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X ray photoelectron spectroscopy xps

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X-ray photoelectron spectroscopy (XPS) is a surface analysis technique that measures the elemental composition, empirical formula, chemical state, and electronic state of the elements within a material. It relies on the photoelectric effect, where X-rays are used to eject photoelectrons from the surface of a sample, which are then detected and analyzed.

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8 protocols using x ray photoelectron spectroscopy xps

1

Structural Analysis of Shellac-Derived TrGO

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Raman spectra of shellac-derived TrGO flakes were acquired in backscattering mode using an ultrahigh-throughput spectrometer (alpha300R, WiTec, Ulm, Germany). X-ray diffraction (XRD) measurements were performed using a Bruker D8 Advance diffractometer (Bruker, Billerica, MA, USA) with Cu Kα radiation (0.154 nm). The crystallinity and elemental mapping were investigated using high-resolution transmission electron microscopy (HR-TEM, JEOL Ltd., Tokyo, Japan) and high-angle annular dark-field scanning TEM (HAADF-STEM) fitted with an aberration corrector (CEOS GmbH, Heidelberg, Germany). A JEOL JEM-2100F electron microscope (JEOL Ltd., Tokyo, Japan) operating at 200 kV was used to perform the HR-TEM and HAADF-STEM. The chemical analysis was performed using X-ray photoelectron spectroscopy (XPS) (Thermo Fisher Scientific, Waltham, MA, USA). The system was equipped with a double-focusing hemispherical analyzer and a monochromatic Al Kα source (1486.6 eV) (Thermo Fisher Scientific, Waltham, MA, USA). The vacuum of the main chamber was maintained at 1 × 10−10 mbar during the entire measurement. XPSPeak41 software developed by Raymund Kwok was used for the deconvolution of the high-resolution XPS spectra.
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2

Hydrothermal Synthesis and Characterization of Nanoceria

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The nanoceria was synthesized using the hydrothermal process with cerium nitrate hexahydrate (Ce (NO3)3·6H2O) as a cerium source. The detailed procedures have been described in the previous report.17 (link) Controlling the base concentration and reaction temperature, the nanoceria with different sizes and shapes can be obtained. Then, the synthetic nanoceria underwent extensive characterization before the biological experiment. The particle size and shape were evaluated by Transmission Electron microscopy (TEM; Philips Tecnai 10, Amsterdam, The Netherlands). X-ray diffraction (XRD; Bruker advance D8, Germany) was used to characterize crystal morphology and structure. X-ray photoelectron spectroscopy (XPS; Thermo Fisher Scientific, Loughborough, UK) was used to assess qualitatively and quantitatively the surface amount of Ce3+ and Ce4+. For cell and animal studies, the prepared nanoceria was firstly dispersed in a cell culture medium at a concentration of 1 mg/mL. The hydrodynamic size and surface electrical properties of dispersions were characterized by dynamic light scattering and Z-potential measurement (DLS; Malvern, Worcestershire, UK).
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3

XPS Analysis of Sintered Samples

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The elemental composition and oxidation state analyses of sintered samples were carried out by a Thermo Scientific X-ray photoelectron spectroscopy (XPS, Facultad de Ingeniería Mecánica y Eléctrica, San Nicolás de los Garza, Nuevo León, México) using a K-alpha X-ray photoelectron spectrometer system. The samples were excited by a monochromatized Al Kα X-ray radiation of energy of 1486.6 eV.
Cleaning by a soft surface etching step was performed to remove superficial impurities from the sample during the analysis. Binding energies of all the peaks were corrected using C 1 s energy at 284.6 eV corresponding to adventitious carbon. Moreover, the charge compensation was corrected by the flood gun associated with the spectrometer. The peaks were deconvoluted using a Shirley type background calculation and peak fitting using the Gaussian–Lorentzian sum function.
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4

Comprehensive Material Characterization Protocol

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X-ray diffraction (XRD, Ultima IV) was used to characterized the crystal structure of materials. Crystal morphologies and microstructure of synthesized materials can be analysed by SEM (Supra 55) and TEM (JEM-F200) equipped with energy dispersive X-ray. The chemical composition and valence state of the sample surface was characterized by Thermo Scientific X-ray photoelectron spectroscopy (XPS) with Al Kα irradiation. Fourier transform infrared (FTIR) (Thermo Fisher Nicolet 6700) was used to confirm active groups of the sample. UV-vis diffuse reflectance spectra (DRS) were monitored by UV-3600 UV Spectrometer (SHIMADZU) in the 200–800 nm wavelength range. Photoluminescence spectra (PL) was obtained by using HITACHI F-7000 with the excitation light at 300 nm.
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5

