Jem 2100f field emission gun

The morphology of the synthesized NWs is studied using a scanning electron microscopy (SEM) (Zeiss SUPRA 25) (D-73446, Oberkochen, Germany). The values of the accelerating voltage and beam current were 20 kV and 300 pA, respectively. A crystal structure was studied with transmission electron microscopy (TEM) using a JEOL JEM–2100F field emission gun TEM (Tokyo, Japan) operating at 200 kV (with a point-to-point resolution of 0.19 nm in TEM mode). For TEM studies, NWs are “dry-transferred” to a carbon-coated TEM grid by sliding the grown sample on a TEM grid face to face.

Morphological analysis was performed using a scanning electron microscope (JEOL Ltd., Tokyo, Japan). The pure drug, MSN-FP, and MSN-FP within nasal spray were examined through SEM using adhesive tape coated with gold using a sputter coater. At 200 kV TEM images were taken with a JEOL JEM 2100F field Emission Gun. Almost for 15 min, the MSN-FP sample was washed in (Elma S 30 H) ultrasonic bath with ethanol before the assay.

The as-prepared samples
were characterized by means of X-ray diffraction (XRD), atomic force
microscopy (AFM), and transmission electron microscopy (TEM). Out-of-plane
θ-2θ diffractograms were acquired for 2θ angles
of 10°–90° on an Empyrean X-ray diffractometer (Malvern
Panalytical, UK) using a hybrid Kα monochromator of type 2XGe(220)
on the incident beam side and a GaliPIX3D area detector in scanning
line mode on the diffracted beam side. AFM images of the sample surface
were recorded on a Nanoscope V multimode setup (Bruker) and analyzed
using Gwyddion.^{16 (link)} An electron-transparent
lamella for TEM imaging was prepared via standard lift-out techniques
on a Thermo Fisher Scios 2 DualBeam FIB/SEM, operating with a Ga-ion
beam at 30 kV accelerating voltage. After thinning at 30 kV, a final
low-voltage cleaning step was performed at 5 and 2 kV to reduce the
extent of superficial amorphization on the lamella. All TEM measurements
were carried out on a JEOL JEM-2100F field-emission gun microscope
equipped with an image-side spherical aberration corrector, operating
at an accelerating voltage of 200 kV. TEM images were recorded using
a Gatan Orisu SC1000 CCD camera. High-resolution TEM images were post-processed
using an average background subtraction filter (ABSF).