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Titan tem

Manufactured by Thermo Fisher Scientific
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The Titan TEM is a transmission electron microscope (TEM) designed and manufactured by Thermo Fisher Scientific. It is a high-performance, advanced imaging and analytical tool used for the study of materials at the nanoscale level. The Titan TEM provides high-resolution imaging capabilities and can be used for a variety of applications, including materials science, nanotechnology, and life science research.

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26 protocols using titan tem

1

Nanostructure Characterization by TEM and Raman

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The microstructures and morphologies of the nanostructures are characterized by a FEI Titan TEM. Raman spectrums were taken by a Horiba HR800 system with laser excitation wavelength of 532 nm.
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2

Nanostructure Characterization by SEM and TEM

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The microstructures and morphologies of the nanostructures are characterized by a JEOL 6700 SEM. The cross-section image of the self-aligned device is obtained by an FEI Titan TEM.
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3

Electron Energy-Loss Spectroscopy in STEM

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EELS was performed in scanning TEM (STEM) mode using an FEI Titan TEM with Schottky electron source. The microscope was operated at 80 kV, and a STEM convergence semi-angle of 13 mrad was used to form a probe with a diameter of approximately 1 nm. A Wien-type monochromator dispersed the electron beam in energy, and an energy-selecting slit formed a monochrome electron beam with typical full-width at half-maximum values of 70 meV. A Gatan Tridiem ER EELS detector was used for EELS mapping and spectroscopy, applying a 12 mrad collection semi-angle. EELS data was acquired with a modified binned gain averaging routine:31 (link) individual spectra were acquired in 40 ms, using 8 or 16 times on-chip binning. The detector channel-to-channel gain variation was averaged out by constantly changing the readout location and correcting for these shifts after the EELS acquisition was finished. A high-quality dark reference was acquired separately, and used for post-acquisition dark signal correction. Spectra were normalized by giving the maximum of the zero-loss peak (ZLP) unit value, and the ZLP background signal was removed by fitting and subtracting a high-quality background spectrum.
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4

Characterization of Nanoparticle Morphology

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The size and morphology of the nanostructures made using different synthesis conditions were assessed by using a JEOL JEM-2100F and a FEI Titan TEM, at the acceleration voltage of 200 kV and 300 kV respectively. Negative staining of the nanoparticles was performed using 2% (w/v) solution of uranyl acetate to reveal the presence of a transferrin corona on the surface of the nanoparticle drop-cast on 300 mesh copper grids (Agar Scientific), coated with holey carbon film. The nanoparticles' hydrodynamic diameter was measured in suspension by Dynamic Light Scattering (DLS, Malvern Zetasizer Nano) at 25 °C.
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5

Ultrastructural Imaging of Synaptic Vesicles

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Mice were transcardially perfused with Ringer’s solution followed by perfusion with 150 mM cacodylate, 2.5% glutaraldehyde, 2% paraformaldehyde, and 2 mM CaCl2. The brains were fixed overnight in the same buffer at 4 °C and cut into 100 μm coronal sections on vibratome. The slices were fixed overnight at 4 °C and then washed for 1 h in 150 mM cacodylate/2 mM CaCl2 on ice. Sections (300 nm thick) were cut from the serial block-face scanning electron microscopy (SBEM)-stained specimens and collected on 50 nm Luxel slot grids (Luxel Corp., Friday Harbor, WA). The grids were coated with 10 nm colloidal gold (Ted Pella, Redding, CA) and imaged at 300 keV on a Titan TEM (FEI, Hillsboro, OR). Double-tilt tilt-series were collected with 0.5° tilt increments at ×22,500 magnification on a 4k × 4k Gatan Ultrascan camera. Tomograms were generated with an iterative scheme in the TxBR package70 (link). Segmentation of synaptic structures and vesicle pools were performed in IMOD70 (link),71 (link).
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6

