The KPFM measurements were performed at room temperature using a commercial atomic force microscope (Park Systems, NX10) placed in an Ar flow glove box (O2: <1 ppm, H2O: <1 ppm). We used Cr/Pt-coated Si cantilevers (Budget Sensors, Multi75E-G) with a nominal resonance frequency of 75 kHz and a spring constant of 3 N/m. The CPD was detected using the sideband KPFM mode [18 (link)–19 (link)4 (link)]. The amplitude and frequency of the modulation voltage were 1.5 V and 3.2 kHz, respectively. The modulation voltage and DC voltage were applied to the tip to minimize the electrostatic force between the tip and sample, as shown in Figure 1 c. An electrometer (Keithley 617) was used to measure the Au electrode potential relative to the Li reference electrode. A DC voltage was applied between the Au electrodes and the resulting current was measured using an electrometer (ADCMT 8252).
Multi75e g
Manufactured by Budget Sensors
Sourced in Bulgaria
The Multi75E-G is a multi-parameter water quality meter that measures pH, conductivity, dissolved oxygen, and temperature. It is equipped with a durable, waterproof housing and can be used for a variety of applications in the field or laboratory.
Automatically generated - may contain errors
Lab products found in correlation
Sigma probe, by Thermo Fisher Scientific (2 mentions)
Tof sims 5, by ION-TOF (1 mentions)
Excalibur 3100, by Agilent Technologies (1 mentions)
Invia reflex, by Renishaw (1 mentions)
Pxie 1062q, by National Instruments (1 mentions)
Ta dsc q2000, by TA Instruments (1 mentions)
D8 advance x ray powder diffractometer, by Bruker (1 mentions)
Xe 100, by Park Systems (1 mentions)
Cpl 200 spectrophotometer, by Jasco (1 mentions)
J 810 spectropolarimeter, by Jasco (1 mentions)
Nanoscope 5 controller, by Bruker (1 mentions)
Jspm 5200, by JEOL (1 mentions)
Mfp 3d atomic force microscope, by Oxford Instruments (1 mentions)
Bx51m, by Olympus (1 mentions)
Jem arm200f, by JEOL (1 mentions)
Ppp nchpt, by Nanosensors (1 mentions)
Sr830, by Stanford Research Systems (1 mentions)
Flexafm v5, by Nanosurf (1 mentions)
15 protocols using multi75e g
1
KPFM Measurements of Electrochemical Devices
2
Multi-Spectroscopic Analysis of Material Composition
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
The Raman spectra were acquired on an inVia-Reflex (Renishaw) at an excitation wavelength of 532 nm and ATR-FTIR (attenuated total-reflection Fourier transform infrared) spectra were obtained on an Excalibur 3100 (Varian). The elemental chemical composition and chemical structure were determined by X-ray photoelectron spectroscopy (XPS, PHI QUANTERA-II equipped with a monochromatic Al Kα source). The analyzer was operated at a pass energy (Ep) of 280 eV for wide scans and 26 eV for fine scans leading to an instrumental resolution of 1.00 eV for wide scans and 0.025 eV for fine scans. The data were collected at a take-off angle of 45° and data analysis and multi-peak fitting were performed by the Multipak software. Time-of-flight secondary ion mass spectrometry (TOF-SIMS) was performed on the TOF-SIMS V (ION TOF GmbH) with 30 keV Bin+ as the primary ion source. The negative spectra were obtained from 500 × 500 μm2 areas by focusing the Bi+ primary ions (less than 0.01 pA of pulsed current) in the “burst alignment” mode at a 10 kHz pulsing rate and 120–130 ns pulse width. The surface potential was measured by a Kelvin probe force microscopy with amplitude modulation (KPFM-AM, Multimode 8, Buker) in the tapping mode on a Multi75E-G (budget sensors) probe in air at room temperature.
3
AFM and ESM Characterization of Materials
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
AFM studies were performed with a commercial system (Asylum Research Cypher and Bruker Multimode) controlled externally by a computer via custom-written LabVIEW and MATLAB codes. ESM imaging and FORC ESM were carried out using a BE centered around the resonance frequency of the cantilever in contact with the sample, about 300 ~ 380 kHz in this case. The BE waveform with 3 V amplitude was applied to a Pt/Cr coated probe (BudgetSensors Multi75E-G). Current was measured off of the bottom Pt electrode with the help of a current amplifier (FEMTO, DLPCA-200). Excitation generation and data acquisition was performed by National Instruments cards.
