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Tga dtg 60h

Manufactured by Shimadzu
Sourced in Japan

The TGA-DTG-60H is a thermogravimetric analyzer (TGA) and differential thermogravimetric (DTG) analyzer produced by Shimadzu. It is designed to measure the weight changes of a sample as a function of temperature or time in a controlled atmosphere.

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3 protocols using tga dtg 60h

1

Characterization of NiFe2O4@SiO2-PEI Nanocomposite

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Powder X-ray diffraction (PXRD) measurements were carried out on a Shimadzu 6100 using Cu-Kα (λ = 0.15406 Å) radiation at 298 K on solid powder samples of freshly prepared and recovered materials of NiFe2O4@SiO2–PEI. The PXRD of NiFe2O4 was recorded on an STOE-STADI MP diffractometer equipped with a Cu-Kα1 radiation (λ = 0.15406 Å) source and operating in transmission mode. Thermogravimetry–differential thermal analysis (TGA-DTA) was recorded on a Shimadzu TGA-DTG-60H instrument on a powder sample. Fourier-transformed (FT)-IR spectra were recorded on a Bruker Alpha I spectrophotometer on KBr disks. Field emission scanning electron microscopy (FE-SEM) and energy-dispersive X-ray spectroscopy (EDX) were carried out on a JEOL JSM-IT 100 instrument.
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2

Thermal and Chemical Analysis of Zn2SiO4 and SiO2-ZnO

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The salts, chemicals, and solvents used for this project were purchased from a commercial seller of Merck Chemicals (Merck Company, Darmstadt, Germany). The Bis-GMA, TEGDMA, CQ, and 3-NDADM were purchased from a commercial seller of Aldrich chemicals (Sigma-Aldrich, St. Louis, MO, USA). The thermal behavior was investigated to confirm the thermal stability of the samples using TGA analysis on a Shimadzu TGA-DTG-60H instrument (Kagoshima, Japan). The FT-IR analysis was performed on a Bruker spectrophotometer (BRUKER TEMSOR27, Borken, Germany) using the KBr disk in the range of 400 to 4000 cm−1. The morphology and chemical composition of the samples were studied by FE-SEM and EDX analysis using a JEOL JSM-IT 100 (Tokyo, Japan) instrument. The mechanical properties were measured on a universal testing machine (Hounsfield, Redhill, UK). The XRD patterns of the Zn2SiO4 and SiO2–ZnO samples were analyzed on a Bruker XRD D8/Advance/axs instrument (Bruker AXS GmbH, Karlsruhe, Germany).
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3

Thermogravimetric Analysis of CNCs

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The thermogravimetric analysis (TGA) and its derivative (DTG) of the as-obtained CNCs and cellulose precursors were studied TGA/DTG-60H (SHIMADZU Corporation, Japan). The samples were heated from room temperature to 700°C at a heating rate of 10°C/min under a nitrogen gas flow rate of 60 mL/min.
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