The KQ-500E ultrasonic cleaner was purchased from Kunshan Ultrasonic Instrument Co., Ltd. (Jiangsu, China). The micro high-speed refrigerated centrifuge C1650R-230V was provided by Lepto Scientific Instruments (Beijing) Co., Ltd. (Beijing, China). Carl Zeiss provided the SIGMA 500 field emission scanning electron microscope (Oberkochen, Germany). Particle Sizing Systems sold the AccuSizer780 AD multipurpose automatic counting particle size detector (Florida, USA). An Oulaibo constant temperature oscillator OLB-100B was purchased from Jinan Oulaibo Scientific Instrument Co., Ltd. (Shandong, Jinan).
Sigma 500 field emission scanning electron microscope
Manufactured by Zeiss
Sourced in Germany
The Sigma 500 field emission scanning electron microscope is a high-resolution imaging tool designed for detailed analysis of samples. It utilizes a field emission electron source to generate a focused electron beam that scans the surface of the specimen, providing high-quality images with exceptional detail and resolution.
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Lab products found in correlation
3 protocols using sigma 500 field emission scanning electron microscope
1
Instrument Acquisition for Advanced Materials Research
2
Characterization of LDH Samples
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The X-ray diffraction (XRD) patterns of the LDH samples were collected using an X-ray diffractometer (type XD-2600), with Cu Kα radiation at 40 keV 35 mA. The morphologies of the LDH samples were characterized using a Sigma 500 field emission scanning electron microscope (SEM) (Zeiss, Germany). The pore size distribution and pore volume of each LDH sample were also evaluated by the Brunauer–Emmett–Teller method using a gas sorption analyzer (NOVA-1200, Quantachrome Corp., USA).
3
Comprehensive Characterization of Magnetic Nanoparticles
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Scanning electron microscopy (SEM), transmission electron microscopy (TEM), X-ray diffraction (XRD), and fourier transform infrared (FTIR) spectroscopy were used to characterize Fe 3 O 4 MNPs, MNPs-NH 2 and immobilize LDH. SEM was performed using a ZEISS Sigma 500 field emission scanning electron microscope equipped with a state-of-the-art backscatter detector (Oberkochen, Germany). TEM was performed using a field emission transmission electron microscope JEM-2100F with an accelerating voltage of 200 kV by Japan Electronics Co. (Tokyo, Japan). XRD was obtained using a Rigaku UltimalV Xray polycrystalline diffractometer equipped with a graphite monochromator with high reflection efficiency (Tokyo, Japan). FTIR spectra were analyzed using a Thermo Scientific Nicolet IS5 infrared spectrometer equipped with a temperature-controlled diode laser (Massachusetts, USA).
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