The structural, morphological, and microstructural properties of the graphene and iron oxide nanocomposites were characterized using a variety of characterization techniques such as X-ray diffraction (XRD), Raman analysis, scanning electron microscopy (SEM), transmission electron microscopy (TEM), and thermogravimetric analysis (TGA). More specifically, XRD measurements were done using a PANanalytical X-ray diffraction system. Raman analysis was performed by a Jobin-Yvon HR300 Raman spectrometer using a 532 nm green laser source. SEM images were taken on a Carl Zeiss Ultra 1540 Dual Beam FIB/SEM System. TEM images were obtained using a JEOL JEM-2010 instrument with an operating voltage of 200 kV. TGA measurements were performed in air atmosphere from 30 to 800 °C at a heating rate of 10 °C min−1 in a TA Instruments TGA-Q50. The XPS were recorded on a PHI 5000 Versa Probe system.
Jem 2010 instrument
Manufactured by JEOL
Sourced in Japan
The JEM-2010 is a transmission electron microscope (TEM) produced by JEOL. It is designed to provide high-resolution imaging and analysis of materials at the nanoscale level. The JEM-2010 features a LaB6 electron source and can operate at an accelerating voltage of up to 200 kV. The instrument is capable of performing various analytical techniques, including selected area electron diffraction (SAED) and energy-dispersive X-ray spectroscopy (EDS).
Automatically generated - may contain errors
Lab products found in correlation
Dxr raman microscope, by Thermo Fisher Scientific (2 mentions)
Ultra 1540 dual beam fib sem system, by Zeiss (1 mentions)
Tga q50, by TA Instruments (1 mentions)
Merlin microscope, by Zeiss (1 mentions)
Cu kα radiation, by Bruker (1 mentions)
D8 focus diffractometer, by Bruker (1 mentions)
Uv 1600 spectrometer, by Shimadzu (1 mentions)
Edx 800 hs series, by Shimadzu (1 mentions)
Zetasizer ultra, by Malvern Panalytical (1 mentions)
Merlin electron microscope, by Zeiss (1 mentions)
5 protocols using jem 2010 instrument
1
Characterization of Graphene-Iron Oxide Nanocomposites
2
Multifaceted Characterization of Adsorbent Materials
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The morphological
and structural characteristics of the adsorbent were examined by scanning
electron microscopy (SEM) under a MERLIN microscope (Carl Zeiss, Jena,
Germany), and transmission electron microscopy (TEM) using a JEM-2010
instrument (JEOL Ltd., Tokyo, Japan). The specific surface area and
porosity were measured based on nitrogen adsorption using an Autosorb-iQ
analyzer (Quantachrome). To determine the qualitative and quantitative
phase composition of the materials, a Difrey 401 desktop X-ray diffractometer
(Scientific Instruments CJSC, St. Petersburg, Russia) was used. The
absorbance of the prepared solutions was determined on a PE-5400 V
spectrophotometer (Ekros-Engineering LLC, Saint Petersburg, Russia).
Raman spectra were recorded on a DXR Raman microscope (Thermo Scientific
Instruments Group, Waltham, MA). The mass losses and thermal effects
were determined by an STA 449 F3 Jupiter instrument (NETZSCH-Feinmahltechnik
GmbH, Selb, Germany), which allowed simultaneous thermogravimetry
(TG) and differential scanning calorimetry (DSC) measurements too.
and structural characteristics of the adsorbent were examined by scanning
electron microscopy (SEM) under a MERLIN microscope (Carl Zeiss, Jena,
Germany), and transmission electron microscopy (TEM) using a JEM-2010
instrument (JEOL Ltd., Tokyo, Japan). The specific surface area and
porosity were measured based on nitrogen adsorption using an Autosorb-iQ
analyzer (Quantachrome). To determine the qualitative and quantitative
phase composition of the materials, a Difrey 401 desktop X-ray diffractometer
(Scientific Instruments CJSC, St. Petersburg, Russia) was used. The
absorbance of the prepared solutions was determined on a PE-5400 V
spectrophotometer (Ekros-Engineering LLC, Saint Petersburg, Russia).
Raman spectra were recorded on a DXR Raman microscope (Thermo Scientific
Instruments Group, Waltham, MA). The mass losses and thermal effects
were determined by an STA 449 F3 Jupiter instrument (NETZSCH-Feinmahltechnik
GmbH, Selb, Germany), which allowed simultaneous thermogravimetry
(TG) and differential scanning calorimetry (DSC) measurements too.
