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D max 2500pc diffractometer

Manufactured by Rigaku
Sourced in Japan

The D/MAX 2500PC is a versatile X-ray diffractometer designed for a wide range of applications. It features a powerful rotating anode X-ray source, a high-resolution goniometer, and advanced data analysis software. The diffractometer is capable of performing qualitative and quantitative phase analysis, thin-film characterization, and various other X-ray diffraction techniques.

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15 protocols using d max 2500pc diffractometer

1

Comprehensive Material Characterization Techniques

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Powder X-ray diffraction (XRD) data of the as-obtained samples were recorded on a Rigaku D/max 2500PC diffractometer employing within 2θ in the range of 10–80° and Cu Kα radiation (λ = 1.54156 Å) at a scan rate of 4° min−1. X-ray photoelectron spectroscopy (XPS) spectra were obtained on an ESCALAB Mk II (Vacuum Generators) spectrometer with unmonochromatized Al Kα X-rays (240 W). Cycles of XPS measurements were conducted in a high-vacuum chamber with a base pressure of 1.33 × 10−6 Pa. Morphologies and structure observation of the as-prepared samples were determined using JSM-6700F field emission scanning electron microscopy (FESEM), JEM-2100F transmission electron microscopy (TEM), high-resolution TEM (HRTEM) and selected area electron diffraction (SAED), ultraviolet-visible (UV-vis) spectrophotometer. The electrochemical measurements were carried out in a PMC-1000 electrochemical workstation.
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2

Microstructural Characterization of Materials

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Scanning electron microscopy (SEM; S4800, Hitachi, Tokyo, Japan) was used to study the microstructural configuration of samples. The X-ray diffraction (XRD) measurements were performed using a D/MAX-2500/PC diffractometer (Rigaku, Tokyo, Japan) with Cu-Kα radiation (λ = 0.15418 nm) at 40 kV and 100 mA. The X-ray photoelectron spectroscopy (XPS) spectra were recorded using a VG ESCALAB 200i instrument (Thermo Fisher Scientific) with pass energies of 100 and 20 eV for survey and high-resolution scans, respectively. The specific surface area was estimated by N adsorption–desorption measurements (TriStar II 3020; MicroMetrics, Norcross, GA, USA) following Brunauer–Emmett–Teller (BET) theory.
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3

Comprehensive Materials Characterization Protocol

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SEM and TEM images of the samples were taken using a Sigma 300 FE-SEM (Zeiss, Germany) and a JEM-2100F TEM (Jeol, Japan) microscopes respectively. FTIR spectra for the samples ranged from 500 to 4000 cm−1 using NICOLET 380 spectrophotometer (Thermo Nicolet Corp., American) with 32 successive scans at a resolution of 4 cm−1. XRD patterns were conducted using a D/MAX 2500 PC diffractometer (Rigaku, Japan) equipped with Cu Kα radiation, the generator power settings being 40 kV and 50 mA from 5° to 40° (2θ) at a scan rate of 0.01°/min. The surface area and porosity of the samples were determined from N2 adsorption-desorption experiments using a surface area and pore size analyzer (Nova 2200e, Quantachrome, USA). Thermal properties of the samples were measured by a thermogravimetric analyzer (TGA/DSC1/1600, Mettler-Toledo, Switzerland), with a temperature range of 30–800 oC, at a heating rate of 20 oC/min under the airflow. XPS spectra were recorded on a Thermo Scientific K-alpha X-ray photo-electron spectrometer equipped with an Al Kα X-ray source (1486.6 eV).
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4

Characterization of Strontium Hydroxyapatite Nanoparticles

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The morphology and structure of SrHA were characterized by transmission electron microscopy (TEM, JEM-2100 ​F, Jeol Ltd., Japan) at 200 ​kV. The average length of nanoparticles was calculated using ImageJ 1.34 software (National Institutes of Health, USA) from the TEM images. The scaffolds were sputtered with gold at 10 ​mA current for 30 ​s and the morphology was observed by scanning electron microscope (SEM, Phenom ProX, Phenom-World, Netherlands) at 10 ​kV. The average pore diameter was obtained from SEM images with ImageJ 1.34 software, where at least 50 measurements were randomly selected. The elements distribution was qualitatively analyzed with a Quantax 400 energy dispersive X-ray spectroscope (EDS, Bruker, Germany). Attenuated total reflectance–Fourier transform infrared (ATR–FTIR) spectra were performed with a PerkinElmer Spectrum Two spectrometer (Waltham, MA, USA) at a resolution of 4 ​cm−1 in the range of 400–4000 ​cm−1. X-ray diffraction (XRD) patterns were recorded on a D/max-2500 ​P ​C diffractometer (Rigaku Co., Japan) using Cu/Ka radiation at 2θ range of 5–70°. Three specimens were tested for each sample.
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5

Nanocomposite Characterization Techniques

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X-ray diffraction (Rigaku D/MAX 2500/PC diffractometer) was performed with Cu Kα radiation. The lattice constant a0 and the preferred orientation factors F of (111) faces of samples were calculated by the extended Bragg equation and Lotgering method (eqn (S1) and (S2)).55,56 The specific calculation methods were displayed in ESI. The microstructure morphologies of nanocomposite ribbons and powders were investigated by a scanning electron microscope (SEM, Zeiss SUPRA 55) and a transmission electron microscope (TEM, JEOL JEM-2100) with selected-area electron diffraction (SAED) patterns. Some TEM specimens were also observed using high-resolution TEM (HRTEM). A Horiba Jobin-YNON co-focal laser Raman system was used to obtain the Raman spectra, equipping a He–Ne laser with an excitation wavelength of 532 nm. Thermogravimetric analysis (TGA) was performed on a Mettler-Toledo TGA/SDTA851e Thermo Analyzer from room temperature to 800 °C at a rate of 5 °C min−1.
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6

