Ft alpha infrared spectrometer

The morphologies of FRPC, FRPCK, FRPC-Urea, and FRPCK-Urea were evaluated via scanning electron microscopy (SEM). N₂ isotherms were measured using a Micromeritics ASAP 2020 analyzer to evaluate the porous characters. The SSA and pore size distribution were calculated via the Brunauer-Emmett-Teller and Barrett-Joyner Halenda methods. Raman spectra were obtained via an inVia Reflex Raman spectrophotometer with a 532 nm blue laser beam. FT-IR was obtained by a Bruker FT (ALPHA) infrared spectrometer. X-ray photoelectron spectroscopy (XPS) was used to evaluate the elemental contents and bonding characters of the four as-prepared PC materials. X-ray diffraction (XRD) was adopted to measure the crystal structure of the PC samples by D8 Advance X-ray diffractometer (Bruker, Germany).

The morphologies of FRPC, FRPCK, FRPC-Urea, and FRPCK-Urea were evaluated via scanning electron microscopy (SEM). N₂ isotherms were measured using a Micromeritics ASAP 2020 analyzer to evaluate the porous characters. The SSA and pore size distribution were calculated via the Brunauer-Emmett-Teller and Barrett-Joyner Halenda methods. Raman spectra were obtained via an inVia Reflex Raman spectrophotometer with a 532 nm blue laser beam. FT-IR was obtained by a Bruker FT (ALPHA) infrared spectrometer. X-ray photoelectron spectroscopy (XPS) was used to evaluate the elemental contents and bonding characters of the four as-prepared PC materials. X-ray diffraction (XRD) was adopted to measure the crystal structure of the PC samples by D8 Advance X-ray diffractometer (Bruker, Germany).