The largest database of trusted experimental protocols

Smartlab 9 x

Manufactured by Rigaku
Sourced in Japan

The Smartlab 9 X is a high-performance X-ray diffractometer designed for advanced materials characterization. It features a powerful X-ray source, a flexible goniometer, and a state-of-the-art detector, enabling comprehensive analysis of a wide range of crystalline materials.

Automatically generated - may contain errors

2 protocols using smartlab 9 x

1

Structural and Surface Characterization of ALD-Coated AC

Check if the same lab product or an alternative is used in the 5 most similar protocols
The crystallographic structures of bare AC and ALD oxides-coated AC electrodes were examined using a Rigaku Smartlab 9 X-ray diffractometer at a scan rate of 6°/min using 150 mA current, 40 kV voltage, and copper target. The surface morphology and particle size were characterized using a ZEISS Sigma−500 field emission scanning electron microscopy (FESEM). The elemental distribution and mapping were obtained using Energy Dispersive Spectroscopy (EDS, BRUKE XFlash−6130, Berlin, Germany). Transmission electron microscopy (TEM) images were captured on a JEM2100 instrument at an acceleration voltage of 200 kV to analyze the deposition features on the carbon surface. Quantachrome Autosorb-iQ2-MP (Quantachrome Instruments, Florida, USA) and nitrogen isotherms were used to test specific surface areas by BET tests with degassing at 250 °C for 3 h for each 36 mg sample. The DFT (density functional theory) and HK (Horvath-Kawazoe) methods from N2 adsorption-desorption isotherms (at 77.4 K) were employed to verify the surface area and porosity. The elemental distribution and functional changes were explored using X-ray photoelectron spectroscopy (Thermo Scientific ESCALAB 250Xi).
+ Open protocol
+ Expand
2

Comprehensive Characterization of Crystalline Materials

Check if the same lab product or an alternative is used in the 5 most similar protocols
The crystalline phase was determined by powder X-ray diffraction (XRD) using a Rigaku SmartLab 9 X-ray diffractometer (Tokyo, Japan) with Cu Kα radiation (λ = 1.5418 Å). The morphology was characterized by a scanning electron microscopy (SEM, Zeiss Supra-40, Oberkochen, Germany) and transmission electron microscopy (TEM, FEI Talos F200x, Waltham, MA, USA). Element distribution mapping was carried out using an energy dispersive X-ray detector equipped on the FEI Talos F200x. X-ray photoelectron spectroscopy (XPS) was studied on a Thermo Fisher ESCLAB 250Xi spectrometer (Waltham, MA, USA).
+ Open protocol
+ Expand

About PubCompare

Our mission is to provide scientists with the largest repository of trustworthy protocols and intelligent analytical tools, thereby offering them extensive information to design robust protocols aimed at minimizing the risk of failures.

We believe that the most crucial aspect is to grant scientists access to a wide range of reliable sources and new useful tools that surpass human capabilities.

However, we trust in allowing scientists to determine how to construct their own protocols based on this information, as they are the experts in their field.

Ready to get started?

Sign up for free.
Registration takes 20 seconds.
Available from any computer
No download required

Sign up now

Revolutionizing how scientists
search and build protocols!