Pixis 400
The Pixis 400 is a scientific imaging device designed for laboratory and research applications. It features a high-performance CCD sensor that provides high-resolution image capture. The device is capable of capturing images with a resolution of up to 1024 x 1024 pixels. It is designed for use in a variety of scientific and research settings, such as microscopy, spectroscopy, and other imaging-based applications.
Lab products found in correlation
14 protocols using pixis 400
UV-Vis Micro-Spectrometry of Samples
Ultrafast Laser Systems and Signal Detection
Nanomaterial Characterization by SEM and Spectroscopy
taken on a scanning
electron microscope (JEOL JSM-7800F, Schottky field emission) operated
at 10 kV. Extinction spectra were taken on an ultraviolet/visible/near-infrared
spectrophotometer (PerkinElmer Lambda 950). The used plastic cuvettes
had an optical path length of 1.0 cm. The thicknesses of the WS2 nanosheet samples were measured with an atomic force microscope
(Veeco Metrology system, model no. 920-006-101), which was operated
at the contact mode in air with sharp Si3N4 tips
(Bruker). Dark-field scattering spectra were measured at the single-particle
level on an upright optical microscope (Olympus, BX60) equipped with
a monochromator (Acton, SpectraPro 2360i), a charge-coupled device
camera (Princeton Instruments, Pixis 400, cooled to −70 °C),
and a quartz–tungsten–halogen lamp (100 W). Both the
excitation with the white light and the collection of the scattered
light from the individual nanoparticles relied on a dark-field objective,
which had a magnification of 100 and a numerical aperture of 0.9.
Hyperspectral Imaging of Optically Pumped Samples
Single-Particle Spectroscopy of Au Nanotriskelions
Dark-field Scattering Spectroscopy of Chiral Gold Nanocrystals
BX53M) equipped with a monochromator
(Acton, SpectraPro 2360i) and a charge-coupled device camera (Princeton
Instruments, Pixis 400, cooled to −70 °C) was used to
measure the dark-field scattering spectra. A 100× dark-field
air objective (Olympus, numerical aperture: 0.9) was used for scattering
measurements. Light from a halogen lamp passed through the objective
and illuminated the sample obliquely. The backward scattered light
passed through the same objective. Dark-field differential scatterometry
can provide richer information than optical measurements of the solution
samples containing the randomly orientated CGNCs. Circularly polarized
excitation in our experiments was realized by a linear polarizer and
a quarter-wave plate, both of which were purchased from Union Optic.
The working wavelength of the quarter-wave plate (WPA4420–550–750)
is 550–750 nm. The polarization handedness convention used
in this work is such that the RCP and LCP vectors rotate clockwise
and counterclockwise along the propagation axis, respectively. The
wavelengths of the scattering peaks were extracted by fitting the
scattering spectra with Gaussian functions. Extinction spectra were
measured on a PerkinElmer Lambda 950 ultraviolet/visible/near-infrared
spectrophotometer. SEM imaging was carried out on an FEI QF400 field-emission
scanning electron microscope operated at a rate of 20 kV.
Exosome SERS Analysis on Gold Nanoparticles
Surface-Enhanced Raman Spectroscopy for Protein Analysis
Raman Microscopy for Cell Imaging
Nanoparticle Scattering Spectroscopy
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