Quanta 450
The Quanta 450 is a scanning electron microscope (SEM) designed for high-resolution imaging and analysis of a wide range of materials. It features a field emission gun (FEG) electron source, offering improved resolution and reduced sample charging compared to traditional tungsten filament SEMs. The Quanta 450 provides versatile imaging capabilities across a broad range of applications.
Lab products found in correlation
169 protocols using quanta 450
Surface Imaging of Seed Samples
Ultrastructural Analysis of Acanthella spinulosa
For SEM observation, the samples were dried in a critical point dryer (CPD300, Leica) and imaged in a ThermoFisher Quanta 450. For TEM observation, the samples were embedded in fresh resin and polymerized at 65 °C for 24 h. Sections (70 nm) were made using a Leica UC7 ultramicrotome and post-stained with uranyl acetate and lead citrate. Grids were imaged at 80 kV in a JEOL Jem-1400 TEM using a CMOS camera (XAROSA, EMSIS). The polymerized resin block was also used for microCT (SkyScan 1272, Bruker) imaging, and the microCT data were processed using Amira (v.2020.3) software.
Evaluating C. albicans Morphology via SEM
Characterization of PLGA and PLA Nanofibers
Scanning Electron Microscopy of Rice Chalkiness
Fiber Morphology and Composition Analysis
atomic percentage of the fibers were determined by scanning electron
microscopy (SEM) and energy-dispersive spectrometry (EDS) on a microscope
(QUANTA 450, Thermo Fisher Scientific). The fibers were coated with
gold before observing with an accelerating voltage of 10–15
kV.
Scanning Electron Microscopy of Samples
studied using a scanning electron
microscope (QUANTA 450, Thermo Fisher Scientific, MA). The samples
were sputtered with gold (5–10 nm thickness) and measured at
an acceleration voltage of 10–15 kV.
Microscopic Characterization of Chitosan Microparticles
The surface morphology and the size of the microparticles in dry state were analyzed by Environmental Scanning Electron Microscopy (ESEM) using a Quanta 450 (Thermo Fisher Scientific, Hillsboro, Oregon, USA) microscope. The ESEM microanalysis can be performed for any samples, even non-conductive without the necessity of applying a conductive layer that can influence the surface topography. Samples were placed on an aluminum stub covered with a carbon layer, and images were achieved by applying an electron beam with an accelerating voltage of 20 kV.The diameters of the microparticles were calculated using ESEM software. All of the measurements were performed in triplicate and the values were expressed as mean ± standard deviation (SD).
Morphological Characterization of Samples
Comprehensive Materials Characterization Protocol
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