Tecnai g2 f20 tem

Samples for this study were extracted from a previously produced nominally equiatomic CrCoNi MEA whose microstructure and mechanical properties were reported in a recent paper8 (link) where details of its processing and mechanical characterization can be found. Atomic structures were investigated using the aberration-corrected TEAM0.5 transmission electron microscope (operating at 200 kV), housed at the National Center for Electron Microscopy at the Lawrence Berkeley National Laboratory (LBNL), and the in situ compression tests were performed using a Hysitron PI95 nanoindenter in a JEOL 3010 microscope at 300 KV. The nanopillars for the in situ compression tests were produced using focused-ion beam techniques; details of sample preparation and in situ compression have been described in previous studies65 (link)66 (link). The in situ TEM tensile tests were conducted at room temperature using a Gatan model 654 single-tilt straining holder in an FEI Tecnai G2 F20 TEM operating at 200 kV. Roughly 12 samples, thinned by jet polishing and well attached to the substrate, were selected for in situ tensile straining and detailed TEM investigation as described in a previous paper22 (link). Time-resolved TEM and HRTEM images of the regions of interest were recorded with a Gatan CCD camera at 10 frames per second.

Powder X-ray diffraction patterns were collected using an AXS D8 Advance
diffractometer (Cu Kα radiation; receiving slit, 0.2 mm;
scintillation counter, 40 mA; 40 kV) from Bruker Inc. The
morphology and structure of samples were analysed by a Hitachi S-4800 field
emission SEM and an FEI Tecnai G2 F20 TEM at an accelerating voltage of
200 kV. Thermal gravimetric analysis was performed on a Pyris Diamond
thermogravimetric/differential thermal analyser (Perkin-Elmer) to analyse the
cabon content in carbon-coated TiP₂O₇ and
NaTi₂(PO₄)₃. X-ray photoelectron spectra
(XPS) were collected by a Shimadzu/Kratos AXIS Ultra XPS spectrometer. All
binding energies were referenced to the F 1s peak (from polyvinylidene
fluoride) of 688.2 eV.

Scanning electron microscopy (SEM) was performed with Hitachi S-4800 at 5.0 kV for examining the morphologies and thicknesses of different sensors. The tapping mode AFM (Veeco Digital Instruments by Bruker Dimension D3100) was used to acquire images of GNP-CNT hybrid nanomaterials deposited on silicon wafer for thickness measurement. Structural and morphological characterization of the material was performed on a FEI Tecnai G2 F20 TEM operated at 200 kV of accelerating voltage. The two ends of the sensor were mounted on a customized micrometer moving stage, and the sensing film can be bent and stretched by moving the stage closer. Electrical properties of the sensor were collected by a source measurement unit (SMU) instrument (Keithley 2400).