Fourier transform infrared spectroscopy (FTIR) using KBr powder-pressed pellets with approximately 1 wt.% of the sample was recorded on a Perkin–Elmer Spectrum GX-spectrophotometer (Waltham, MA, US) with a spectral resolution of 1 cm−1 and scan number of 32. The morphology of all samples was observed by scanning electron microscopy (SEM) using a FEI-SEM system (FEI Helios Nanolab 600i, Hillsboro, OR, US) operating at 5 kV. For particle size estimation, more than 100 particles on the SEM images were averaged. Transmission electron microscopy (TEM) images were obtained using a FEI Tecnai G2F30 electron microscope (FEI, Hillsboro, OR, US) operating at 200 kV. The X-ray diffraction (XRD) pattern of the samples was recorded using a X PertPowder (PANalytical B.V., Almelo, Netherlands). The X-ray tube was operated at 40 kV and 40 mA (Cu Kα radiation with Ni filter, λ = 1.5406 Å). UV-visible spectra were recorded using the Evolution 201 (Thermo, Waltham, MA, US) UV-Visible spectrophotometer with 1 cm quartz cuvettes.
Tecnai g2 f30 electron microscope
Manufactured by Thermo Fisher Scientific
Sourced in United States
The Tecnai G2 F30 is a transmission electron microscope (TEM) manufactured by Thermo Fisher Scientific. It is designed to provide high-resolution imaging and analysis capabilities for a wide range of materials and applications. The Tecnai G2 F30 features a field emission gun (FEG) source, which enables the production of a high-brightness electron beam, and advanced optics that allow for the examination of samples at the nanometer scale.
Automatically generated - may contain errors
Lab products found in correlation
Escalab 250xi, by Thermo Fisher Scientific (2 mentions)
X pert powder, by Malvern Panalytical (1 mentions)
Evolution 201, by Thermo Fisher Scientific (1 mentions)
Spectrum gx spectrophotometer, by PerkinElmer (1 mentions)
Helios nanolab 600i, by Thermo Fisher Scientific (1 mentions)
Invia confocal raman microscope, by Renishaw (1 mentions)
Vertex 80v ftir spectrometer, by Bruker (1 mentions)
3 protocols using tecnai g2 f30 electron microscope
1
Comprehensive Characterization of Materials
2
Characterization of Carbon-Based Materials
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X-ray Diffraction (XRD) was carried out on a Shimadzu 7000S diffractometer with Cu Kα radiation (λ = 1.5418 Å), with a scanning rate of 3° min−1 in the range of 10°–80°. The average crystal sizes were calculated according to the Scherrer formula. The Raman spectra were recorded using a 532 nm laser source by a Renishaw inVia confocal Raman microscope. The value of ID/IG was calculated by the corresponding area of the Raman peaks located at 1343 cm−1 and 1573 cm−1 identified after peak deconvolution. X-ray photoelectron spectroscopy (XPS) was achieved on the ESCALAB™ 250Xi (Thermo Fisher, USA). The charge correction was based on the C 1s peak at 284.6 eV. The X-ray excitation source was Al Kα. Transmission electron microscopy (TEM) was performed on a FEI Tecnai G2 F30 electron microscope at an acceleration voltage of 120 kV. The average sizes of the particles were calculated based on more than 200 particles. H2-temperature-programmed reduction (H2-TPR) was carried out on a Quantachrome ChemBET 3000 Chemisorber apparatus with a gas flow rate of 30 mL min−1. The reduction process was carried out by increasing the temperature from 50 °C to 800 °C at a heating rate of 10 °C min−1.
3
Multimodal Characterization of Nanomaterials
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Transmission electron microscopy (TEM) was performed using a FEI Tecnai G2 F30 electron microscope at an acceleration voltage of 120 KV. Fourier transform infrared (FT-IR) spectroscopy was carried out on a Bruker Vertex 80v FT-IR spectrometer. The specific surface area and pore structure of the samples were investigated using N2 physical adsorption/desorption at −196°C using an automatic volumetric sorption analyzer (Quantachrome, Autosorb-iQ-C). X-ray diffraction (XRD) was carried out on a Shimadzu 7000S diffractometer with Cu Kα radiation (λ = 1.5418 Å), with a scanning rate of 3o/min in range of 10o–80o. X-ray photoelectron spectroscopy (XPS) was operated on the ESCALAB™ 250Xi (Thermo Fisher Scientific, United States) using the X-ray excitation source of Al Kα. The charge correction is based on C1s peak at 284.6 eV. H2 temperature–programmed reduction (H2-TPR) was carried out using Quantachrome ChemBET 3000 Chemisorber with the gas flow rate of 30 ml/min. The reduction process was carried out by increasing the temperature from 50°C to 800°C at a heating rate of 10°C/min.
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