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S3700 scanning electron microscope

Manufactured by Hitachi
Sourced in Japan

The S3700 Scanning Electron Microscope is a high-performance laboratory instrument designed for imaging and analyzing the surface of solid samples at high magnification. It utilizes a focused beam of electrons to scan the sample surface and generate detailed images, revealing the topography and composition of the material.

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2 protocols using s3700 scanning electron microscope

1

Fermented Underutilized Fruit Composition

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Determination of protein content, fat, and moisture was conducted using methods described in the National Standards of People's Republic of China (GB/T 5009.5–2003). Polysaccharide contents of UFO and FO were determined using the phenol‐sulfuric acid method. Samples were taken before and after fermentation for electron microscopy and prepared with the ion sputter coating method before being placed in the scanning electron microscope sample chamber (Hitachi S3700 Scanning Electron Microscope), the voltage was set to 5 kV and samples photographed at 500 times and 2, 000 times magnification to observe the morphology of the material's surface.
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2

Multimodal Analysis of Material Characterization

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X-ray powder diffraction (XRPD) patterns were recorded on a Rigaku-D/max 2500 V X-ray diffractometer equipped with a source of Cu-Kα radiation (λ = 1.54178 Å) (Rigaku, Tokyo, Japan). The scanning electron micrographs (SEM) were obtained from a model S-3700 scanning electron microscope (Hitachi, Kyoto, Japan). The infrared spectrum (IR) and thermogravimetric analysis (TGA) were measured by using an EQUINOX 55 spectrometer (Bruker, Germany) and STA449C (NETZSCH, Selb, Germany), respectively. The BET surface area and pore distribution were tested by N2 adsorption on GEMINI VII 2390 (Micromeritics, Georgia, USA) under 77 K. Water samples flowed the SPE column by a vacuum pump (Yiheng, Shanghai, China).
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