Axis ultra dld photoelectron spectrometer

The crystallinity and phase formation of the PES and PES-Ag₃PO₄/g-C₃N₄ film photocatalysts were analyzed using an X-ray diffractometer (PHILIPS PW 3040/60, Almelo, Netherlands) with CuKα radiation (λ = 0.154 nm, 30 kV, 30 mA) in the scan range of 2θ = 10° to 80° with a 2°/min of scanning speed. The surface film’s morphology was observed using a scanning electron microscope equipped with an electron dispersive X-ray analyzer (Fei Nova Nanosem 230, Eindhoven, Holland). Meanwhile, the cross-section film morphology was visualized by a scanning electron microscope equipped with an electron dispersive X-ray analyzer (SEM-EDX, HITACHI TM3000, Tokyo, Japan. A 3D measuring laser microscope (OLS5000 OLYMPUS, Hamburg, Germany) was used to capture the film’s surface roughness. The X-ray photoelectron spectra (XPS) of the prepared samples were recorded using a Kratos Analytical Axis Ultra DLD photoelectron spectrometer (Manchester, UK) using an Al Kα radiation monochromatic source. The water contact angle of the film was analyzed by a water surface analysis system (VCA 3000S, Billerica, MA, USA).