X ray photoelectron spectroscopy xps
X-ray photoelectron spectroscopy (XPS) is a surface analysis technique that measures the elemental composition, empirical formula, chemical state, and electronic state of the elements within a material. It relies on the photoelectric effect, where X-rays are used to eject photoelectrons from the surface of a sample, which are then detected and analyzed.
Lab products found in correlation
8 protocols using x ray photoelectron spectroscopy xps
Structural Analysis of Shellac-Derived TrGO
Hydrothermal Synthesis and Characterization of Nanoceria
XPS Analysis of Sintered Samples
Cleaning by a soft surface etching step was performed to remove superficial impurities from the sample during the analysis. Binding energies of all the peaks were corrected using C 1 s energy at 284.6 eV corresponding to adventitious carbon. Moreover, the charge compensation was corrected by the flood gun associated with the spectrometer. The peaks were deconvoluted using a Shirley type background calculation and peak fitting using the Gaussian–Lorentzian sum function.
Comprehensive Material Characterization Protocol
Fluorinated Polysilazane Surface Characterization
Optical and Structural Characterization of Oligomer Nanoparticles
nanoparticles and silver-decorated
oligomer nanoparticles were characterized by a UV–vis spectrophotometer
(Carry, UV–vis) and a florescence spectrophotometer (Carry
Eclipse Florescent Spectrophotometer). The morphologies of oligomer
and silver nanoparticle were investigated using focused ion beam scanning
electron microscopy (FEI, NanoSEM) and transmission electron microscopy
(FEI Technai G2 F30). Determination of the size distribution and average
diameter of nanoparticles with respect to their hydrodynamic sizes
were carried out via dynamic light scattering (DLS) measurements (Malvern
Nano-ZS Zetasizer). Chemical and elemental analysis of nanoparticles
were determined using X-ray photoelectron spectroscopy (XPS) (Thermo
Fisher Scientific). Measurements were performed with a spot size of
∼400 μm, 30 eV pass energy, and 0.1 eV step size. The
powder X-ray diffraction system (X’pert pro MPD (PANalytical))
to study the XRD patterns of the hybrid materials.
All chemicals
and solvents were purchased from Sigma Aldrich Chemical
Co. (Germany), including silver nitrate salt. Detailed synthesis and
characterization of the oligomer were reported in our previous publications.30 (link),33 (link)
Comprehensive Material Characterization
Comprehensive Catalyst Characterization
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