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Holey carbon coated copper grid

Manufactured by Agar Scientific
Sourced in United Kingdom

Holey carbon-coated copper grid is a type of sample support used in electron microscopy. It consists of a copper grid with a thin layer of carbon film that contains uniform holes. The grid provides a stable and conductive surface for mounting and observing samples in transmission electron microscopes.

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5 protocols using holey carbon coated copper grid

1

Morphology Characterization of Self-Assembled Peptide-Based Nanostructures

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Solutions (1 mM, 40 μL) of PA-E3, DBS-COOH, and PA-E3/DBS-COOH mixtures were added to GdL (0.2
mg), shaken thoroughly, and incubated for 10 h. Samples were then
mounted on holey carbon-coated copper grids that were preplasma-treated
(Agar Scientific, Stansted, U.K.). The grids were immersed in ultrapure
water for 30 s to remove excess and unadsorbed samples. The grids
were then immersed in a solution of uranyl acetate (2%) for 30 s,
and excess uranyl acetate solution was removed using filter paper.
Grids were allowed to dry in a desiccator for 24 h at room temperature.
Images were acquired on a JEOL 1230 transmission electron microscope
fitted with a Morada CCD camera and operated at an acceleration voltage
of 80 kV.
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2

Characterizing Self-Assembled Peptide Nanomaterials

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Solutions
(0.5 mM, 100 μL) of PA-E3, DBS-COOH, and PA-E3/DBS-COOH mixtures were added to GdL (0.2
mg/mL) and shaken thoroughly. An aliquot (50 μL) of each sample
was added onto a flat sheet of parafilm. Holey carbon-coated copper
grids (Agar Scientific, Stansted, U.K.) that were preplasma-treated
were carefully placed on top of each drop. The samples were kept in
a temperature and humidity chamber to prevent evaporation. The grids
were taken off at various time intervals, excess solution was removed
using filter paper, and the grids were then immersed in a solution
of uranyl acetate (2%) for 30 s and excess uranyl acetate solution
removed using filter paper. Grids were allowed to dry in a desiccator
for 24 h at room temperature. Images were acquired on a JEOL 1230
transmission electron microscope fitted with a Morada CCD camera and
operated at an acceleration voltage of 80 kV.
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3

TEM Characterization of Nanoparticle Size

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The size of the as prepared nanoparticles was characterized by TEM by casting one droplet of nanoparticle solution (hexane) onto a holey carbon coated copper grid (Agar Scientific) and allowing to evaporate to dryness. TEM imaging was performed using a JEOL 2100F FEG TEM with a Schottky field emission source. The accelerating voltage was 200 kV. The obtained particle size distribution was obtained from imaging at least 6 different areas of the grid and measuring the diameter of over at least 120 individual nanoparticles. ImageJ software was used for manual size analysis of the images. Measurements were taken of the ~ 20 particles in the top right hand corner of each image to ensure consistency and each particle was measured horizontally on the image to avoid systematically measuring the longest axis. No measurable change in particle size was seen in different regions of the grid.
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4

Ultrastructural Characterization of Selenite-Amended Cells

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Samples of selenite-amended culture (1.5 mL) were pelleted by centrifugation (11,000×g; 10 min; room temperature) and washed with 0.1 M sodium phosphate buffer (pH 7.4). The specimens were then fixed in 3% glutaraldehyde in the same buffer overnight at room temperature and washed again in the same buffer. Secondary fixation was carried out in 1% w/v aqueous osmium tetroxide for 1 h at room temperature followed by the same wash step. Fixed cells were dehydrated through a graded series of ethanol dehydration steps (75, 95 and 100% v/v) and then placed in a 50/50 (v/v) mixture of 100% ethanol and 100% hexamethyldisilazane followed by 100% hexamethyldisilazane. The specimens were then allowed to air dry overnight. A small sample of the fixed sample was crushed and dispersed in methanol, with a drop placed on a holey carbon-coated copper grid (Agar Scientific). The samples were examined in an FEI Tecnai F20 field emission gun (FEG)-TEM operating at 200 kV and fitted with a Gatan Orius SC600A CCD camera, an Oxford Instruments X-Max SDD EDX detector and a high-angle annular dark-field (HAADF) scanning TEM (STEM) detector.
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5

Transmission Electron Microscopy Imaging

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Indoor and outdoor filter samples were imaged digitally using transmission electron microscopy (TEM). Images and EDX spectra were acquired using a Tecnai G2 F20 X-TWIN (FEI, The Netherlands, 2011) microscope with a Schottky-type field emission electron source, a high-angle annular dark field (HAADF) detector, a single- and double-tilted sample holder, and an 11 MPix ORIUS SC1000B (Gatan) CCD camera. Samples were mounted directly on a holey carbon-coated copper grid (Agar Scientific Ltd., Stansted, UK).
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