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Sigma microscope

Manufactured by Zeiss
Sourced in Germany

The Sigma microscope is a high-quality optical microscope designed for laboratory use. It features a sturdy construction, precise optics, and a user-friendly interface. The Sigma microscope is capable of magnifying specimens up to a specified level, allowing researchers to examine small-scale details with clarity and precision. Its core function is to provide a clear and detailed view of the subject under observation.

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12 protocols using sigma microscope

1

Comprehensive Materials Characterization Protocol

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Field-emission
scanning electron microscopy (SEM) and energy-dispersive spectrometry
(EDS) analyses were performed using a Carl Zeiss SIGMA microscope.
X-ray diffraction (XRD) patterns were collected using an AXS New D8
Advance diffractometer (Bruker) with a Cu Kα radiation source
and a Lynxeye line detector. The X-ray photoelectron spectroscopy
(XPS) analysis was performed on a K-alpha + spectrometer (Thermo Fisher
Scientific) using an Al K-alpha source. Zeta potential measurements
were performed using a Malvern Zetasizer Pro (Malvern Instruments)
with a universal dip cell kit (palladium electrodes with 2 mm spacing)
for the non-aqueous system. Four-point probe measurements were performed
using a CMT-SR2000N instrument (Advanced Instruments Technology).
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2

Characterization of ZnO Powder Morphology

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The morphology of ZnO powders was investigated using field-emission scanning electron microscopy (FE-SEM), using a Carl Zeiss Sigma microscope equipped with a Schottky field emitter (tip made of <100> tungsten crystal and a ZrO2 reservoir). Additionally, a scanning electron microscope (SEM Zeiss Evo 50 XVP with LaB6 source) was employed for analyzing the surface and the cross-section of the composite films. SEM analysis was also employed for the observation of the laser cut exploited for preparing cantilevers to be used in the piezoelectric tests. For cross-section observation, the samples were fractured in liquid nitrogen. Backscattered electrons were employed for surface analysis. All the films were gold-metalized using an E5 150 SEM coating unit.
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3

Characterization of Carbon Dots and Micellar Nanostructures

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The TEM analysis was performed using a Jeol TEM-1011 microscope, provided with an Olympus Quemesa Camera (11 Mpx, Olympus, Tokyo, Japan). The samples were prepared by depositing on a carbon-coated Cu grid (400 mesh) a drop (5 μL) of C-dots or the micellar nanostructure solution. For sample staining, the grid was placed on the top of a drop of an aqueous phosphotungstic acid solution 2% (w/v) for 30 s, after the evaporation solvent. Then, the grid was washed with ultrapure water and left to dry. A statistical size analysis was performed on the C-dots samples using the Image J 1.53e analysis program.
Field emission scanning electron microscopy (FE-SEM) was performed using a Zeiss (Oberkochen, Germany) Sigma microscope operating in the range of 0.5–20 kV and equipped with an in-lens secondary electron detector and an INCA energy-dispersive spectroscopy (EDS) detector. The HA spray-dried samples were mounted onto stainless steel sample holders using double-sided carbon tape and grounded by silver paste.
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4

Advanced Microscopy Techniques

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Scanning electron microscopy images are obtained with a Zeiss Sigma microscope. TEM studies were performed using a JEOL JEM200 ARM probe corrected TEM, operated at 200kV.
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5