4
Atomic Force Microscopy Measurements Protocols
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
AFM measurements were performed using a commercially available AFM (NX10, Park Systems). A conductive diamond‐coated AFM tip (CDT‐FMR, NanoSensors, thermal tune‐calibrated spring constant k of ≈7.2 N m−1) and Pt‐coated AFM tip (Multi75E‐G (BudgetSensors, with a thermal tune‐calibrated spring constant k of ≈4.2 N m−1) were used in the experiments. The surface potential was obtained using amplitude‐modulated KPFM mode by applying a 2 V AC voltage at 17 kHz and a DC feedback voltage to the AFM tip, a scan rate of 0.5 Hz was used. The effective work function of the tip was calibrated using highly ordered pyrolytic graphite (HOPG, Park Systems). The I–V curves were measured using a function generator (PXIe‐1062Q, National Instruments) controlled through LabVIEW/MATLAB‐based software. All experiments were conducted in air with a relative humidity of ≈27% and a temperature of ≈30 °C. A silicon grating with trapezoidal steps (TGF11) for a flat‐wedge friction force calibration was purchased from MikroMasch.
5
Comprehensive Characterization of Novel Material
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
All chemicals were commercially available and used without further purification. Powder X-ray diffraction (PXRD) patterns were recorded using a Bruker D8 ADVANCE X-ray powder diffractometer (Cu Kα, λ = 1.54184 Å). Thermogravimetric analysis was performed using a STA 449 F3 Jupiter system with a heating rate of 10 K min−1 under a nitrogen atmosphere. DSC measurements were performed by heating/cooling the powder sample at a rate of 10 K min−1 on a TA DSC Q2000 instrument.
Dielectric permittivity was measured using an Agilent Impedance Analyser in a Mercury iTC cryogenic environment controller of an Oxford Instrument for a powder pellet sample at a rate of 3 K min−1. The SHG effect was measured using a XPL1064-200 instrument at a heating/cooling rate of 3 K min−1. The observation of ferroelastic domains was performed on an OLYMPUS BX41 polarizing microscope. The ferroelectric hysteresis loop was measured on a Radiant Precision Premier II. PFM measurements were performed by using a PFM mode on an Asylum MFP-3D Infinity atomic force microscope. Conductive Cr/Pt-coated silicon probes (Multi75E-G, Budget Sensors) were used in the PFM tests.
Dielectric permittivity was measured using an Agilent Impedance Analyser in a Mercury iTC cryogenic environment controller of an Oxford Instrument for a powder pellet sample at a rate of 3 K min−1. The SHG effect was measured using a XPL1064-200 instrument at a heating/cooling rate of 3 K min−1. The observation of ferroelastic domains was performed on an OLYMPUS BX41 polarizing microscope. The ferroelectric hysteresis loop was measured on a Radiant Precision Premier II. PFM measurements were performed by using a PFM mode on an Asylum MFP-3D Infinity atomic force microscope. Conductive Cr/Pt-coated silicon probes (Multi75E-G, Budget Sensors) were used in the PFM tests.
6
Probing Ferroelectric Material Properties with PFM
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
In PFM, application of the periodic electric bias to the conductive scanning probe microscopy tip in contact with the surface results in the surface deformation, due to converse piezoelectric effect. This deformation is detected as the periodic deflection of the tip via microscope electronics. This approach has been broadly used for imaging ferroelectric domains in a broad range of ferroelectric and piezoelectric crystals, ceramics, and thin films66 (link)–70 (link). The PFM measurements were performed at room temperature with 6 Vpp ac bias applied to a Pt/Cr-coated probe (Budget sensors Multi75E-G). For PFM imaging the drive frequency of the ac bias was centred at the contact resonance (∼ 350 kHz) and dual amplitude resonance tracking was then used to track the contact resonance as the tip was scanned across the sample surface43 . For the polarization switching experiments a band of frequencies (~ 80 KHz) centered around the contact resonance frequency were excited, as an additional DC bias was swept from −90 to + 90 V. Extraction of the tip parameters were determined from fitting of the response to a simple harmonic oscillator model as described elsewhere44 (link), 45 (link).
7
Characterizing Imidazole Adsorption on Steel
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
To identify surface morphology after immersion for 40 h in test solutions, optical microscopy (OM) was conducted for each specimen using LEICA 300 (Leica Microsystems, Langen, Germany). To investigate the bonding type of adsorbed imidazole molecule on the surface of specimens, X-ray photoelectron spectroscopy (XPS) was conducted. XPS was conducted using a SIGMA PROBE (ThermoFisher Scientific, Waltham, MA, USA) in a UHB chamber, equipped with a monochromated Al Kα X-ray source. Specimens were immersed in district heating water conditions containing 500 ppm and 1000 ppm imidazole for 8 h.