3
Comprehensive Characterization of Materials
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Fluorescence measurements were characterized using a F-97 fluorescence spectrophotometer (Shanghai Lengguang Technology, China). A JEM-2010 instrument (Jeol Ltd., Tokyo, Japan) equipped with an energy dispersive spectroscope (EDS) at 200 kV was used to investigate the transmission electron microscopy (TEM). Scanning electron microscopy (SEM) images were obtained using a Hitachi S-4800 FE-SEM instrument (Hitachi Chemical Company, Ltd., Tokyo, Japan). X-ray diffraction (XRD) measurements were investigated on a Bruker D8 FOCUS diffractometer using Cu Kα radiation (Billerica, MA, USA). UV-Vis spectroscopy was studied using a UV-1600 spectrometer (Shimadzu Scientific Instruments Inc., Columbia, MD, USA). Inductively coupled plasma mass spectrometry (ICP-MS) was studied by a Thermo Scientific instrument (Waltham, MA, USA).
4
Physicochemical Characterization of Silver Nanoparticles
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AgNP concentration in the resulting solutions was determined by evaporation on a watch glass [18 ] at 100 °C using a a Zetasizer Ultra (Malvern Instruments Ltd., Great Britain, Malvern, UK). Briefly, the AgNP suspensions were placed on the watch glass and covered with filter paper to prevent contamination, and then dried. To maximize drying speed, the watch glass was placed in a thermostat, ensuring good air circulation for 24 h. The AgNPs’ dry powder weight was determined.
Size distribution by volume, zeta potential distribution, polydispersity index (PDI), and cumulative particle concentration were determined using a Zetasizer Ultra (Malvern Instruments Ltd., Malvern, UK).
X-ray spectra of AgNPs were obtained with an energy dispersive X-ray fluorescence spectrometer, EDX 800 HS series (Shimadzu, Japan).
The resulting concentrate of the nanoparticle solution was filtered through Vivaspin 6 membrane filters 1000 kDa, with pore sizes of 0.2 μm (Sartorius, Germany) and PES membrane material.
Transmission electron microscopy (TEM) images were obtained using a JEM-2010 instrument (JEOL, Tokyo, Japan).
Ultraviolet-visible (UV-Vis) absorption spectroscopy analysis was performed on the AgNP samples dispersed in water using a UV-Vis spectrophotometer (Unico 2802s, Unico Sys, Franksville, WI, USA).
Size distribution by volume, zeta potential distribution, polydispersity index (PDI), and cumulative particle concentration were determined using a Zetasizer Ultra (Malvern Instruments Ltd., Malvern, UK).
X-ray spectra of AgNPs were obtained with an energy dispersive X-ray fluorescence spectrometer, EDX 800 HS series (Shimadzu, Japan).
The resulting concentrate of the nanoparticle solution was filtered through Vivaspin 6 membrane filters 1000 kDa, with pore sizes of 0.2 μm (Sartorius, Germany) and PES membrane material.
Transmission electron microscopy (TEM) images were obtained using a JEM-2010 instrument (JEOL, Tokyo, Japan).
Ultraviolet-visible (UV-Vis) absorption spectroscopy analysis was performed on the AgNP samples dispersed in water using a UV-Vis spectrophotometer (Unico 2802s, Unico Sys, Franksville, WI, USA).
5
Characterization of Carbonized Aerogel Properties
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The specific surface area, volume, and pore size of the carbonized aerogel were studied using nitrogen adsorption at 77 K with an Autosorb iQ automatic analyzer (Quantachrome Instruments, Boynton Beach, FL, USA). The structural characteristics were studied using X-ray phase analysis with a Thermo Scientific ARL Equinox 1000 X-ray diffractometer (TechTrend Science Co., Ltd., Tainan City, Taiwan). A MERLIN electron microscope (Carl Zeiss, Jena, Germany) and a JEM-2010 instrument (JEOL Ltd., Tokyo, Japan) were used for scanning and transmission electron microscopy (SEM and TEM) investigations, respectively, to study surface topography and morphology. The chemical analysis of the material composition and structure was performed through Raman spectroscopy with a DXR Raman microscope (Thermo Fisher Scientific, Waltham, MA, USA). Thermogravimetry (TG) and differential scanning calorimetry (DSC) analyses were performed with a NETZSCH STA 449 F3 Jupiter simultaneous thermal analysis instrument (NETZSCH-Feinmahltechnik GmbH, Selb, Germany).
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