The Brunauer–Emmett–Teller (BET) surface area analyzer was used to record nitrogen sorption isotherms at 77 K (Belsorp Max, Japan). Pore size distribution plots were taken from the desorption isotherms using the Barrett–Joyner–Halenda (BJH) model. The samples were degassed for 12 hours at 200 °C under vacuum before to measurement. Powder X-ray diffraction (PXRD) with Cu–Kα radiation was recorded across a range of 5–80° with a scan speed of 3° min−1 (Rigaku X-ray diffraction ultima-IV, Japan). Thermo Scientific™ Talos™ F200S High-Resolution Transmission Electron Microscope was used to examine the surface morphology of the samples (HRTEM). The PHI 5000 Versa ProbII, FEI Inc., was used to perform X-ray photoelectron spectroscopic (XPS) characterization. Raman spectra was recorded using Horiba Jobin Yvon Xplora Plus V1.2 Multiline with 532 nm excitation wavelength. Electrochemical characterization was performed using OrigaLys ElectroChem multichannel workstation equipped with Autolab RRDE setup. Inductively coupled plasma – optical emission spectrometry (ICP-OES) analysis has been performed using Optima 5300 DV, PerkinElmer, USA.
Talos f200s high resolution transmission electron microscope
Manufactured by Thermo Fisher Scientific
The Talos™ F200S High-Resolution Transmission Electron Microscope is a laboratory instrument designed for advanced imaging and analysis. It provides high-resolution, high-contrast images of samples at the nanoscale level.
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Lab products found in correlation
Xplora plus v1.2 multiline, by Horiba (1 mentions)
Optima 5300 dv, by PerkinElmer (1 mentions)
K alpha x ray photoelectron spectrometer, by Thermo Fisher Scientific (1 mentions)
Phi 5000 versaprobe 3, by Physical Electronics (1 mentions)
Model supra 55, by Zeiss (1 mentions)
X pert pro x ray diffractometer, by Malvern Panalytical (1 mentions)
Ftir spectrometer, by Bruker (1 mentions)
1800 uv vis spectrophotometer, by Shimadzu (1 mentions)
3 protocols using talos f200s high resolution transmission electron microscope
1
Comprehensive Characterization of Materials
2
Characterization of Nanomaterials by Spectroscopy
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WQF-530 FTIR Fourier transform infrared spectrometer (Beijing Beifen Ruili Analytical Instruments (Group) Co., Ltd.), 759S UV-Vis spectrophotometer (Shanghai Prism Technology Co., Ltd.), Talos F200s high-resolution transmission electron microscope (Thermo Scientific), K-Alpha X-ray photoelectron spectrometer (Thermo Scientific), and NIRSA5.8 software developed by the NIR team of Jiangsu University for IR spectral data processing.
3
Characterization of PVP-PVP-ZnO Nanoparticles
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The crystallographic properties of the synthesized PVP-PVP-ZnO NPs were characterized using a Panalytical X'PERT PRO X-ray diffractometer (XRD) from the Netherlands, employing Cu Kα (1.5406 Å) monochromatic radiation. The Shimadzu-1800 UV–Vis spectrophotometer was used to measure the absorption spectra over the wavelength range of 200–800 nm. The chemical bonding of the materials was determined by analyzing the transmittance spectra between 4000 and 600 cm−1 through a Bruker FT-IR Spectrometer. Germany-based Carl Zeiss Model Supra 55 The surface morphological properties of the NPs were examined using field emission scanning electron microscopy (FESEM) in conjunction with EDX for elemental content percentages. PHI 5000 VersaProbe III by Physical Electronics was used to measure XPS data. The morphological, physical characteristics and grain size of the NPs were investigated using a Thermo Fisher TALOS F200 S High-Resolution Transmission Electron Microscope (HRTEM) working at 200 kV. The particles were dispersed in ethanol via ultrasonic treatment to facilitate the sample preparation. Subsequently, the resulting suspension was deposited onto a carbon-coated copper grid and dried before capturing the HRTEM images.
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