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22 protocols using x pert pro super diffractometer

1

Nanomaterial Characterization Techniques

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The phase detection of
products was performed by powder XRD (Philips X’Pert Pro Super
diffractometer, Cu Kα radiation, λ = 1.54178 Å).
TEM and FESEM images were recorded with a transmission electron microscope
(JEOL, JEM-1011) and a field emission scanning electron microscope
(JEOL, JSM-6700F), respectively. HRTEM images were recorded using
an electron microscope (JEM-2100F, accelerating voltage: 200 kV) coupled
with an X-ray energy-dispersive spectroscopy (EDX) instrument. TGA
(PerkinElmer Diamond TG/DTA apparatus) was conducted at a heating
rate of 10 °C/min in flowing air. FTIR spectra were recorded
on a Bruker EQUINOX55 spectrometer with a potassium bromide pellet
as a control.
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2

Comprehensive Material Characterization Protocol

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TEM images and high-resolution TEM image were performed by using a JEOL-2010 TEM with an acceleration voltage of 200 kV. X-ray diffraction patterns were recorded by using a Philips X'Pert Pro Super diffractometer with Cu Kα radiation (λ=1.54178 Å). XPS were acquired on an ESCALAB MKII with Mg Kα (=1253.6 eV) as the excitation source. The binding energies obtained in the XPS spectral analysis were corrected for specimen charging by referencing C 1s to 284.8 eV. AFM study in the present work was performed by means of the Veeco DI Nano-scope MultiMode V system. Raman spectra were detected by a RenishawRM3000 Micro-Raman system. The Fourier transform infrared spectra were acquired on a NICOLET Fourier transform infrared spectrometer in a KBr tablets, scanning from 4,000 to 400 cm−1 at room temperature.
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3

Comprehensive Material Characterization Protocol

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NMR spectra were
recorded on a Bruker AV300 NMR spectrometer (resonance frequency of
300 MHz for 1 h) operated in the Fourier transform mode. CDCl3 was used as the solvent. FTIR spectra were measured on a
NICOLET FT-IR spectrometer, using pressed KBr tablets. UV–vis
spectra were recorded on a Solid Spec-3700 spectrophotometer at room
temperature. Fluorescence measurements were recorded on the Fluorolog-3-Tau
(Jobin Yvon, France) fluorescence spectrometer. The excitation wavelength
for the fluorescence spectra was 290 nm, which was produced by a xenon
lamp equipped with a grating monochromator. Low temperatures were
achieved by the CCS-355 (Janis, America) low-temperature equipment.
The field emission scanning electron microscopy images were taken
on a FEI Sirion-200 scanning electron microscope. TEM images were
obtained by a Hitachi model H-800 instrument with a tungsten filament,
using an accelerating voltage of 200 kV. The XRD patterns were recorded
using a Philips X’Pert Pro Super diffractometer with Cu Kα
radiation (λ = 1.54178 Å). The magnetic data were acquired
using a magnetic property measurement system (MPMS) 5XL Quantum design
SQUID magnetometer at room temperature. DSC measurements were taken
on a Mettler-toledo DSC823e instrument (temperature range: 300–650
K; aluminum crucible with pierced lid; sample mass: 3.5 mg; air atmosphere;
and heating/cooling rate: 5/5 K min–1).
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4

Comprehensive Material Characterization

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XRD patterns were recorded by using a Philips X’Pert Pro Super diffractometer with Cu-Kα radiation (λ = 1.54178 Å). Scanning electron microscopy (SEM) images were taken using a Hitachi SU8220 scanning electron microscope. High resolution transmission electron microscope (HRTEM) was carried out on a field-emission transmission electron microscope (JEOL ARM-200F) operating at 200 kV accelerating voltage. SAED was carried out on a JEOL ARM−200F field-emission transmission electron microscope operating at an accelerating voltage of 200 kV using Cu-based TEM grids. The Raman spectrum was conducted via LabRAM HR Evolution (Horiba) Roman system with a 532 nm excitation laser. The liquid products were examined on a Varian 400 MHz NMR spectrometer (Bruker AVANCE AV III 400). The gaseous products were detected via online gas chromatography (GC2014, Shimadzu, Japan).
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5

Characterization of Pt-Based Nanocatalyst

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The as-prepared products were examined using an X-ray powder diffraction (Philips X'Pert Pro Super diffractometer) instrument with Cu Kα radiation (λ = 1.54178 Å). The size and morphology of the samples were analyzed by using a transmission electron microscope (JEM-2100F field-emission electron microscope) which was operated at an acceleration voltage of 200 kV. X-ray photoelectron spectra (XPS) were obtained on an ESCALAB MK II X-ray photoelectron spectrometer with Mg Kα as the excitation source. The high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM) image and EDS mapping images were taken on a JEOL JEM-ARF200F atomic resolution analytical microscope. The loading of Pt was measured on an inductively coupled plasma-atomic emission spectrometer (ICP-AES) on an Optima 7300 DV (PerkinElmer Corporation). The X-ray absorption fine structure (XAFS) measurements at the Pt L-edge were performed at the BL14W1 beamline of the Shanghai Synchrotron Radiation Facility (SSRF), China. The storage ring of the SSRF was operated at 3.5 GeV with a maximum current of 210 mA. The nitrogen adsorption–desorption isotherms and corresponding pore size distribution were evaluated using the Brunauer–Emmett–Teller (BET) equation in the Micromeritics ASAP 2000 system.
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6

