Axis ultra dld 600 w

The morphology of the synthesized bMSNs, CeNP, bMSNs@Ce, and RVG29-bMSNs@Ce-1F12 was characterized by Tecnai G20 (FEI Ltd., NL), Nova Nano scanning electron microscopy (SEM) (FEI., NL) and SPM9700 atomic force microscope (AFM) (Shimadzu., Japan). Dynamic light scattering and Zeta potential were performed on a Zetasizer Nano ZS90 device (Malvern Instruments, UK). XRD was scanned by x’pert3 powder (PANalytical B.V., Holland). The element types and contents of bMSNs@Ce were analyzed by EDS (Sirion 200, EFI, Holland). The valence states of elements were analyzed by XPS (AXIS-ULTRA DLD-600 W, Kratos, Japan). Fourier transform infrared spectrometer (FT-IR) was scanned by Nicolet iS50R (Thermo Scientific, USA).

An optical microscope (DM4000M, Leica, Wetzlar, Germany), scanning electron microscope (SEM) (FEI NOVA NanoSEM 450), and transmission electron microscope (TEM) (FEI Titan G2 60–300) were used to characterize the Mo₂C crystals and Mo₂C—Gr heterostructure. A Raman spectrum was collected by a Raman spectroscopy (LabRAM HR800, He-Ne laser excitation at 532 nm). The X-ray diffraction patterns of Mo₂C were measured by X-ray diffraction (XRD, PANalytical B.V. X’pert PRO). A Newport 69,907 solar simulator and a Keithley 2600 SourceMeter were used for measuring the photovoltaic properties of the Mo₂C—Gr/Sb₂S_0.42Se_2.58/TiO₂/FTO device under the condition of AM 1.5. An oscilloscope (WaveAce 1012, WaveAce, New York, NY, USA) was used to measure the response and recovery time of the device. The current-time characteristics of the photodetector were measured by a low-temperature cryogenic probe station (CRX–6.5K, Lake Shore, Westerville, OH, USA), a semiconductor parameter analyzer (4200-SCS, Keithley, Cleveland, OH, USA) and a light source (LDLS, EQ-1500, Energetiq, Woburn, MA, USA). Nyquist curves and frequency-dependent impedance were measured by the electrochemical workstation (CHI 660E, Huachen, Shanghai, China). An ultraviolet photoelectron spectroscopy (AXIS-ULTRA DLD-600W, Kratos, Tokyo, Japan) was employed for the work function measurement.

The morphologies and microstructures of all samples were observed by field emission scanning electron microscopy (FESEM, Hitachi S4800, Japan) and transmission electron microscopy (TEM, FEI Tecnai^TM G² F30, USA) equipped with an energy dispersive X-ray spectroscopy (EDX, Oxford Instrument, UK). The phase components, elements and corresponding chemical states were detected by powder X-ray diffraction on a X-ray diffractometer (XRD, Philips X’Pert Pro MPD, the Netherlands) with Cu-Kα irradiation (λ = 1.54056 Å), high-resolution transmission electron microscopy (HRTEM), EDX and X-ray photoelectron spectroscopy (XPS, Kratos AXIS Ultra^DLD, 600 W, UK) with an monochrome Al-Kα probe beam. All the recorded XPS spectra were calibrated using C 1 s peak with the binding energy of 284.8 eV and were analyzed through Gaussian-fitting. A vibrating sample magnetometer (VSM, Lakeshore 7403, USA) was used to investigate the room temperature magnetic properties of the samples.