S3700 scanning electron microscope
The S3700 Scanning Electron Microscope is a high-performance laboratory instrument designed for imaging and analyzing the surface of solid samples at high magnification. It utilizes a focused beam of electrons to scan the sample surface and generate detailed images, revealing the topography and composition of the material.
2 protocols using s3700 scanning electron microscope
Fermented Underutilized Fruit Composition
Multimodal Analysis of Material Characterization
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