Dynamic light scattering (DLS) analyses were performed as previously described61 (link). Briefly, 1 mg/mL cGAS proteins in a DLS buffer (20 mM Tris-HCl pH 7.5, 100 mM NaCl and 1 mM dithiothreitol) were centrifuged at 5000 × g for 10 min and then analysed by SZ-100 Nanoparticle Size and Zeta Potential Analyzer (Horiba, Japan).
Sz 100 nanoparticle size and zeta potential analyzer
Manufactured by Horiba
Sourced in Japan
The SZ-100 Nanoparticle Size and Zeta Potential Analyzer is a laboratory instrument designed to measure the size and surface charge (zeta potential) of nanoparticles and colloidal dispersions. The instrument utilizes dynamic light scattering and electrophoretic light scattering techniques to provide accurate and reliable measurements of particle size and zeta potential.
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3 protocols using sz 100 nanoparticle size and zeta potential analyzer
1
Characterizing cGAS Protein Properties by DLS
2
Surface Functionalization Impacts Colloidal Stability
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To evaluate the
effect of surface functionalization on the colloidal stability of
SPN, we measured the ζ-potential of each sample using an SZ-100
Nanoparticle Size and Zeta Potential Analyzer (Horiba Scientific).
In this study, the measurement of ζ was carried out by dispersing
0.05 g of the as-prepared samples into 10 mL of artificial brine at
different concentrations of NaCl ranging from 5000 to 30 000
ppm.
effect of surface functionalization on the colloidal stability of
SPN, we measured the ζ-potential of each sample using an SZ-100
Nanoparticle Size and Zeta Potential Analyzer (Horiba Scientific).
In this study, the measurement of ζ was carried out by dispersing
0.05 g of the as-prepared samples into 10 mL of artificial brine at
different concentrations of NaCl ranging from 5000 to 30 000
ppm.
3
Comprehensive Characterization of PC-AgNPs
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The size and shape of the PC-AgNPs crystals were observed by a Tecnai G2 20 S-TWIN (Japan) transmission electron microscope (TEM). The morphology of the PC-AgNPs powder was examined by a Hitachi S-4800 (Japan) field-emission scanning electron microscope (FE-SEM). The chemical composition and distribution of elements on the catalyst surface were studied by energy-dispersive X-ray spectroscopy (EDX) and element mapping technology conducted on an EMAX Energy EX-400 analyzer (Horiba, Japan). The X-ray diffraction (XRD) method was used for investigating the crystalline nature and phase composition of the synthesized samples. The XRD patterns were collected in the 2θ range of 10-80 • on a Shimadzu 6100 X-ray diffractometer (Japan) at a voltage of 40 kV with CuKα radiation (λ = 1.5406 Å). The Fourier transform infrared (FTIR) spectra were recorded on a JASCO FTIR-4700 spectrometer (USA) in a wavelength range of 4000-500 cm -1 . The dynamic light scattering (DLS) and zeta potential measurements PC-AgNPs were performed on a Horiba SZ-100 nanoparticle size and zeta potential analyzer (Japan).
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