Characterization of Cu2-xS Nanoparticles

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The NP films prepared on Si wafers via the EPD process were characterized as follows. The X-ray diffraction (XRD) patterns were collected using an AXS New D8 advance diffractometer (Bruker, Billerica, MA, USA) with a Cu K-α radiation source and a LynxEye line detector. The samples for XRD were prepared by drop-casting the Cu2-xS NPs onto zero-background quartz. Field-emission scanning electron microscopy (FE-SEM) and energy-dispersive spectrometry (EDS) were performed using a Carl Zeiss SIGMA microscope. In addition, X-ray photoelectron spectroscopy (XPS) was performed on a K-alpha system (Thermo Fisher Scientific, Waltham, MA, USA) with an Al K-α source. FTIR spectroscopy was performed in a Nicolet 6700 spectrometer (Thermo Fisher Scientific) at room temperature. The FTIR samples were prepared as a powder. Zeta potential and dynamic light scattering (DLS) measurements were performed using a Malvern Zetasizer Pro (Malvern Instruments, Malvern, WR, UK) instrument with a universal dip cell kit for samples in non-aqueous (palladium electrodes with 2 mm spacing).
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6

Scanning Transmission Electron Microscopy Imaging

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TEM-Images were obtained using a Zeiss SIGMA microscope equipped with a STEM detector and Atlas Software (Zeiss NTS; Oberkochen, Germany).
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7

Advanced Characterization of Material Morphology

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The morphology of the samples was characterized via SIGMA microscope (Zeiss, Germany) and transmission electron microscope (TEM, 2100F, JEOL). The crystal structures were explored by X-ray diffractometer (XRD-6100 spectrometer with Cu-Kα radiation, Shimadzu) and Raman spectrometer (inVia-reflex confocal Raman spectrometer, Renishaw) with a 532 nm laser as the excitation source. XPS spectra were obtained on a K-Alpha ESCALAB 250Xi instrument (ThermoFisher-VG Scientific, USA), with Al Kα radiation as the excitation source. N2 adsorption–desorption analysis was measured on surface area and porosity analyzer (ASAP 2020, Micromeritics). BET method and the Barrett–Joyner–Halenda (BJH) method were performed to deduce the specific surface area and pore size distribution.
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8

Morphological Analysis of Irradiated Samples

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Morphological studies of the irradiated samples were performed by scanning electron microscopy (SEM) using a SEM Carl Zeiss Sigma microscope. Samples of about 10 mm 3 were freeze dried in a L-T8 lyophilizer (Rificor, Argentina) at a pressure of 0.01 mbar and a temperature of (− 48.0 ± 0.1) C for 8 h. Subsequently, samples were fractured to expose the inner structure of the material and were splatter-coated with gold and scanned at 5.00 kV with a magnification ranging from 40X to 71000X. Three samples were selected for this study, a non-irradiated sample, an X-ray only irradiated sample at a dose of 5.50 Gy and a sample irradiated with a neutron-gamma field with a gamma dose of (5.50 + 0.77) Gy and a dose of 18.01 Gy due to fragments released during the neutron capture in 10 B isotope.
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9

SEM Imaging of Cell Culture Membrane

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The morphology of the CCM was studied by SEM using a Zeiss Sigma microscope. To this effect, samples were prepared by deposition of 10 L of CCM (0.001 mg mL -1 ) onto a silica sheet, covered after drying with chrome in a sputter coater, and observed under an accelerating voltage of 2.0 kV.
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10

Multimodal Characterization of Gel Samples

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UV-Visible spectra are recorded in the range 200-1000 nm with a Shimadzu UV-160A spectrophotometer and evaluated with a program associated with the spectrometer. A LABRAM HR800 Raman spectrometer is employed using the 633 nm line of a He-Ne ion laser as the excitation source to analyse the sample. FTIR spectra reported in this study are recorded with a Perkin Elmer Spectrum RX1 spectrophotometer with HATR (horizontal attenuated total reflectance) facility in the range 4000-500 cm À1 . SEM (scanning electron microscopy) and cryo-SEM images are acquired using a Zeiss Sigma microscope. All the gel samples were first dried in vacuum for 2 days prior to SEM experiments. Cryo-SEM was done using samples as they were. TEM (transmission electron microscopy) images are taken with a JEOL JEM 2010 electron microscope. Gel samples were first properly diluted with Milli-Q water and then drop-casted on a 300 mesh TEM grid prior to TEM experiments.
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