBF at 36.5 °C for 7 days. The samples were then removed from the SBF, gently rinsed with ultrapure water, and dried at approximately 25 °C and atmospheric pressure. The lower surface of each sample was observed using a VE8800 scanning electron microscope (SEM; Keyence Corp., Osaka, Japan) and XRD.

The remaining debris and biofilm on the canal wall were evaluated by SEM. The crown of each experimental tooth was cut and removed using a diamond disc to separately obtain the mesial and distal roots. One distal root from each experimental sample was grooved longitudinally on the outer surface with a diamond disc and then split into two halves with a chisel. The samples were then prepared for SEM observations according to a previously described method [37 (link), 38 (link)]. Briefly, the samples were fixed with 2.5% glutaraldehyde for more than 24 h, rinsed with PBS three times, and then treated with 1-ethyl-3-methyl-imidazolumtetrafluoroborate. After absorption of the excess, samples were dried in a vacuum desiccator for 1 day and slightly sputter-coated with platinum. The surfaces of each sample were inspected using a VE-8800 scanning electron microscope (Keyence Inc., Osaka, Japan) at a 10 kV acceleration, and the images were obtained at 30×, 1000×, and 5000× magnifications.