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22 protocols using scios 2

1

FESEM Analysis of Morphology

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Field emission scanning electron microscope (FESEM, FEI Scios 2, Dual Beam system) was employed for morphological examinations. The samples were attached to a sample holder using double-sided copper tape. The micrographs were taken at an acceleration voltage of 15 kV and a chamber pressure of approximately 9 × 10−5 Pa.
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2

Membrane Cross-Section Morphology Analysis

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Morphology of cross-sectional area of a new-conditioned membrane was assessed using a field emission scanning electron microscope (FESEM, Scios™ 2, FEI Company Ltd., Hillsboro, OR, USA). Membrane samples were cut using cryogenic scissors and then were fixed on carbon supports to examine under FESEM.
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3

Micromotor Characterization and Motion Analysis

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The chemical composition and morphology of the micromotors were examined by a high-resolution field emission scanning electron microscope with a focused Ga ion beam (FESEM-FIB, Scios 2 by FEI Company), and the chemical analysis was performed using a FESEM Inspect F50 with an EDS detector (EDAX). A transmission electron microscope of atomic resolution (FETEM) (JEOL F200) with an EDX Centurio detector (silicon drift) was used to perform elemental analysis. The powder X-ray diffraction data was obtained using a Bruker AXS D8-Discover diffractometer (40 kV and 40 mA).
The motion speeds of the micromotors were estimated from the videos recorded using a confocal microscope (Nikon TE 2000E) coupled to a halogen lamp and a Hamamatsu camera. The velocities of the micromotors with manganese oxide were estimated with hydrogen peroxide concentrations of 2%, 5% and 7% (w/w), while the velocities of the micromotors with laccase were estimated only with a concentration of 2% (w/w) H2O2. The results are from an average of 20 different micromotors for each concentration.
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4

Imaging Mechano-Pigments and Silica Microspheres

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SEM of the surfaces of the mechano‐pigments and of the silica microspheres was performed on a Tescan Mira3 LM Field Emission microscope. The pigments were cross‐sectioned using a FIB, and their interior microstructure was imaged with a FEI Scios 2 dual‐beam SEM (Ga+ ion column and a field‐emission electron gun). Several detectors (T1 or T2) and imaging voltage (2 or 5 kV) were used. Pigments were mounted directly on aluminum stubs with conductive carbon tape, and the silica microspheres were deposited on a silicon (100) wafer, which was then mounted on the aluminum stub. The samples were then coated with a 2.5 nm thick layer of Au using a sputter coater (Cressington 208HR, Cressington Scientific Instruments) to prevent charging.
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5

Fabrication of Microscale Hall Devices

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Microscale devices in the cross and the standard Hall-bar geometry were fabricated by focused ion beam (FIB) cutting using FEI Helios NanoLab 660 and FEI Scios 2 dual beam SEM. The platinum electric contacts were in situ made inside the SEM chamber. To make sure the contact is good throughout the whole thickness, the contact areas were first fabricated into wedge shapes before the Pt deposition. After the cutting and deposition processes, a final cleaning step was conducted to remove the redeposition materials.
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6

Comprehensive Characterization of NP Formulations

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Scanning electron microscopy imaging of both NP formulations and mapping characterization of Au-complex was done using a field emission scanning electron microscope equipped with energy dispersive x-ray spectroscopy -FEI Scios2, DualBeam system.
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7

Ultrastructural Analysis of Opisthosomal Flaps

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Opisthosomal flap pieces were cut, glued onto fitting stubs, and sputtered with a 5 nm thick layer of gold. The ultrastructure was observed with a MIRA 3 LMH field-emission electron microscope (Tescan, Brno, Czech Republic). For ultrastructural investigations, we performed focused-ion beam milling of the scales using a FEI Scios 2 (FEI, Eindhoven, The Netherlands) dual beam field-emission electron microscope equipped with a gallium-ion ion beam (operated at 30 kV, 0.3 nA).
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8

Microstructural Analysis of Oxidized Powders

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The oxidized powders, sintered substrates, and tribological wear tracks on the sintered substrates were analyzed for their microstructural morphology.
Optical microscopy has been carried out by Keyence digital-optical microscope, (Keyence VHX-950F model, Osaka, Japan). Scanning Electron Microscopy has been carried out by using Thermo Scientific Scios 2 equipment (Waltham, MA, USA) under SEM-BSD and SEM-SE modes using 4kV accelerating voltage. Phase analysis and elemental identification was performed by XRD—Cu Kα radiation using a Bruker AXS D8 Discover diffractometer (Billerica, MA, USA) equipped with Göbel-mirror and a scintillation detector.
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9

Characterizing MoS2 Structure via FIB and Raman

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The cross-section ( yz -plane) of MoS2 structure was obtained by etching the 1D MoS2 grating (A2) via focused ion beam (FIB) technique (Thermoscientific Scios 2). The morphology of MoS2 was characterized using TEM/STEM. The Raman spectroscopies are performed in Horiba-Jobin Yvon LabRAM HR Evolution System equipped with 532 nm green laser, where an objective lens of 50X magnification was applied with a 5-second accumulation time.
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10

Visualizing Female Genital Tract Muscles

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The same female genital tracts that had been used for confocal microscopy were used to visualize muscles using a scanning electron microscope (SEM). They were manipulated under stereomicroscope and gently washed with ethanol and water to remove all remains of previous chemicals that might interfere. The pieces were then fixed by immersion in Karnovsky’s fixative [21 ] containing Triton X-100 0.1% for 24 h. Fragments for SEM preparation were washed in distilled water and progressively dehydrated through a graded ethanol series. Pieces were placed inside microporous specimen capsules (30 μm pore size) immersed in absolute ethanol. Critical point drying was performed in a Leica EM CPD300. The obtained fragments were arranged on SEM aluminium stubs using carbon tape and coated with Au/Pd sputtered in argon gas. Observation and photography were performed in a SEM model SCIOS 2 (Thermo Fisher).
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