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Spectrum bx spectrometer

Manufactured by PerkinElmer
Sourced in United States, Spain

The Spectrum BX spectrometer is a versatile laboratory instrument designed for analytical spectroscopy applications. It utilizes Fourier-transform infrared (FTIR) technology to provide precise and reliable analysis of a wide range of samples. The core function of the Spectrum BX is to identify and quantify the chemical composition of materials through the detection and measurement of their infrared absorption spectra.

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15 protocols using spectrum bx spectrometer

1

Spectroscopic Characterization of Materials

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FTIR spectra in the range of 400–1200 cm−1 were collected using the FT Perkin-Elmer Spectrum BX Spectrometer (Waltham, MA, USA) in the ATR crystal (Golden Gate Diamond ATR accessory). The measurements were performed using powder samples. Throughout the acquisition, the room temperature and humidity were maintained at approximately 23 °C and 35%, respectively, to ensure consistent conditions.
Raman spectroscopy was performed at room temperature utilizing a Horiba Jobin Yvon HR 800 spectrometer (Longjumeau, France) equipped with an Ar + laser (λ = 532 nm). The measurements were conducted employing a back-scattering geometry across the spectral range of 200 to 1500 cm−1. A 50× lens was employed to precisely focus on the sample during data collection.
Photoluminescence (PL) emission spectra were obtained on a Horiba Jobin Yvon Fluorolog-3 instrument equipped with a continuous Xe lamp of 450 W and photomultiplier (PMT) detector, in the range of 400–700 nm with a step width of 0.5 nm with the source, sample and the detector placed in orthogonal geometry.
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2

Elemental and Spectroscopic Analysis

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CHN analysis was performed using a Vario El Cube elemental analyzer. Infrared (IR) spectrum was recorded in the range of 400–4000 cm−1 in KBr pellets using a PerkinElmer Spectrum BX spectrometer. The EPR spectra were recorded on Bruker ELEXSYS E500 CW-EPR spectrometer operating at X-band equipped with frequency counter and NMR Teslameter.
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3

Infrared Spectroscopic Analysis of Films

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The FTIR analysis of the films was determined by a Golden Gate single reflection diamond ATR system in a Perkin Elmer Spectrum BX spectrometer (Perkin Elmer, Inc., Hopkinton, MA, USA). FTIR spectra were taken at a resolution of 16 cm−1 and with double bi-directional scans, 32 co-added scans, and a wave number range between 4000 and 500 cm−1 (mid infrared region). The FTIR analyses were performed in five replicates of the film squares (4 cm2) that had been previously washed in n-hexane. To allow a comparison among the different film samples under study each spectrum was normalized.
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4

FTIR Analysis of Nanoparticle Powders

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FTIR studies were conducted using a Spectrum BX spectrometer (Perkin Elmer, Waltham, MS, USA). In order to acquire the spectra of analyzed nanoparticles, 1% nanopowder was mixed and ground with 99% KBr. Pellets of 10 mm diameter were prepared by pressing the powder mixture. The spectrum was taken in the range of 400 to 4000 cm−1 with a resolution of 4 cm−1.
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5

Optical Rotations and NMR Analysis of Compounds

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Optical rotations were measured in CH2Cl2 on a PerkinElmer 241 polarimeter by using a Na lamp. NMR spectra were recorded on a Bruker AVANCE 600 MHz instrument equipped with a 5 mm TCI inverse detection cryoprobe. NMR spectra were obtained dissolving samples in CD2Cl2 (99.9%) and chemical shifts are reported relative to solvent (δH 5.32 and δC 54.0 ppm). Standard Bruker NMR pulse sequences were utilized. HR-ESI-MS data were obtained on an LCT Premier XE Micromass spectrometer. IR spectra were recorded on a Perkin-Elmer Spectrum BX spectrometer. UV spectra was recorded in a Jasco V-560 UV/Vis spectrophotometer. EnSpire Multimode Reader (Perkin Elmer) using absorbance values of Alamar Blue reagent. TLC (Thin layer chromatography) (was visualized by UV light (254 and 365 nm).
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6

