The samples were visualized using scanning electron microscopy (Verios 460, FEI) with energy-dispersive spectroscopy (XFlash 6130, Bruker) and high-resolution transmission electron microscopy (JEM-2100F, JEOL). Sample preparation for the cross-sectional view was carried out using ion milling system (IM-40000, Hitachi). Dual-beam focused ion beam (Helios 450HP, FER) was used for cross-section view of TEM images. To observe the volume expansion of the electrode at lithiated state after cycling, the cells are disassembled, and the electrodes are rinsed with dimethyl carbonate in a dry room. Specific surface area and mesopore diameter distribution were estimated with the Brunauer–Emmett–Teller (BET) method using the nitrogen adsorption–desorption analyzer (TriStar II, Micromeritics). Prior to measurement, the samples were degassed at 120 °C for 2 h. And porosity and macropore diameter distribution were determined by mercury-porosimetry (Autopore V9500, Micromeritics).
Xflash 6130
Manufactured by Bruker
Sourced in Germany, United States
The XFlash 6130 is an energy-dispersive X-ray spectrometer (EDS) designed for scanning electron microscopes (SEMs). It provides elemental analysis and mapping capabilities, enabling the identification and quantification of elements present in a sample.
Automatically generated - may contain errors
Lab products found in correlation
Escalab 250, by Thermo Fisher Scientific (3 mentions)
Verios 460, by Thermo Fisher Scientific (2 mentions)
Tristar 2, by Micromeritics (2 mentions)
D8 advance, by Bruker (2 mentions)
Sigma 500, by Zeiss (2 mentions)
K alpha, by Thermo Fisher Scientific (2 mentions)
Jem 2100f, by JEOL (1 mentions)
Merlin, by Zeiss (1 mentions)
Nova nanosem 450, by Bruker (1 mentions)
D8 advance x ray diffractometer, by Bruker (1 mentions)
Vertex 70, by Bruker (1 mentions)
Sodium sulfate, by Merck Group (1 mentions)
Uv 2600 spectrophotometer, by Shimadzu (1 mentions)
Gc 2014, by Shimadzu (1 mentions)
Pgstat128n, by Metrohm (1 mentions)
Arium pro, by Sartorius (1 mentions)
K2ptcl6, by Merck Group (1 mentions)
K2ptcl4, by Merck Group (1 mentions)
Haucl4 3h2o, by Merck Group (1 mentions)
V 650 spectrophotometer, by Jasco (1 mentions)
18 protocols using xflash 6130
1
Comprehensive Characterization of Battery Electrodes
2
SEM and EDS Analysis of Scaffolds
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The morphological characteristics of the scaffolds were observed by scanning electron microscopy (SEM; MERLIN, Carl Zeiss AG, Oberkochen, Germany) at an accelerating voltage of 15 kV, after sputter coating with carbon. In addition, an elemental mapping analysis was performed by energy dispersive spectroscopy (XFlash 6130, Bruker, Berlin, Germany) on the elemental composition of the scaffolds.
3
Characterization of Silver Nanoparticles
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The crystallographic structure of the prepared samples was studied using an X-ray diffraction (XRD) technique. A Bruker D8 Advance X-ray Diffractometer with Cu-Kα radiation (λ = 1.506 Å) was used to record X-ray diffraction (XRD) patterns. X-ray photoelectron spectroscopy (XPS) was done using XPS-SPECS GmbH, Germany, (Al Kα (1486.6 eV) X-rays). A field-emission scanning electron microscope (FESEM) was used to study the surface morphology. An FEI Nova NanoSEM 450 scanning electron microscope attached with Bruker X Flash 6130 with excellent energy resolution (123 eV for Mn Kα and 45 eV for Cu Kα) was used for the energy-dispersive X-ray spectroscopy (EDS). The transmission electron microscopy (TEM) images of silver nanoparticles were obtained with a TECHNAI20G2 transmission electron microscope.
All the AgNPs solutions were independently analyzed for their hydrodynamic diameter and polydispersity index on a Malvern Instrument Zetasizer Nano-ZS, Malvern (Malvern-Aimil Instruments private limited, New Delhi, India). The zeta potentials of the nanoparticles were also ascertained using the same instrument.
All the AgNPs solutions were independently analyzed for their hydrodynamic diameter and polydispersity index on a Malvern Instrument Zetasizer Nano-ZS, Malvern (Malvern-Aimil Instruments private limited, New Delhi, India). The zeta potentials of the nanoparticles were also ascertained using the same instrument.