Fluorinated Polysilazane Surface Characterization

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The grafting of fluorinated groups onto the polysilazane backbone was confirmed using the 1H-NMR spectra obtained using a 300 MHz (Bruker, Billerica, MA, USA) spectrometer in a CDCl3 solution. The Fourier-transform infrared (FTIR) spectra of the samples were obtained in the attenuated total reflection mode using a Nicolet 6700 (Thermo Scientific, Waltham, MA, USA) apparatus. The surface morphologies of the samples were evaluated using a field-emission scanning electron microscope (JSM-6701F, JEOL, Tokyo, Japan) at an acceleration voltage of 5 kV; the samples were sputter-coated with Pt prior to analysis. The chemical compositions of the coated surfaces were determined using an X-ray photoelectron spectroscopy (XPS; Thermo Scientific, Waltham, MA, USA) instrument with a monochromatic Al Kα X-ray source at a photon energy of 1486.7 eV. The CA and sliding angle (SA) of the coatings were measured using a Smart Drop (Femtobiomed, Seongnam, Korea) electronic device. A water droplet (8 µL) was placed on the coated surface at 25 °C, and the CA and SA were measured using the sessile drop method. The SA values were obtained by measuring the tilt angle of the coating where the water droplet slid off the surface at a tilt step of 0.2°. The reported CA and SA values are the averages of five measurements at different locations on each surface.
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6

Optical and Structural Characterization of Oligomer Nanoparticles

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Optical properties of oligomer
nanoparticles and silver-decorated
oligomer nanoparticles were characterized by a UV–vis spectrophotometer
(Carry, UV–vis) and a florescence spectrophotometer (Carry
Eclipse Florescent Spectrophotometer). The morphologies of oligomer
and silver nanoparticle were investigated using focused ion beam scanning
electron microscopy (FEI, NanoSEM) and transmission electron microscopy
(FEI Technai G2 F30). Determination of the size distribution and average
diameter of nanoparticles with respect to their hydrodynamic sizes
were carried out via dynamic light scattering (DLS) measurements (Malvern
Nano-ZS Zetasizer). Chemical and elemental analysis of nanoparticles
were determined using X-ray photoelectron spectroscopy (XPS) (Thermo
Fisher Scientific). Measurements were performed with a spot size of
∼400 μm, 30 eV pass energy, and 0.1 eV step size. The
powder X-ray diffraction system (X’pert pro MPD (PANalytical))
to study the XRD patterns of the hybrid materials.
All chemicals
and solvents were purchased from Sigma Aldrich Chemical
Co. (Germany), including silver nitrate salt. Detailed synthesis and
characterization of the oligomer were reported in our previous publications.30 (link),33 (link)
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7

Comprehensive Material Characterization

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Numerous morphological and structural analyses were conducted. An X-ray diffractometer (X'PERT-Pro M.P.D., Netherlands) was used to assess crystallinity. The morphology was investigated using transmission electron microscopy (TEM). Thermo fisher scientific DXR was used for Raman analysis. Atomic force microscopy (AFM) was provided by nanoscience analytical to examine the thin sheets. A detailed microstructural analysis was performed using Thermo Fisher Scientific’s X-ray photoelectron spectroscopy (XPS).
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8

Comprehensive Catalyst Characterization

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The characterization of the catalyst mainly included crystal structure, microscopic morphology, element composition, and pore size distribution. The X-ray diffractometer model DX-2700 (Dandong Fangyuan Instrument Co. LTD, Dandong, China) was used for testing. The X-ray tube was copper palladium (λ = 1.5417 Å), the scanning step width was 0.02°, and the scanning angle was 10°~80°. The tube voltage and tube current were set to 40 kV and 30 mA, respectively. A scanning electron microscope (SEM, Zeiss SIGMA 300 field-emission, Oberkochen, Germany) characterized the microscopic morphology of the catalyst. Transmission electron microscopy (TEM) (FEI Tecnai G2 F20, FEI, Eindhoven, The Netherlands) collected information at a voltage of 200 kV. An inductively coupled plasma optical emission spectrometer (ICP-OES) measurement was performed with Agilent 720ES (Santa Clara, CA, USA), and the actual proportion of iron in the catalyst with different iron precursor content was determined. The K-Alpha type of Thermo Scientific (Waltham, MA, USA) was used to test the catalyst to obtain the valence state and surface energy state distribution of the catalyst by analyzing the X-ray photoelectron spectroscopy (XPS) (Thermo Scientific, Waltham, MA, USA).
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