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N sim super resolution microscopy system

Manufactured by Nikon

The N-SIM super-resolution microscopy system is a laboratory equipment designed to achieve higher resolution imaging beyond the diffraction limit of conventional optical microscopes. It utilizes structured illumination microscopy (SIM) technology to provide enhanced spatial resolution while maintaining a high signal-to-noise ratio.

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2 protocols using n sim super resolution microscopy system

1

Super-resolution Imaging of Coke in ZEOL

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SIM was applied to gain super-resolution images on the spatiotemporal distribution of the coke species located in ZEOL series samples. The super-resolution imaging was carried out using a Nikon N-SIM super-resolution microscopy system with a motorized inverted microscopy ECLIPSE Ti2-E, a 100×/NA 1.49 oil immersion TIRF objective lens (CFI HP) and ORCA-Flash 4.0 sCMOS camera (Hamamatsu Photonics K.K.)61 (link),62 (link). Imaging with 405, 488, 561, and 640 nm multilaser light sources, the emissions by excitation were collected with four photomultiplier tubes in the range 435–485, 500–545, 570–640, 663–738 nm for the four lasers, respectively. Imaging was performed under ex-situ condition at room temperature. ZEOL series samples were loaded on glass-bottomed culture dishes (35 mm dish with 20 mm well) and images were taken at a Z-plane of middle of zeolitic crystal. The software NIS-Elements Ar and N-SIM Analysis were used to analyze the collected images and computationally reconstruct the super-resolution image.
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2

Super-Resolution Imaging of Coke Species

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SIM was applied to gain super-resolution images on the spatiotemporal distribution of the coke species located in the spent SAPO-34 samples after MTO conversion with different TOS. The super-resolution imaging was carried out using a Nikon N-SIM super-resolution microscopy system with a motorized inverted microscopy ECLIPSE Ti2-E, a ×100/numerical aperture 1.49 oil-immersion total internal reflection fluorescence objective lens (CFI HP) and ORCA-Flash 4.0 sCMOS camera (Hamamatsu Photonics K.K.)66 (link),67 (link). Imaging with 405, 488, 561, and 640 nm multilaser light sources, the emissions by excitation were collected with four photomultiplier tubes in the range 435–485, 500–545, 570–640, and 663–738 nm for the four lasers, respectively. Imaging was performed under ex situ condition at room temperature. The spent SAPO-34 samples were loaded on glass-bottomed culture dishes (35 mm dish with 20 mm well) and images were taken at a Z-plane of middle of zeolitic crystal. The software NIS-Elements Ar and N-SIM Analysis were used to analyze the collected images and computationally reconstruct the super-resolution image.
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