4
Synthesis and Characterization of Novel Materials
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All chemicals and solvents were of analytical grade and used without further purification. Following are the chemicals and their sources of procurement: citric acid, thiourea (TCI), triethanolamine (TEOA) (Sigma Aldrich), sodium sulfate (Merck). X-ray diffraction (XRD) patterns were recorded on a Bruker D8 Advance diffractometer equipped with a scintillation counter detector with a Cu Kα radiation (λ = 0.15406 Å) source operating at 40 kV and 40 mA. DR UV-visible spectra were recorded on a Shimadzu UV-2600 spectrophotometer. SEM images were recorded on a JEOL 7600F instrument. EDX and elemental mapping were recorded using XFlash 6130 Bruker. Photoluminescence (PL) spectra were measured using a Fluorolog HORIBA instrument at an excitation wavelength of 420 nm. Fourier transformation infrared (FTIR) analysis was done by using a Bruker VERTEX70 instrument. Transmission electron microscopy analysis was done by using a JEOL 2100 instrument at an operating voltage of 200 kV. We quantified H2 through a TCD detector using Shimadzu GC-2014. We performed the XPS analysis of our sample using the instrument PHI 5000 Versa Prob II.
5
Surface Analysis and Wettability of SiO2/Solid-State Material
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The surface morphology of the SSM before and after modification was analyzed by SEM (ZEISS sigma500, Zeiss, Germany), the elemental distribution of SiO2/SSM was analyzed by EDS (BRUKER XFlash 6130, Oxford, UK), and the chemical composition of the SiO2/SSM surface was characterized by XPS (Thermo Fisher Nexsa, MA, USA). A contact angle analytical instrument (TST-300H, Shenzhen Tystein Co., Ltd., Shenzhen, China) was used to determine the surface wettability of the material. The SSM before and after modification was cut into 30 mm × 5 mm strips and fixed on the glass slides, and three samples in each group were then tested for water contact angle in air and oil contact angle under water, with the average value taken at least 3 times.
6
Pt-, Au-, and PtAu-Modified Ni Electrodes Characterization
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Scanning electron microscopic (SEM) images were
obtained with a
Sigma 500 instrument, Carl Zeiss Microscopy. EDS analysis was performed
using the instrument (XFlash 6130, Bruker) coupled with FE-SEM (field-emission
scanning electron microscopy). CVs were recorded using a potentiostat
(PGSTAT 128N, Metrohm Autolab). The platinum wire and Ag|AgCl (3.0
M NaCl) electrode (BAS, Inc.) were employed as the counter and reference
electrodes, respectively. Hence, the potential values of CVs are vs
Ag|AgCl. Ni wire (diameter of 0.30 mm, 99+% degree, Nilaco Co.) was
used for preparing Pt-, Au-, and PtAu-modified Ni electrodes. For
the purpose of comparisons, an Au disk (diameter of 1.6 mm, BAS, Inc.)
or a Pt disk (diameter of 1.6 mm, BAS, Inc.) electrode was used as
a working electrode.
HAuCl4·3H2O,
K2PtCl4,and K2PtCl6 were
purchased from Sigma-Aldrich. Other reagents were obtained from Sigma-Aldrich
or Wako Pure Chemicals. All aqueous solutions were prepared with ultrapure
water obtained from a water purification system (Arium pro, Sartorius)
with a specific resistance >18 MΩ cm.
obtained with a
Sigma 500 instrument, Carl Zeiss Microscopy. EDS analysis was performed
using the instrument (XFlash 6130, Bruker) coupled with FE-SEM (field-emission
scanning electron microscopy). CVs were recorded using a potentiostat
(PGSTAT 128N, Metrohm Autolab). The platinum wire and Ag|AgCl (3.0
M NaCl) electrode (BAS, Inc.) were employed as the counter and reference
electrodes, respectively. Hence, the potential values of CVs are vs
Ag|AgCl. Ni wire (diameter of 0.30 mm, 99+% degree, Nilaco Co.) was
used for preparing Pt-, Au-, and PtAu-modified Ni electrodes. For
the purpose of comparisons, an Au disk (diameter of 1.6 mm, BAS, Inc.)
or a Pt disk (diameter of 1.6 mm, BAS, Inc.) electrode was used as
a working electrode.
HAuCl4·3H2O,
K2PtCl4,and K2PtCl6 were
purchased from Sigma-Aldrich. Other reagents were obtained from Sigma-Aldrich
or Wako Pure Chemicals. All aqueous solutions were prepared with ultrapure
water obtained from a water purification system (Arium pro, Sartorius)
with a specific resistance >18 MΩ cm.
7
Characterization of CuS and CuS-Au Nanocomposites
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Jasco V-650 Spectrophotometer (model no. UV-1800) with a deuterium and tungsten-halogen lamp was used to study ultra-violate-visible spectroscopy. Horiba Jobin Yvon Spectroflourimeter (Fluoro max-4) was used to measure the photoluminescence (PL) spectra. Rigaku Mini Flex II diffractometer with Cu-Kα radiation was utilized to monitor powder X-ray diffraction pattern, with a scanning rate 2° per min. Morphology of CuS and CuS-Au-n samples were investigated with the help Nova NanoSem 450 FESEM. Bruker XFlash 6130, attached with FESEM instrument was used for EDS analysis. Morphology of CuS and CuS-Au-3 sample was determined using Transmission electron microscopy (Bruker microscope operated). X-ray photoelectron spectroscopy (XPS) analysis was carried out using a commercial Omicron EA 125 source with Al-Kα radiation (1486.7 eV). Raman analysis was carried out using Airix (STR 500) instrument. ICP-OES analysis was carried out in Varian 720-ES.
