calibration method,39 (link) the normal and torsional
resonance frequency and quality factor of a UV–ozone-cleaned
cantilever (HQ/CSC38/tipless/Cr–Au, MikroMasch, Bulgaria) were
determined with an atomic force microscope (Nanowizard III, JPK, Germany)
to calculate the normal and torsional spring constants.40 (link) Glass particles (50–100 μm, Whitehouse
Scientific, UK) were deposited on a microscope slide, dried with a
nitrogen jet, and mounted on the AFM stage. The tip of the cantilever
was dipped into a small drop of UV-curable adhesive (Norland Optical
Adhesive 63, USA) and aligned with a particle. The cantilever was
brought into contact with the particle and the adhesive was cured
with UV light (GEM10 UV, 3000 mW at 365 nm, Nitecore, Germany) for
1 min at a distance of 3–4 cm. A clean and sharp edge of the
silicon wafer was used as a vertical sidewall for the measurement
of lateral deflection sensitivity.