MB was measured in a Varian V-3900 2T electromagnet using a standard polarization modulation technique38 . A HeNe laser was used (1.5 mW, 632.8 nm) to probe the dispersion contained inside a 5 mm thick optical cell (Hellma) within a temperature-controlled environment. (Cryo-)SEM was performed on a JEOL 6,330 Cryo Field Emission Scanning Electron Microscope at an acceleration voltage of 3 kV in cryo-mode and 10 kV in dry mode. TEM was performed on a JEOL 1,010 Transmission Electron Microscope at an acceleration voltage of 60 kV. For Cryo-TEM a JEOL 2,100 cryo-Transmission Electron Microscope was used. The hydrodynamic radius was determined by Dynamic Light Scattering, performed with a Malvern Zetasizer Nano S instrument.
6 330 cryo field emission scanning electron microscope
Manufactured by JEOL
The JEOL 6,330 Cryo Field Emission Scanning Electron Microscope is a high-resolution electron microscope designed for the examination of a wide range of samples, including biological and inorganic materials. It utilizes a field emission electron source to generate a focused electron beam, which is then scanned across the sample surface to generate detailed images. The instrument is equipped with cryogenic capabilities, allowing for the analysis of temperature-sensitive samples.
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Lab products found in correlation
2 protocols using 6 330 cryo field emission scanning electron microscope
1
Magnetic and Optical Characterization of Nanomaterials
2
Scanning Electron Microscopy Sample Preparation
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Samples
were attached to an aluminum holder by conducting carbon tape. Afterward,
these samples were sputter coated using a gold/palladium coater (Cressington
208 HR) for 30 s (80 mA). At different magnifications, images were
acquired at an accelerated voltage of 3 kV using a JEOL 6330 Cryo
Field Emission Scanning Electron Microscope (SEM).
were attached to an aluminum holder by conducting carbon tape. Afterward,
these samples were sputter coated using a gold/palladium coater (Cressington
208 HR) for 30 s (80 mA). At different magnifications, images were
acquired at an accelerated voltage of 3 kV using a JEOL 6330 Cryo
Field Emission Scanning Electron Microscope (SEM).
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