8
Characterization of Sludge Phosphorus Fractions
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In order to determine the transformation of phosphorus fraction in sludge, the Hupfer method was adopted to identify the labile-P, MCO3-P, Fe/Al-P, Org-P, Ca-P and Residual-P (Uhlmann et al., 1990 ). The structure of wet aerobic sludge from cell 4 and four sludge samples after 124 days of anaerobic condition were observed by microscope (Nikon, 50i, Japan). At the same time, SS and VSS of those samples were measured by national standard method (APHA, 2005 ). FE-SEM (ZEISS sigma500) and Energy Dispersive Spectrometer (EDS) (Energy spectrum: BRUKER XFlash 6130) were used to analyze the microscopic morphology and element composition of the dry and grinded sludge samples from each cell. The phase and crystal structure of dry and grinded sludge samples were analyzed by XRD (BRUKER D8 ADVANCE). XPS could provide information on the elemental composition, content, and valence state of the material. In this study, k-Alpha X-ray photoelectron spectrometer with Al target emission was used to characterize different dry and grinded samples. The whole spectrum was collected with a transmittance of 200 eV and a step length of 1.0 eV. The narrow spectra of different elements were collected with a transmittance of 50 eV and a step length of 0.1 eV. The spectra were analyzed by Avantage software.
9
Characterization of Ag@PMoS2, PMoS2, and MoS2
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The morphology of Ag@PMoS2, PMoS2, and MoS2 was observed by transmission electron microscopic (TEM) (Morgagni 268D, FEI, USA). The chemical structure of Ag@PMoS2, PMoS2, and MoS2 was analyzed by Fourier-transform infrared spectroscopy. The morphology and elemental composition distribution of Ag@PMoS2, PMoS2, and MoS2 and composite scaffolds were observed by scanning electron microscopy (SEM) (EVO LS10, Zeiss, Germany) equipped with energy-dispersive spectroscopy (EDS) (XFlash 6130, Bruker, Germany). The chemical composition of Ag@PMoS2, PMoS2, and MoS2 was evaluated by X-ray photoelectron spectroscopy (XPS) (ESCALAB 250, Thermo Scientific, UK). The crystal structure of Ag@PMoS2, PMoS2, and MoS2 was observed by X-ray diffractometer (XRD) (Empyrean-100, PANalytical, Netherlands). The Ag+ release spectrum of composite scaffolds in deionized water was quantitative analyzed by inductively coupled plasma optical emission spectrometer (Optima 8300, Perkin Elmer, USA).
10
Intracellular Cd Bioaccumulation Analysis in Bacteria
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Transmission electron microscope (TEM, JEOL-2011, 120 kV) equipped with energy dispersive X-Ray analysis (EDAX, Bruker X Flash 6130) was used to determine the intracellular Cd bioaccumulation by AS10. For this, the strain was simply grown in 2250 µg/ml Cd parallelly with a control (without Cd) for 24 h at 30 ± 2 °C. Bacterial cells were processed according to Chen et al. (2016) (link). Similarly, grown bacterial culture was lyophilized X-ray diffraction (XRD, RICH SEIFERT-XRD 3000P, X-Ray Generator-Cu, 10 kV, 10 mA, wavelength 1.5418 Å) measurements (Arivalagan et al., 2014 ).
For Fourier transform infrared spectroscopy (FTIR) analysis, powdered bacterial samples as prepared during XRD (Deokar et al., 2013 (link)) were used in this measurement and tested with KBr pellets at room temperature by using FTIR spectrometer (NICOLET MAGNA IR 750). For X-Ray Fluorescence spectra (XRF, Bruker ARTAX - ELEMENT ANALYSER, Current-698µA, Time-300 S, Voltage-50 kV) analysis, lyophilized bacterial samples (AS10, and AS10+Cd) were used with XRF spectrometer following the method of Ghosh et al. (2021) .
For Fourier transform infrared spectroscopy (FTIR) analysis, powdered bacterial samples as prepared during XRD (Deokar et al., 2013 (link)) were used in this measurement and tested with KBr pellets at room temperature by using FTIR spectrometer (NICOLET MAGNA IR 750). For X-Ray Fluorescence spectra (XRF, Bruker ARTAX - ELEMENT ANALYSER, Current-698µA, Time-300 S, Voltage-50 kV) analysis, lyophilized bacterial samples (AS10, and AS10+Cd) were used with XRF spectrometer following the method of Ghosh et al. (2021) .
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