Jem 2100f tem stem system

The crystal structures of Co₅Zn₂₁ ribbons and dealloyed nanoporous Co were characterized by X-ray diffraction with Co–Kα radiation (Rigaku SmartLab 3 kW). The microstructure, chemical composition and grain size of the specimens were investigated using field-emission scanning electron microscope (JEOL JIB-4600F, 15 keV) equipped with an X-ray energy-dispersive spectroscopy (EDS) and an electron backscatter diffraction (EBSD) imaging system. The structural and chemical analysis was characterized by a JEOL JEM-2100F TEM/STEM system with double Cs-correctors (operated at 200 kV).

We employed a JEOL JEM-2100F TEM/STEM system with double Cs-correctors (operated at 200 kV) for the measurements. All the ABED patterns were recorded with a charge-coupled device camera (Gatan, US1000). A coherent electron beam was produced using a specially designed small-condenser aperture with a diameter of 3.5 μm (Daiwa Techno Systems Co., Ltd.). The convergence angle was estimated to be 1.0 mrad. The instrumental parameters such as the spherical aberration coefficient, defocus and astigmatism were precisely measured using the Ronchigram method32 . By using a scanning function of the STEM system, we were able to obtain a large number of ABED patterns (more than 10,000 frames) from a thin area near the specimen edge. The specimens with a thickness <5 nm were prepared by the conventional crushing method for the TEM/STEM observations. The ABED patterns were calculated using the multislice simulation software, which has been detailed in ref. 33 .