Polymer Characterization by Spectroscopic and Thermal Analysis

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Nuclear magnetic resonance, 13C NMR and 1H
NMR, spectra were recorded in deuterated
chloroform, unless noted otherwise, on a Bruker Avance 300 MHz spectrometer.
Fourier-transform infrared (FTIR) measurements were recorded with
a Perkin Elmer Spectrum BX spectrometer in ATR mode. Thermogravimetric
analyses (TGA) were conducted under a N2 atmosphere between
25 and 600 °C at a rate of 10 °C·min–1 on a Mettler-Toledo TGA/SDTA-851 thermobalance. Three cycles of
differential scanning calorimetry (DSC) were performed between −140
and +250 °C at a heating/cooling rate of 10 K min–1 on a 204F1/ASC Phoenix calorimeter. Gel permeation chromatography
(GPC) was performed on a PSS Security of Agilent Technologies 1260
Infinity with THF or DMF as the mobile phase. The GPC was calibrated
with a series of poly(methyl methacrylate) (PMMA). A Malvern Zetasizer
Nano-S90 dynamic light scattering (DLS) instrument was used to measure
the hydrodynamic diameter and size distribution of the nanoparticles
in dilute suspensions. The water contact angles were measured on films
of polymer spin-casted on glass with a DataPhysics OCA35 telescopic
goniometer.
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7

Synthesis and Characterization of Myrrh-Derived Silver Nanoparticles

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Solutions/suspensions were made using double-distilled water (DDW). Dried myrrh was obtained from a local store in the Kingdom of Saudi Arabia (KSA). Silver nitrate powder (SNP, AgNO3 > 99.9%) was from Sigma Aldrich (Hamburg, Germany). The average particle size of AgNO3 was <150 nm as specified by the manufacturer. Fourier-transform infrared spectroscopy (FT-IR) was done using Spectrum BX spectrometer (PerkinElmer, Waltham, MA, USA), UV–Vis spectrum was analyzed using UV 2450 Spectrophotometer (Shimadzu Corporation, Kyoto, Japan). Dispersive X-ray spectroscopy (EDX, Oxford Instruments, UK) was done using a JEM-2100F transmission electron microscope (JEM-2100F 200 kV, Joel Ltd, Japan).
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8

Characterization of Biogenic Nanoceria

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To confirm the formation of the nanoceria, absorption wavelengths ranging from 200 to 500 nm were used to determine the UV-Vis spectrum using a Shimadzu UV-2700 spectrophotometer (Kyoto, Japan). Using Fourier transform infrared spectroscopy (FTIR) analysis (Spectrum BX spectrometer, PerkinElmer Ltd., Yokohama, Japan), the functional groups in maize silk that contributed to the preparation of the nanoceria were detected and measured in the IR region of 4400–400 cm−1. The analysis of XRD was conducted to determine the crystalline phase of the biogenic synthesis of CeO2NPs using maize silk extract. Scanning Electron Microscopy (SEM, JSM-7610F, JEOL, Massachusetts, USA) along with Energy Dispersive X-ray spectroscopy (EDX) were engaged in the characterization of surface morphology of the biosynthesized particles. The size and stability of the particles were assessed using zeta potential (ZP) and a dynamic light scattering (DLS) analyzer (dynapro1Plate Reader III, Waytt, Japan). The biogenic CeO2NPs thermal stability was assessed using a thermogravimetric and differential scanning calorimetry (TGA/DSC) analyzer (Seiko Exstar 6300, Tokyo, Japan) within a range of temperature of 25–650 °C.
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9

Morphology and Characterization of Ce3+/Ce4+-Doped ZrO2/CuO Nanocomposites

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The morphology of the Ce3+/Ce4+-doped ZrO2/CuO nanocomposites was evaluated by using a field emission scanning electronic microscope (JEOL, JSM–7600F, JEOL Techniques, Tokyo, Japan). The surface morphology and microstructure of the nanocomposites were characterized by transmission electron microscopy (TEM) made with a (JEOL, JEM 1010, JEOL Techniques, Tokyo, Japan) operating at 200 kV. For the TEM analyses, the powders were dispersed in ethanol by sonication for 5 min.
FT-IR was performed in the range of 4000–400 cm−1 with the help of (FT-IR using a Perkin–Elmer Spectrum BX spectrometer (PerkinElmer Inc., Wellesley, MA, USA) using KBr pellets to identify the functional groups present in the sample. EDS (Hitachi TM4000Plus Tabletop Microscope(Hitachi High-Tech Corporation, Tokyo, Japan)) was the determining element in the composites. The UV-Vis absorption spectrum was recorded using a (UV–1700 PharmaSpec, Shimadzu, Kyoto, Japan) UV-Visible spectrophotometer. The X-ray powder diffraction patterns were characterized using (XRD, D8 Advance, Bruker, Germany) a diffractometer at room temperature (Cu-Kα radiation) with a nickel filter at a scan rate of 2°/min.
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10

Infrared Spectroscopy Analysis of Samples

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The infrared spectroscopy analysis was conducted using a Perkin Elmer Spectrum BX spectrometer (Perkin-Elmer España S.L., Madrid, Spain). The test was made with 20 scans between 600 and 4000 cm−1 with a resolution of 32 cm−1 mode using an attenuated total reflectance (ATR) accessory, indicated for samples with poor transparency.
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