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76 protocols using d max 2550

1

Powder X-ray Diffraction Analysis of APIs

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Powder X-ray diffraction data were collected using Rigaku D/Max-2550 powder X-ray diffractometer (Rigaku, Tokyo, Japan) with CuKα radiation of λ = 1.54178 Å at 40 kV and 150 mA. All samples, including API, CCFs, and new cocrystals, were analyzed between 2θ values of 3° and 40° with a step size of 0.02° and a scanning speed of 8°/min. The theoretical powder diagrams of the cocrystals were generated using the Mercury software [19 ,20 (link)] with starting and ending angles of 3–40°, step length of 0.02°, and half width of 0.15°.
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2

Powder X-ray Diffraction Analysis

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The Powder X-ray diffraction (PXRD) results were obtained on a Rigaku D/Max-2550 powder diffractometer (Rigaku Co., Tokyo, Japan), with a CuKα radiation source, λ = 1.54059 Å and operated at 40 kV and 250 mA. The scans were ran from 3.0 to 50.0° (2θ), with an increasing step size of 0.02° (2θ) and count time of 2 s per step. Data were processed using the MDI-Jade version 9.0 software (Philadelphia, PA, USA).
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3

Comprehensive Material Characterization by XRD and Raman

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The powder X-ray diffraction (XRD) patterns were obtained on a Rigaku D/Max-2550 powder diffractometer (Rigaku Co., Japan). Measurement conditions are: CuKα rays (λ=1.54059 Å), 40 kV, 250 mA, scanning range is 5~45°(2θ), step width is 0.02°(2θ), scanning speed is 5°/min. Raman spectra were collected using a LabRAM HR Evolution Raman spectrometer (Horiba Jobin Yvon Inc., France). The Raman scattering was excited with a 633 nm He-Ne laser source and a 100×objective lens to collect the backscattered light. The spectral resolution of the instrument was 2 cm -1 and a grating of 600 g/mm. Thus the theoretical value of the laser spot size was 3.1 μm. A reference standard silicon wafer was used to calibrate the spectrometer. Then the measurements were performed at room temperature in a darkroom to minimize the influence of external light. The laser output power was set to 10 mW and the integration time was set to 10s over the Raman shift range of 400 cm -1 to 4000 cm -1 . The detection points were randomly selected, and more than 3,000 spectra were measured for each sample.
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4

Characterization of Zeolite-Titania Composites

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The crystalline phases of the samples were identified with an X-ray diffraction detector (Rigaku D/max2550, Tokyo, Japan) with a Cu Ka ray source operating at 40 kV and 100 mA. The diffraction angles (2θ) between 5° and 70° were continuously recorded with the interval of 0.02° at the speed of 4°min−1. The ZTC were grinded to a micron-sized powder and plated with a layer of gold film. The surface morphology and microstructure of the ZTC were observed by SEM (FEI Quanta 200F, Hillsboro, America). In addition, the micro-area element was analyzed by EDS. The specific surface area and pore size distribution of the ZTC were revealed by N2 adsorption-desorption isotherms which were measured by the instrument (Beishide 3H-2000PS2, Beijing, China). The infrared spectrum was measured by FTIR (BRUKER EQUINOX55, Karlsruhe, Germany) to verify if there is a chemical bond between TiO2 and zeolite.
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5

Characterization of Cs3Bi2I9 Nanocrystals

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The crystal structure of the prepared Cs3Bi2I9 NCs was measured by HRTEM (JEM‐2010F). XRD (Rigaku D/Max‐2550) was performed to study the crystallinity of the sample. The PL spectra were studied by a spectrofluorometer (Horiba; Fluorolog‐3). The absorption spectra were conducted by a Shimadzu UV‐3150 spectrophotometer. The electrical characteristics were conducted using a Keithley 4200‐SCS parameter analyzer. The light source was power‐adjustable. UTG4082A were conducted to provide a pulse signal to generate pulsed light. All the device tests were carried out under an ambient condition at room temperature. The image processing was carried out using MATLAB.
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6

