FTIR spectra were recorded using a Nicolet 6700 spectrometer (Thermo Scientific, Waltham, MA, USA) equipped with an attenuated total reflectance accessory with a diamond crystal (Smart Orbit, Thermo Electron Corporation, Madison, WI, USA). Raman spectra were obtained using a micro-Raman system RM 1000 Renishaw (laser excitation line at 532 nm, Nd-YAG) in the range of 400–2000 cm−1. AFM images were obtained in tapping mode, with a 3D Multimode Nanoscope, using Tap-300G silicon cantilevels with a <10 nm tip radius and a ≈20–75 N/m force constant. Samples were deposited onto silicon wafers (P/Bor, single side polished) by drop casting from ethanol solutions. Scanning electron microscopy (SEM) images were recorded using a Jeol JSM 7401F field emission scanning electron microscope equipped with a gentle beam mode. Transmission electron micrographs were taken using a Philips C20 TEM instrument equipped with a Gatan GIF 200 energy filter for electron energy loss elemental mapping. For the sample preparation, a drop of oxCNTs@QPEIs aqueous solution (0.1 mg/mL) was casted on a PELCO® Formvar grid and was left to evaporate. Thermogravimetric analyses (TGA) were carried out on a Setaram SETSYS Evolution 17 system at a 5 °C/min heating rate under oxygen atmosphere. Elemental analysis (EA) was measured by a Perkin Elmer 240 CHN elemental analyzer.
240 chn elemental analyzer
Manufactured by PerkinElmer
The 240 CHN elemental analyzer is a laboratory instrument that determines the carbon, hydrogen, and nitrogen content in a variety of sample types. It operates by combusting the sample and analyzing the resulting gases.
Automatically generated - may contain errors
Lab products found in correlation
Jsm 7401f field emission scanning electron microscope, by JEOL (1 mentions)
Gif200 energy filter, by Ametek (1 mentions)
Nicolet 6700 spectrometer, by Thermo Fisher Scientific (1 mentions)
Merck kieselgel 60 f254 plates, by Merck Group (1 mentions)
F254 plate, by Merck Group (1 mentions)
Ftir spectrometer, by PerkinElmer (1 mentions)
Gemini spectrometer, by Agilent Technologies (1 mentions)
3 protocols using 240 chn elemental analyzer
1
Characterization of Oxidized Carbon Nanotubes with Quaternized Polyethyleneimine
2
Analytical Characterization of Organic Compounds
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Thin-layer chromatography monitored
the reactions performed on precoated Merck Kieselgel 60 F254 plates
(EMD Millipore Corporation, Billerica, MA, USA). A PerkinElmer 1420
spectrophotometer (Waltham, MA, USA) was used to record infrared spectra
at the Central Laboratory of Tanta University. The KBr disc technique
was used to obtain the spectra. The samples were mounted on a sample
holder with a big cavity after drying. The open capillary method was
used to estimate melting points, which were calculated using the Gallenkamp
melting point and reported uncorrected. Electron impact mass spectrometry
(EIMS) was used to measure mass spectra at 70 eV at Al-Azhar University’s
Regional Center for Mycology and Biotechnology. A PerkinElmer 240
CHN Elemental Analyzer was used to undertake elemental analysis of
substances at Cairo University’s Microanalytical Center. The 1H NMR spectra were recorded on a Bruker AC spectrometer (400
MHz) and 13C NMR (100 MHz at 25 °C in DMSO-d6 with tetramethylsilane as an internal standard.
The chemical shifts for 1H NMR are reported in ppm from
tetramethylsilane (0 ppm) or referenced to the solvent (DMSO-d6, δ2.50). Chemical shifts (δ) for 13C NMR spectra are referenced to the signals for residual
deuterated solvents (DMSO-d6, 37.5). Multiplicities
are reported by the following abbreviations: s (singlet), d (doublet),
m (multiplet).
the reactions performed on precoated Merck Kieselgel 60 F254 plates
(EMD Millipore Corporation, Billerica, MA, USA). A PerkinElmer 1420
spectrophotometer (Waltham, MA, USA) was used to record infrared spectra
at the Central Laboratory of Tanta University. The KBr disc technique
was used to obtain the spectra. The samples were mounted on a sample
holder with a big cavity after drying. The open capillary method was
used to estimate melting points, which were calculated using the Gallenkamp
melting point and reported uncorrected. Electron impact mass spectrometry
(EIMS) was used to measure mass spectra at 70 eV at Al-Azhar University’s
Regional Center for Mycology and Biotechnology. A PerkinElmer 240
CHN Elemental Analyzer was used to undertake elemental analysis of
substances at Cairo University’s Microanalytical Center. The 1H NMR spectra were recorded on a Bruker AC spectrometer (400
MHz) and 13C NMR (100 MHz at 25 °C in DMSO-d6 with tetramethylsilane as an internal standard.
The chemical shifts for 1H NMR are reported in ppm from
tetramethylsilane (0 ppm) or referenced to the solvent (DMSO-d6, δ2.50). Chemical shifts (δ) for 13C NMR spectra are referenced to the signals for residual
deuterated solvents (DMSO-d6, 37.5). Multiplicities
are reported by the following abbreviations: s (singlet), d (doublet),
m (multiplet).
3
Characterization of Organic Compounds
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Commercial grade reagents were used as supplied. Solvents except analytical reagent grade were dried and purified according to literature when necessary. Reaction progress and purity of the compounds were checked by thin-layer chromatography (TLC) on pre-coated silica gel F254 plates from Merck and were visualized either by exposure to UV light or dipping in 1% aqueous KMnO 4 solution. Silica gel chromatographic columns (60-120 mesh) were used for separations. All melting points are uncorrected and measured using Fisher-Johns apparatus. IR spectra were recorded as KBr disks on a Perkin-Elmer FT IR spectrometer. The 1 H NMR and 13 C NMR spectra were recorded on a Varian gemini spectrometer (300 MHz for 1 H and 75 MHz for 13 C). Chemical shifts are reported as δ ppm against TMS as internal reference and coupling constants (J) are reported in Hz units. Mass spectra were recorded on a VG micro mass 7070H spectrometer. Elemental analyses (C, H, N) determined by a Perkin-elmer 240 CHN elemental analyzer were within ±0.4% of theoretical.
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