Comprehensive Characterization of Novel Materials

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The samples were characterized by X-ray powder diffraction by a Philips X'Pert Pro Super diffractometer equipped with graphite-monochromatized Cu-Kα radiation (λ=1.54178 Å). SEM images were performed on a Zeiss Supra 40 field-emission scanning microscope. TEM images were taken on H-7650 (Hitachi, Japan) operating at an acceleration voltage of 100 kV. HRTEM images were obtained on JEOL-2010 operating at an acceleration voltage of 200 kV. The steady-state ultraviolet–visible absorption spectra were recorded on a Perkin Elmer Lambda 950 spectrophotometer. High-resolution X-ray photoelectron spectroscopy measurements were performed on a VG ESCALAB MK II X-ray photoelectron spectrometer with an excitation source of Mg Kα=1253.6 eV. Mott–Schottky plot was measured in degassed 0.5 M Na2SO4 solution (pH=6.6) at a frequency of 10 Hz in the dark and the applied potential ranges from –0.5 to +0.5 V.
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7

Comprehensive Material Characterization Techniques

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The prepared samples were characterized by the following techniques. X-ray diffraction (XRD) measurements were performed on a Philips X’Pert Pro Super diffractometer (Philips, Almelo, The Netherlands) using Cu Kα radiation (λ  =  1.54178 Å). The morphological structures were collected using a JEOL-2010-JSM-6700F scanning electron microscopy (SEM) (JEOL, Tokyo, Japan) and Hitachi H7650 transmission electron microscopy (TEM) (Hitachi, Tokyo, Japan). Energy dispersive X-ray spectroscopy (EDS) mapping and high–resolution transmission electron microscopy (HRTEM) images were acquired on Talos F200X (FEI, Hillsboro, OR, USA) and JEMARM 200F microscope (JEOL, Tokyo, Japan). Raman spectra were recorded on a Renishaw RM 3000 Micro-Raman system (Renishaw, Gloucestershire, UK) with a 532 nm excitation laser. X-ray photon spectroscopy (XPS) and Auger electron spectroscopy (AES) were performed at Thermo Scientific ESCALAB 250Xi X-ray Photoelectron Spectrometer (Thermo, Waltham, MA, USA).
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8

Comprehensive Characterization of Materials

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XRD spectra was collected by Philips X’Pert Pro Super diffractometer with Cu-Kα radiation (λ = 1.54178 Å). The HAADF-STEM measurement was carried out on a JEOL JEM-ARF200F. The ESR measurements were recorded on a JES-FA200 model spectrometer operating at the X-band frequency. AFM was measured on the Veeco DI Nano-scope MultiMode V system. The X-ray photoelectron spectra (XPS) were detected on an ESCALAB MKII with Mg Kα as the excitation source, using C 1s (284.6 eV) as a reference. The Fourier-transform infrared (FT-IR) spectra were collected on a MAGNA-IR 750 (Nicolet Instrument Co, U.S.). Room temperature PL spectra were carried out by using a Jobin Yvon Fluorolog 32TAU luminescence spectrometer (Jobin Yvon Instruments Co., Ltd., France). The valence band XPS spectra were detected at beamline BL10B in the National Synchrotron Radiation Laboratory (NSRL), Hefei, China. The NMR experiments were carried out on with a 400-MHz Bruker AVANCE AV III NMR spectrometer. The electrochemical measurements were performed an electrochemical workstation (CHI760E, Shanghai Chenhua Limited, China). Isotope Tracing Experiments: The isotope tracing experiments were performed using 13CO2 (99%, Cambridge Isotope Laboratories, Inc.) and the corresponding products were measured by determined via the 13C-coupled satellites in a 400-MHz Bruker AVANCE AV III NMR spectrometer.
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9

Structural Characterization of Materials

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XRD patterns were recorded by using a Philips X’Pert Pro Super diffractometer with Cu-Kα radiation (λ = 1.54178 Å). XPS measurements were conducted on an ESCALAB 250 (Thermo-VG Scientific, USA) with an Al Kα X-ray source (1486.6 eV protons) in Constant Analyser Energy (CAE) mode with pass energy of 30 eV for all spectra. The values of binding energies were calibrated with the C1s peak of contaminant carbon at 284.60 eV. Raman spectra were detected by a Renishaw. RM3000 Micro-Raman system with a 514.5 nm Ar laser.
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10

Comprehensive Structural Characterization of Materials

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XRD was conducted on a Philips X’Pert Pro Super diffractometer (with Cu Kα, λ = 1.54182 Å). The XPS was performed at the photoemission end-station (BL10B) in the National Synchrotron Radiation Laboratory, Hefei. Field emission scanning electron microscopy was carried out on the JEOL-JSM-6700F, while the high-resolution transmission electron microscopy, HAADF-STEM, and energy-dispersive spectroscopy (EDS) mapping analyses were performed on the JEOL JEM-ARF200F TEM/STEM with a spherical aberration corrector. The XAFS spectra were collected at the 14W1 station in the Shanghai Synchrotron Radiation Facility. The collected EXAFS data were analyzed using the ATHENA program as implemented in the IFEFFIT software packages according to the standard procedures. The k2-weighted EXAFS spectra were achieved by pre-edge background deduction and then normalized relative to the edge-jump step, and the plotting k-weight was 2.
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