Duv 3700 uv vis nir spectrometer

Nanocrystals dispersed in hexane were dropped on Mo grid for TEM, HRTEM and HAADF investigation, which were performed on JEOL-2010F and JEM-ARM200F with an acceleration voltage of 200 KV. EDS was carried out on Inca Oxford equipped on JEOL-2010F. The specimen prepared by drop-casting on a Si substrate was characterized by PXRD, using a Philips X’Pert PRO SUPER X-ray diffractometer equipped with graphite monochromatized Cu Kλ radiation (λ = 1.54056 Å). The operation voltage and current were kept at 40 kV and 400 mA, respectively. The simulate WZ powder XRD pattern were obtained from Diamond 3.2. Raman spectra were recorded with a Renishaw System 2000 spectrometer using the 514 nm line of semiconductor lasers for excitation. UV-Vis-NIR spectroscopy of the polytypic nanocrystals dispersed in tetrachloroethylene were measured at room temperature using a DUV—3700 UV-vis-NIR spectrometer (Shimadzu). XPS was performed on an ESCA Lab MKII XPS using Mg Ka radiation exciting source.

The X-ray power diffraction (XRD) of obtained nanobelts were characterized by using a Philips X’Pert PRO SUPER X-ray diffractometer which was equipped with graphite monochromatized Cu Kα radiation (λ = 1.54056 Å). The operation voltage was kept at 40 KV, and the current was kept at 400 mA. Diamond 3.2 was used to simulate the wurtzite XRD patterns of CZIS and CZGS. Nanobelts dispersed in hexane were dropped on Mo grid for transmission electron microscope (TEM), high-resolution transmission electron microscope (HRTEM) and high-angle annular dark field scanning transmission electron microscopy (HAADF-STEM) investigation observation, which were characterized using JEM-ARM200F with an acceleration voltage of 200 KV. Energy dispersive X-ray spectrometer (EDS) with mapping and line-scan modes was carried out on Inca Oxford equipped on JRM-ARM200F. DUV-3700 UV–vis–NIR spectrometer (Shimadzu) was used to investigated the optical properties of the synthesized NBs. XPS was collected on an ESCALab MKII X-ray photoelectron spectrometer using Mg Ka radiation exciting source. Tapping-mode atomic force microscopy (AFM) images were performed using a DI Innova Multimode SPM platform.