Measuring Corncob Crystallinity via XRD

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The crystallinity of corncob was measured with X-ray diffractometer (XRD), using a D/max 2500 PC diffractometer with Cu/Ka radiation source (Rigaku Corporation, Tokyo, Japan). It was operated at a voltage of 60 kV and a current of 300 Ma with a scanning speed of 0.02°/min and the 2θ range from 5° to 40°. Crystallinity index (CrI) was calculated as following. CrI(%)=I002-IamI002×100%. I002 and Iam imply the intensities of the peaks at near 21.4° and 16.0°, respectively.
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7

Comprehensive Characterization of Pretreatment Substrates

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The chemical structure and morphological features of samples was characterized by FT-IR spectrometer (Nicolet, United States) and SEM (Sigma 300, ZEISS, Germany). The hydrophobicity and enzyme accessibility of different pretreatment substrates was estimated by Rose Bengal dye and DR 28 absorption experiment using an ultraviolet-visible spectrophotometer (Tang et al., 2021 (link)). The degree of polymerization of different samples was measured by copper ethylenediamine method (Lin et al., 2020 (link)). XRD analysis was recorded by a D/MAX 2500PC diffractometer (Rigaku Corporation, Japan). Crystallinity index (CrI) was obtained by the ratio of the crystalline peak area to the crystalline peak and the amorphous peak area (Alam et al., 2020 (link)). Specific surface area was performed on Brunauer Emmett Teller (BET) assay with nitrogen gas adsorption (Micromeritics Instru-ment Corp., Norcross, United States). X-ray spectroscopy spectra were obtained with an Escalab 250Xi spectrometer (Thermo Fisher Scientific Inc., US), with nonmonochromatic Al K alph (15 kV, 300 W, 1486.8 eV). The surface coverage of lignin and carbohydrates on the surface of the samples before and after pretreatment was calculated as follows (Wan et al., 2023 (link)): Slignin%=O/CpretreatedO/CcarbohydrateO/CligninO/Ccarbohydrate×100
Scarbohydrate=1Slignin
O/Ccarbohydrate=0.83O/Clignin=0.3
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8

Comprehensive Characterization of Substrates

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The chemical compositions (%, w/w) of the substrates were measured by the NREL standard analytical method [13 ]. Analyses of the carbohydrates of the substrates were assessed by HPLC under the same conditions as enzymatic hydrolysates. CP/MAS 13C-NMR spectra of the substrates were conducted using a Bruker AV-III 400 M spectrometer (Germany) [19 (link)]. XRD analysis of the substrates was recorded by a D/MAX 2500PC diffractometer (Rigaku Corporation, Japan). The crystallinity indexes (CrIs) of the substrates were determined from the ratio of the crystalline peak area to the total area of crystalline and amorphous peaks. SEM images of the substrates were performed with a Phenom XL (Phenom-World, Netherlands) instrument at 10 kV. BET surface areas of the substrates were measure by analyzing of the nitrogen adsorption using an SSA-7000 surface area analyzer (Beijing Bi’aode Electronic Technology Co., Ltd., Beijing, China) after 8 h of degassing at 120 °C and 1 h of degassing at 150 °C. The measurements (chemical compositions and BET surface areas) were conducted in triplicate, and the relative standard deviation was below 5.0%. The data represented are the averages obtained from experiments.
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9

Characterization of Bilirubin and Ligands

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The ligands H5DDB and BPP were acquired from Jinan Henhua Sci. & Tec. Co. Ltd. Bilirubin was purchased from Energy Chemical. Human serum samples were purchased from AmyJet Scientific Inc. The serum samples were obtained by diluting the purchased sample 20 times with phosphate buffer solutions (PBS, pH = 7.4). The powder X-ray diffraction (PXRD) was measured on a Rigaku D/Max-2500 PC diffractometer. A FTIR-8400S spectrometer was used to recorded the IR spectra. The elemental analyses was confirmed on a Vario MACRO cube elemental analyzer. Thermogravimetric analysis (TGA) was performed on a ZCT-A analyzer at 30–750 °C under N2 environment. UV-vis absorption spectra was obtained from Shimadzu UV-2600 spectrophotometer. The luminescence spectra were recorded on a Hitachi F-4600 fluorescence spectrophotometer. X-ray photoelectron spectroscopy (XPS) measurements were conducted with a Thermo ESCALAB 250Xi.
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10

Characterization of Biomass Residues

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The chemical compositions (%, w/w) of the resulting residues collected via different MTHF/H2O system processes were also assessed by the NREL method [28 ]. SEM images of RM and resulting residues were recorded by a JSM 6700F NT (Tokyo, Japan). FT-IR of RM and resulting residues were carried out using a FT-IR microscope (Thermo Nicolet Corporation, Madison, WI, USA) equipped. XRD of RM and resulting residues were performed via a D/MAX 2500PC diffractometer (Rigaku Corporation, Tokyo, Japan). The crystallinity indexes (CrIs) of the RM and resulting residues were measured from the ratio of the crystalline area to the total area of crystalline and amorphous peaks [19 (link)].
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