Comprehensive Characterization of Catalytic Materials

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SEM images and EDX elemental mapping images were acquired using a ZEISS Gemini 450 SEM. TEM images were obtained using a JEM-2100F instrument. XRD measurements were carried out on a Rigaku D/MAX 2550 diffractometer with Cu Ka radiation (l = 1.5418 Å) at 35 kV and 25 mA in the 2 θ range from 5° to 70° with a scan rate of 0.02° per second. The compositions and valence of catalysts were determined by XPS Thermo ESCALAB 250Xi) with Mg Kα radiation source (hν = 1253.6 eV). All the peaks were calibrated with C 1s peak at 284.8 eV to determine the accurate binding energies (±0.1 eV). The deconvolution of the Al, Si, Ti, C, and O was performed through the software CasaXPS. UV-vis spectra were obtained on a UV-3600 Plus Shimadzu spectroscope, by using pure BaSO4 as a reference. The structure of the prepared materials was characterized by Raman spectroscopy on a Thermo Fisher Scientific Dxr2xi under a laser light at 532 nm, and FTIR spectra were recorded on a NEXUS670 infrared spectrophotometer. The textural properties of the samples were determined using N2 physisorption isotherms at 77 K on a Quantachrome Autosorb-3B analyzer.
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7

Comprehensive Materials Characterization

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The morphologies and elemental composition of the as-prepared samples were characterized using a field emission scanning electron microscopy (FE-SEM, Hitachi, S-4800) equipped with energy-dispersive X-ray spectroscopy (EDS). The X-ray diffraction (XRD) patterns of the samples were examined with the 2θ-angle from 5° to 80° on a Rigaku D/max 2550 diffractometer, using Cu (Kα) radiation (λ = 1.5406 Å). Raman spectra were recorded with a Raman spectroscopy (WITec). The compositional analysis of the samples was analyzed by X-ray photoelectron spectroscopy (XPS, K-alpha; Escalab 250Xi model, Thermo Fisher, UK).
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8

Characterization of Mo2CTx/PDMS Composite Films

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The crystalline structures were characterized by wide-angle X-ray Diffraction (XRD, Rigaku D/Max 2550) in the 2θ range from 5° to 50° with Cu Kα radiation (λ = 1.5418 Å). The surface morphology and contained elements of Mo2CTx/PDMS composite films were observed by Scanning Electron Microscope (SEM, Hitachi TM4000Plus and FESEM, JEOL JSM-7900F) with an accelerating voltage of 5 kV. Alpha-High Performance Frequency Analyzer (Alpha-A) was used to test the dielectric constant and dielectric loss of Mo2CTx/PDMS composite films. Using an auto-injector, 3 μL of deionized water was randomly dropped at different locations on the surface of PDMS and Mo2CTx/PDMS composite films to investigate the change of water contact angle before and after mixing. The open-circuit voltage and short-circuit current of the Mo-TES were measured using a programmable electrostatic meter (Keithley, 6514), and real-time data recording was facilitated through Keithley KickStart software(KickStartFL-DMM 2.9.0). The electrodynamic measuring table (ESM303, Mark10) was used with the force set to 25 N and the height set to 5 mm in the measurement of Mo-TES with different mixing mass fractions, and the force was set to 100 N with the same height in the measurement of Mo-TES sensing properties. Finite element simulations were implemented by COMSOL (COMSOL 6.0) multi-physics field simulation software.
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9

Powder X-ray Diffraction of Crystalline Materials

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Powder X-ray diffraction patterns were recorded on a D/max-2550 (Rigaku, Japan) at room temperature. It used a Copper X-ray source (40 kV and 150 mA) to provide CuKα emission of 1.54184 Å. The divergence and scattering slits were set at 1°, and the receiving slit was set at 0.15 mm. Data was collected from 3° to 80° (2θ) at a step size of 0.02° and scanning speed of 8° min−1. Powders for PXRD measurement were obtained by grinding crystalline material in an agate mortar, particle size around 5 μm. Powders were packed into the holder and gently pressed by a glass slide to ensure coplanarity between the sample surface and the surface of the sample holder.
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10

Comprehensive Characterization of Material Samples

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The phase purity of the obtained samples was examined by X-ray diffraction (XRD; RigaKu D/max-2550) with Cu Kα source in the 2θ range of 10–80° at a scanning rate of 2° min−1. The morphological features were observed by a Hitachi SU8020 scanning electron microscope (SEM) and a FEI Tecnai G2 transmission electron microscope (TEM). Raman spectroscopy was recorded on a Renishaw in via Raman spectroscopy with Ar-ion laser excitation (λ = 514.5 nm). Quantitatively, the content of carbon was evaluated using a Mettler-Toledo Thermogravimetric (TG) analyzer. Nitrogen adsorption–desorption isotherms were measured at 77 K using a Micromeritics ASAP 2010 instrument. The specific surface area was calculated using the Brunauer–Emmett–Teller (BET) method and the pore-size distribution (PSD) curves were calculated from the isotherm using the Barrett–Joyner–Halenda (BJH) algorithm.
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