Characterization of FeF3 Microstructures

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Scanning electron microscopy images were acquired using a LEO 55 VP scanning electron microscope at 5 kV. TEM images and ED patterns were acquired using either a Tecnai T-12 (120 kV) or a FEI Titan TEM (200 kV). Powder X-ray diffraction data were collected on a Bruker D8 diffractometer using Cu Kα radiation. The Brunauer–Emmet–Teller surface area and pore size distribution of the FeF3 MWs were calculated from nitrogen adsorption–desorption isotherms measured by a Quantachrome Autosorb-1 gas sorption analyser. Ex situ electrochemical measurements were performed on electrodes made of 70 wt% active material, 20 wt% carbon black and 10 wt% binder. CR2032-type coin cells were assembled in an argon-filled glovebox, using Li metal as the counter/quasi-reference electrode, 1 M LiPF6 in EC/DMC (1/1 by volume) as the electrolyte and electrolyte-soaked polyethylene-polypropylene films as the separator. Electrochemical impedance spectroscopy and galvanostatic cycling were performed using either a Biologic SP-200 or a VMP-3 Potentiostat/Galvanostat controlled by EC-Lab software.
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7

Characterizing Plasmonic Gold Nanorods

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HRTEM images of individual fcc-2H-fcc Au NR were taken with a FEI Titan TEM with Schottky electron source, operated at 200 kV. The same instrument in STEM mode was used at 80 kV for the eigenmode characterization. A Wien-type monochromator dispersed the electron beam in energy, and a narrow energy-selecting slit formed a monochrome electron beam with typical full-width at half maximum values of ~80 meV. Using a convergence semi-angle of 13 mrad, a ~1 nm2 electron probe was formed and scanned in rectangular areas of pixels (for mapping), or placed at specific locations to acquire individual spectra using a Gatan Tridiem ER EELS detector. All spectra were normalized at their maximum, i.e., the top of zero-loss peak (ZLP). The spectral background signal was corrected by fitting and subtracting a high-quality background spectrum that was measured elsewhere on the same sample without particles nearby.
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8

Comprehensive Microscopy Characterization

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SEM images were captured in a FEI XL30 Sirion SEM. TEM characterization was performed at 300 kV using a FEI Titan TEM. The morphology of plated Li was observed with a FIB (Nova 600i Dual Beam, FEI). The cycled electrodes were cross-sectioned with a Ga+ ion beam and observed with the SEM (JSM-6700F, JEOL). X-ray photoelectron spectroscopy (XPS) was performed on PHI 5000 VersaProbe, using an Al Kα (λ = 0.83 nm, hυ = 1486.7 eV) x-ray source operated at 2 kV and 20 mA.
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9

Monochromated EELS Plasmon Spectroscopy of Au Nanorods

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The monochromated EELS measurement of a single Au NRB was conducted in the STEM mode using an FEI Titan TEM with Schottky electron source operated at 80 kV, using a convergence semiangle of 13 mrad and an EELS collection semiangle of 16 mrad. The diameter of used electron probe was ∼1–2 nm. The energy resolution was set to ∼0.1 eV (as full-width at half-maximum value), using a Wien-type monochromator. EELS spectroscopy and map were collected with a Gatan Tridiem ER EELS detector. EELS was acquired with a modified binned gain averaging acquisition routine46 (link), to give improved signal-to-noise ratio for the relatively weak plasmon signal from few-nanometre-thick material. The background signal was taken from a bare amorphous SiNx TEM support membrane, fitted to and subtracted from the experimental EELS plasmon spectra. EELS maps plotted the loss signal integrated over an energy window of 0.05 eV, centred around selected SPR peaks.
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10

Electron Energy-Loss Spectroscopy in STEM

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EELS was performed in scanning TEM (STEM) mode using an FEI Titan TEM with Schottky electron source. The microscope was operated at 80 kV, and a STEM convergence semi-angle of 13 mrad was used to form a probe with a diameter of approximately 1 nm. A Wien-type monochromator dispersed the electron beam in energy, and an energy-selecting slit formed a monochrome electron beam with typical full-width at half-maximum values of 70 meV. A Gatan Tridiem ER EELS detector was used for EELS mapping and spectroscopy, applying a 12 mrad collection semi-angle. EELS data was acquired with a modified binned gain averaging routine:31 (link) individual spectra were acquired in 40 ms, using 8 or 16 times on-chip binning. The detector channel-to-channel gain variation was averaged out by constantly changing the readout location and correcting for these shifts after the EELS acquisition was finished. A high-quality dark reference was acquired separately, and used for post-acquisition dark signal correction. Spectra were normalized by giving the maximum of the zero-loss peak (ZLP) unit value, and the ZLP background signal was removed by fitting and subtracting a high-quality background spectrum.
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