The crystallographic structure and orientation of the films were examined by X-ray diffraction (XRD) (CuKα) in the classical Bragg–Brentano and in the grazing-incidence configuration using BRUKER AXS D8 DISCOVER diffractometer with a rotating Cu anode.
The grazing-incidence wide-angle X-ray scattering (GIWAXS) measurements were performed using Nanostar system (Bruker AXS, Germany) equipped with IμS microfocus Cu X-ray source (λ = 0.154 nm). The parallel X-ray beam after Montel optics was further collimated using evacuated pinhole collimator equipped with two 550 µm pinholes separated by 1 m. The grazing-angle of incidence of X-ray beam on the sample was set to 0.8°. Reciprocal space maps were measured using an image plate detector at a sample-to-detector distance of 80 mm. All GIWAXS measurements were performed in fully evacuated chamber.