spectroscopy measurements were conducted via a double-beam
spectrophotometer (T70/T80 series UV/Vis spectrophotometer, PG instruments
Ltd, U.K.), in the scanning range 200–800 nm. TEM measurements
were performed on a JEOL, JEM-2100F, Japan, operated at an accelerating
voltage of 200 kV. FTIR measurements were conducted on a JASCO spectrometer
in the range 4000–600 cm–1. ζ potential
was examined in a ζ potential analyzer (Zetasizer Nano ZS Malvern).
XRD was conducted on an X-ray diffractometer (X’Pert PRO, The
Netherlands) operated at a voltage of 45 kV and a current of 40 mA
with Cu Kα1 radiation (λ = 1.54056 Å) in the 2θ
range from 20 to 80°. Energy-dispersive X-ray spectroscopy (EDX)
was performed by a JEOL model JSM-IT100. Raman spectroscopy was performed
on the dried sample at room temperature using a SENTERRA Raman spectrometer,
Bruker, Germany, with a 514.5 nm excitation wavelength to determine
the extent of graphitic disorder within the prepared material.