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Pixis 400

Manufactured by Teledyne
Sourced in Japan

The Pixis 400 is a scientific imaging device designed for laboratory and research applications. It features a high-performance CCD sensor that provides high-resolution image capture. The device is capable of capturing images with a resolution of up to 1024 x 1024 pixels. It is designed for use in a variety of scientific and research settings, such as microscopy, spectroscopy, and other imaging-based applications.

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14 protocols using pixis 400

1

UV-Vis Micro-Spectrometry of Samples

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A custom-built UV-Vis micro-spectrometer was used to acquire the transmission spectra. Light from an incandescent bulb was focused onto the samples through a condenser lens and collected by a X20 microscope objective, then delivered to the entrance slit of a spectrometer (Princeton Instruments Acton SP2500) equipped with a 1200 g/mm grating and CCD camera (Princeton Instruments PIXIS400). Transmittance as a function of wavelength λ was calculated as T=I/I0 where I is the measured spectral intensity through the sample and I0 is the incident light intensity. Corrections to account for the optics and gratings efficiencies at different wavelengths were applied using Princeton Instruments IntelliCal system.
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2

Ultrafast Laser Systems and Signal Detection

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The ultrafast laser systems used in this study include a Chameleon oscillator laser, a Legend Elite amplifier laser, and a TOPAS tunable optical parametric amplifier, which were all purchased from Coherent Inc. The signal detection was achieved using a spectrograph/monochromator (Acton SP2300) and CCD detector (PIXIS 400) purchased from Princeton Instruments.
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3

Nanomaterial Characterization by SEM and Spectroscopy

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SEM images were
taken on a scanning
electron microscope (JEOL JSM-7800F, Schottky field emission) operated
at 10 kV. Extinction spectra were taken on an ultraviolet/visible/near-infrared
spectrophotometer (PerkinElmer Lambda 950). The used plastic cuvettes
had an optical path length of 1.0 cm. The thicknesses of the WS2 nanosheet samples were measured with an atomic force microscope
(Veeco Metrology system, model no. 920-006-101), which was operated
at the contact mode in air with sharp Si3N4 tips
(Bruker). Dark-field scattering spectra were measured at the single-particle
level on an upright optical microscope (Olympus, BX60) equipped with
a monochromator (Acton, SpectraPro 2360i), a charge-coupled device
camera (Princeton Instruments, Pixis 400, cooled to −70 °C),
and a quartz–tungsten–halogen lamp (100 W). Both the
excitation with the white light and the collection of the scattered
light from the individual nanoparticles relied on a dark-field objective,
which had a magnification of 100 and a numerical aperture of 0.9.
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4

Hyperspectral Imaging of Optically Pumped Samples

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Samples were optically pumped at room-temperature with a λ = 532 nm pulsed laser (TEEM Microchip, pulse width 500 ps, spot diameter ~160 μm). The emission was spectrally analysed using a grating spectrometer (Princeton Instruments Isoplane-320) equipped with a 1800 gr mm−1 holographic grating (0.05 nm resolution) and CCD camera (Princeton Instruments Pixis 400). For hyperspectral imaging, a lens in front of the spectrometer was mounted on a translating stage attached to a step motor. The lens was scanned in 25 μm steps and spectral data was recorded for each lens position, resulting in a 3D data set (one spatial dimension × wavelength × lens position). Hyperspectral images were reconstructed from the data set by selecting a particular wavelength of interest and spectra from the entire scanning area was extracted by summing the 3D data set across the two spatial dimensions. Mode control experiments by patterned pumping were carried out using a digital micromirror device (DMD, Ajile AJD-4500), which was inserted in the incoming beam pathway. The illumination pattern was then specified by the pattern projected on the DMD.
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5

Single-Particle Spectroscopy of Au Nanotriskelions

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The Au nanotriskelions were deposited on cleaned Si substrates with a 300-nm-thick SiO2 layer. An optical system for single-particle CDS measurements was established based on an Olympus microscope (BX53). The light generated from a quartz-tungsten-halogen lamp (100 W) was adjusted to pass through a linear polarizer (Union Optic, 550–900 nm) and a quarter-waveplate (Union Optic, 550–750 nm). The circularly polarized light then passed through a 100× dark-field objective (Olympus, NA 0.9) to create annular excitation with an incidence angle of 64°. The scattered photons were collected through the same objective and directed to a spectrometer (Acton SpectraPro 2360i) connected to a liquid-nitrogen-cooled charge-coupled-device camera (Princeton Instruments, Pixis 400, cooled to −70 °C). The measured scattering spectrum of a nanoparticle was corrected by first subtracting the background spectrum taken from the adjacent region without any nanoparticle and then dividing the obtained spectrum with the pre-calibrated response curve of the entire optical system. A pattern-matching method was employed to capture the same nanoparticle on the SEM and scattering images. The scattering response of an individual nanoparticle can therefore be correlated with its morphology.
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6

