The mineralogy of precipitates was determined by powder X-ray diffraction (XRD) using a Rigaku D/max2550VB3+/PC diffractometer. The morphology of the precipitates was studied by scanning electron microscopy (SEM) using a Hitachi S-2360N. The composition of medium before and after precipitation was dried at 80°C and then analyzed by Fourier transform infrared spectroscopy (FT-IR) using a Bruker Hyperion 2000.
D max2550vb3 pc diffractometer
Manufactured by Rigaku
Sourced in Japan
The D/max2550VB3+/PC diffractometer is a versatile X-ray diffraction (XRD) instrument manufactured by Rigaku. It is designed for performing phase identification, structural analysis, and crystallographic studies of various materials. The core function of this diffractometer is to provide users with high-quality X-ray diffraction data, enabling them to investigate the structural properties of their samples.
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Lab products found in correlation
2 protocols using d max2550vb3 pc diffractometer
1
Mineralogical and Compositional Analysis of Precipitates
2
Characterization of Porous Carbons
Check if the same lab product or an alternative is used in the 5 most similar protocols
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Field
emission scanning electron microscopy (Nova NanoSEM450, USA) is a
powerful technique for characterizing the structure and surface morphologies
of the porous carbons. A transmission electron microscope (TEM, JEOL-2100F,
Japan) is used to investigate the morphologies of the samples. The
XRD patterns of these samples were collected via a D/max 2550VB3+/PC
diffractometer (RIGAKU, Japan) with Cu Kα radiation (40 kV,
40 mA, and k = 1.5418 Å) between 10 and 80°.
X-ray photo-electron spectroscopy (XPS) is a powerful technique for
quantitative surface analysis to characterize the elemental analysis
of the samples. Raman spectra were obtained on a Senterra R200-L apparatus
(BrukerOptics, Germany). Thermogravimetric analysis (TGA) of the samples
was performed using a TAQ600 (TGA) analyzer from American TA.
emission scanning electron microscopy (Nova NanoSEM450, USA) is a
powerful technique for characterizing the structure and surface morphologies
of the porous carbons. A transmission electron microscope (TEM, JEOL-2100F,
Japan) is used to investigate the morphologies of the samples. The
XRD patterns of these samples were collected via a D/max 2550VB3+/PC
diffractometer (RIGAKU, Japan) with Cu Kα radiation (40 kV,
40 mA, and k = 1.5418 Å) between 10 and 80°.
X-ray photo-electron spectroscopy (XPS) is a powerful technique for
quantitative surface analysis to characterize the elemental analysis
of the samples. Raman spectra were obtained on a Senterra R200-L apparatus
(BrukerOptics, Germany). Thermogravimetric analysis (TGA) of the samples
was performed using a TAQ600 (TGA) analyzer from American TA.
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