Atomic force microscopy and Kelvin probe force microscopy (KPFM), a mode of AFM, were conducted to identify adsorbed imidazole on a steel surface with topography and surface potential mapping. AFM measurements were conducted with a commercial AFM system (NX-10, Park systems, Suwon, Korea). KPFM measurements were conducted with an AC modulation voltage of 2, the root-mean-square voltage at 17 kHz in the lift mode, and a distance between the tip and sample of 20 nm using a conductive Pt/Cr coated tip (Multi75E-G, BudgetSensors, Sofia, Bulgaria). All measurements were conducted at a 10 μm × 10 μm scale.
Atomic force microscopy and Kelvin probe force microscopy (KPFM), a mode of AFM, were conducted to identify adsorbed imidazole on a steel surface with topography and surface potential mapping. AFM measurements were conducted with a commercial AFM system (NX-10, Park systems, Suwon, Korea). KPFM measurements were conducted with an AC modulation voltage of 2, the root-mean-square voltage at 17 kHz in the lift mode, and a distance between the tip and sample of 20 nm using a conductive Pt/Cr coated tip (Multi75E-G, BudgetSensors, Sofia, Bulgaria). All measurements were conducted at a 10 μm × 10 μm scale.
8
Tribocharged Graphene Characterization
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
The rubbing process between a Pt-coated tip (Multi75E-G, Budget Sensors) and graphene was carried out by the contact mode of an AFM system (XE100, Park Systems) under a contact force of 15 nN and at a scan rate of 1 Hz, to generate triboelectric charges. In the experiments of Figs 3 and 4 , we applied a tip bias from −10 to 10 V on each sample with the conditions otherwise the same. The Kelvin probe force microscopy (KPFM) maps have been obtained with the tip biased by an AC voltage having amplitude and frequency equal to 2 V and 17 kHz, respectively. In addition, all AFM-based measurements progressed under the same conditions (temperature=21 °C, relative humidity=25∼30%).
9
Comprehensive Structural Characterization of Material
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
The TCD spectra were conducted on a JASCO J-810 spectropolarimeter at room temperature. CPL spectra were measured by JASCO CPL-200 spectrophotometers with an external excitation source of 325 nm laser. MCD spectra were acquired using a JASCO J-1500 spectrodichrometer and all the MCD spectra were probed under the magnetic field of ±1.6 T that was parallel or antiparallel with the light propagation direction and measured at the rate of 500 nm/min with a bandwidth of 10 nm. Multimode AFM with Nanoscope V controller (Bruker-Dimension icon) was used to record current–voltage (I–V) curves under a voltage bias of −6 to +6 V at the tip in a contact mode. I–V curves were acquired using a magnetic Pt-coated Cr tip (Multi75E-G, Budget Sensors) with a nominal spring constant of 3 N/m, and the I–V response was averaged over 50 scans for each sample. The tips are pre-magnetized in the up and down directions with a permanent magnet. Femtosecond TAS measurements were recorded by the Helios pump–probe system (Ultrafast Systems LLC). The optical parametric amplifier (TOPAS-800-fs) was adopted to provide the pump pulse of 340 nm (0.02 μj pulse−1, 50 μJ cm−2) at a typical focusing radius of ca. 150 μm. The irradiation area was 0.0004 cm2. Other general structure characterizations are provided in the Supplementary Methods .
10
AFM-based Electrical Characterization of YSZ Bicrystals
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
AFM studies were performed with a commercial system (JEOL JSPM-5200) controlled externally by a computer via custom-written LabVIEW and MATLAB codes42 (link). ESM imaging and BEPS ESM were carried out using a BE centered around the resonance frequency of the cantilever in contact with the sample, about 300~380 kHz in this case. The bipolar triangular waveform consist of 72 pulses with the maximum voltage of 15 V was applied to a Pt/Cr coated probe (BudgetSensors Multi75E-G). Backside of YSZ bicrystals are connected to the ground. Here, foreside is defined to be the probe contacting face of YSZ bicrystals. The measurements were performed with 3 V amplitude BE waveform between each pulse. Excitation generation and data acquisition was performed by National Instruments boards.
About PubCompare
Our mission is to provide scientists with the largest repository of trustworthy protocols and intelligent analytical tools, thereby offering them extensive information to design robust protocols aimed at minimizing the risk of failures.
We believe that the most crucial aspect is to grant scientists access to a wide range of reliable sources and new useful tools that surpass human capabilities.
However, we trust in allowing scientists to determine how to construct their own protocols based on this information, as they are the experts in their field.
Ready to get started?
Sign up for free.
Registration takes 20 seconds.
Available from any computer
No download required
Revolutionizing how scientists
search and build protocols!