Dark-field Scattering Spectroscopy of Chiral Gold Nanocrystals

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An optical microscope (Olympus,
BX53M) equipped with a monochromator
(Acton, SpectraPro 2360i) and a charge-coupled device camera (Princeton
Instruments, Pixis 400, cooled to −70 °C) was used to
measure the dark-field scattering spectra. A 100× dark-field
air objective (Olympus, numerical aperture: 0.9) was used for scattering
measurements. Light from a halogen lamp passed through the objective
and illuminated the sample obliquely. The backward scattered light
passed through the same objective. Dark-field differential scatterometry
can provide richer information than optical measurements of the solution
samples containing the randomly orientated CGNCs. Circularly polarized
excitation in our experiments was realized by a linear polarizer and
a quarter-wave plate, both of which were purchased from Union Optic.
The working wavelength of the quarter-wave plate (WPA4420–550–750)
is 550–750 nm. The polarization handedness convention used
in this work is such that the RCP and LCP vectors rotate clockwise
and counterclockwise along the propagation axis, respectively. The
wavelengths of the scattering peaks were extracted by fitting the
scattering spectra with Gaussian functions. Extinction spectra were
measured on a PerkinElmer Lambda 950 ultraviolet/visible/near-infrared
spectrophotometer. SEM imaging was carried out on an FEI QF400 field-emission
scanning electron microscope operated at a rate of 20 kV.
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7

Exosome SERS Analysis on Gold Nanoparticles

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A cover glass substrate was cleaned by immersing in a piranha solution (H2SO4: H2O2 = 3:1) over 30 min to remove organic impurities from the surface. The SERS substrate was prepared by dropping concentrated 100 nm gold nanoparticle colloid onto the cover glass and drying at room temperature. For SERS characterization of the exosomes, 100 μl of the exosome sample (about 1012 particles/ml) were dropped onto the substrate and thoroughly dried. We measured the SERS spectra with an inverted microscope (Axio Observer D1, Zeiss) and a spectrometer (PIXIS400 and SP2300, Princeton Instruments). A 785-nm wavelength laser was irradiated to the SERS substrate and the reflected spectral signal was detected through a 50x objective lens (NA = 0.70). The laser power was 5 mW and the acquisition time was 10 s. All spectral data were preprocessed for denoising, baseline correction, and normalization. The PCA was performed using the built-in function of MATLAB 2018. Three hundred Raman signal data per sample were used for the classification.
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8

Surface-Enhanced Raman Spectroscopy for Protein Analysis

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All SERS measurements were performed using an inverted‐type microscope (Axio Observer D1) purchased from Zeiss. The microscope was equipped with a spectrometer (Acton SP2300) from Princeton Instruments. The SERSIA substrate was irradiated with a 1.5‐mW 785‐nm laser, and then scattered light from the substrate passed through the 785 nm filter. A cooled spectrograph detector (PIXIS400, Princeton Instruments) with a resolution of 1340 × 400 pixels was used to scan the Raman spectra. For protein quantification, the acquisition time was 10 s. For protein imaging, the acquisition region was 2 × 2 µm, and the acquisition time was 5 s. The spectral signals were adjusted and denoised using chromatogram baseline estimation and denoising using the sparsity (BEADS) method.[22] All numerical calculations, including the preprocessing of the spectral data and similarity analysis, were performed using MATLAB R2017a.
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9

Raman Microscopy for Cell Imaging

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We acquired Raman spectra from cells using a home-built line-scan Raman microscope based on inverted microscope (IX81: Olympus, Tokyo, Japan) equipped with spectrometer (MK-300: Bunkoukeiki, Tokyo, Japan) and a two-dimensional detector (PIX-IS400, Princeton Instruments, Trenton, NJ), as described in the previous reports [13] (link)[14] (link)[15] (link). A 532 nm laser (Ventus532: Laser Quantum, Stockport, UK) was used for illumination. The laser was shaped into a line with a cylindrical lens and directed onto the cells on a glass substrate. The laser intensity was 2.4 mW/μm 2 . The backward-scattering light was collected by an objective and captured on a 400×1340 pixels detector after being passed through a polychromator. The Raman spectrum was acquired over a range of 160 cm -1 to 2200 cm -1 on the 1340 pixels (1.52 cm -1 /pixel). By scanning the line on an axis perpendicular to it, we acquired a hyperspectral image (Figure 1A). The impact of photodamage due to the strong laser irradiation is one of the main factors behind the low-reproducibility of Raman spectroscopic measurements. To minimize photodamage, we limited the exposure time to 15 s and scanned only 10 steps at 3.35 μm/step. Total time to acquire a single hyperspectral image was only 150 s. Number of cells measured for Raman spectra is summarized in Supplementary Table S1.
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10

Nanoparticle Scattering Spectroscopy

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An inverted optical microscope (Nikon Ti-U/E20L80) with a quartz‑tungsten-halogen white light lamp source, a 100×/0.55 oil-immersed objective lens, an optical spectrometer (Spectra Pro 2500i), and a charge-coupled device camera (Princeton Instruments PIXIS 400) was used to collect the scattering spectra from single nanoparticles. Two orthogonal slits were used to collect scattered light from either a nanoparticle or the background. All nanoparticle spectra were normalized to the averaged background profiles collected immediately next to the particle (normalized spectra = nanoparticle spectra / averaged background spectra).
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