scanning electron microscopy (SEM) and energy-dispersive spectrometry
(EDS) analyses were performed using a Carl Zeiss SIGMA microscope.
X-ray diffraction (XRD) patterns were collected using an AXS New D8
Advance diffractometer (Bruker) with a Cu Kα radiation source
and a Lynxeye line detector. The X-ray photoelectron spectroscopy
(XPS) analysis was performed on a K-alpha + spectrometer (Thermo Fisher
Scientific) using an Al K-alpha source. Zeta potential measurements
were performed using a Malvern Zetasizer Pro (Malvern Instruments)
with a universal dip cell kit (palladium electrodes with 2 mm spacing)
for the non-aqueous system. Four-point probe measurements were performed
using a CMT-SR2000N instrument (Advanced Instruments Technology).