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Silicon cantilevers

Manufactured by Olympus
Sourced in Japan

Silicon cantilevers are microscale mechanical structures made of silicon. They function as sensitive sensors, detecting small forces, displacements, or vibrations.

Automatically generated - may contain errors

2 protocols using silicon cantilevers

1

Atomic Force Microscopy of Topographical Imaging

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Topographical
images have been recorded
by AFM in the tapping mode with a Bruker Dimension FastScan Bio instrument.
For measurement in air, the images were scanned using silicon cantilevers
(Olympus) with a resonance frequency of 300 kHz and a force constant
of 26 N m–1. The scanned image size was 1 ×
1 μm2. For the measurements in liquid environment,
FastScan-D and SNL cantilevers having resonance frequencies of 110
and 65 kHz, and force constants of 0.25 and 0.35 N m–1, respectively, were used.
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2

AFM Imaging and Analysis of Nanoparticles

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A commercial AFM instrument (Multimode/PicoForce system with NS-V controller, Bruker Nano-surfaces, Inc. Santa Barbara, CA) was used to image air-dried nanoparticles on freshly cleaved mica surface. Silicon Cantilevers (OMCL, ~300kHz, 42N/m by Olympus, Japan) were used to acquire height, amplitude error, and phase images of the nanoparticles. The phase and amplitude images produced the clearest 3D visualization of the nanoparticle surface. AFM images were analyzed using the particle-analysis toolbox of the NIH ImageJ software (available at http://rsb.info.nih.gov/ij, National Institutes of Health, Bethesda, MD) to measure the area footprint (A) and volume (V) of the surface-adsorbed nanoparticles. Particle diameters < 5 nm were not included in the image analysis. Two kinds of particle diameters were calculated from the measured A and V. The ‘area-equivalent’ diameter was calculated as the diameter of a circle having the same area footprint as the nanoparticle on the imaging surface, DA= (4A/π)½. The ‘volume-equivalent’ diameter was calculated as the diameter of a sphere having the same volume as the nanoparticle on the imaging surface, DV = (6V/π)1/3. (see Supplementary information S2).
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