The sample morphologies were characterized by SEM (JOEL, JSM-7500F), HRTEM (JOEL, JEM-2100F), and atomic force microscopy (Veeco, diINNOVA 840-012-711). The chemical compositions of the reagents and specimens were determined using an FTIR spectrometer (Bruker, IFS-66/S). The sheet resistance was measured at 27 points on each TCF using a four-point probe surface resistivity meter (R-CHEK, RC2175). The specular transmittance was measured between 350 and 1050 nm (UV-Vis-NIR spectrophotometer UV3600). The total transmittance and haze of the TCFs were also measured using white light (Nippon Denshoku Industries Co., NDH 7000 haze meter, 400 ~ 700 nm). The transmittance of the PC substrate was not included in the total transmittance analysis. The haze was calculated as Is,2°–90°/(Id+ Is,0°–90°). Is,2°-90° is the forward scattered intensity between 2° and 90°, Id is the direct parallel transmitted intensity, and Is,0°–90° is the forward scattered intensity between 0° and 90°. The total transmittance is Id + Is,0°–90°. TGA (Seiko Exstar 6000, TG/DTA6100) and DSC (Seiko Exstar 6000, DSC6100) analyses were carried out under a nitrogen atmosphere.
Jem 2100f
Manufactured by Veeco
The JEM-2100F is a high-resolution transmission electron microscope (TEM) manufactured by Veeco. It is designed to provide high-magnification imaging and analysis of a wide range of materials. The JEM-2100F features a LaB6 electron source and advanced optics for superior image quality and resolution.
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2 protocols using jem 2100f
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Characterization of TCF Materials
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Characterization of Bi2O2CO3 Catalyst
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The X-ray diffraction patterns of the samples were carried out on the Bruker X-ray diffractometer (XRD, D8 Advance) using Cu Kα. An Autosorb-iQA3200-4 sorption analyzer (Quantatech Co., USA) based on N2 adsorption/desorption was used to measure the Brunauer–Emmett–Teller specific (BET) surface area. The surface morphology and thickness of the Bi2O2CO3 samples were examined with a field emission scanning electron microscope (FESEM, Hitachi S4800), transmission electron microscope (TEM, JEM-2100F), and atomic force microscope (AFM, Dimension V, Veeco). The surface chemical valences of the Bi2O2CO3 catalyst were analysed with an ESCALAB 250 X-ray photoelectron spectroscope (XPS). The UV-visible diffuse reflectance spectra were measured with a Hitachi UV-3310. The photoluminescence (PL) spectra were collected on a Hitachi F4600 fluorescence spectrophotometer, using a Xe lamp (excitation at 365 nm) as the light source.
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