Sample morphology was determined by field emission scanning electron microscopy (FE-SEM Σigma, Carl Zeiss, Oberkochen, Germany) with an in lens detector at 10 kV. Previously, the samples were metalized with a 20 nm layer of Cr before measuring.
Fe sem σigma
Manufactured by Zeiss
Sourced in Germany
The FE-SEM Σigma is a field emission scanning electron microscope developed by Zeiss. It is designed to provide high-resolution imaging of a wide range of samples. The core function of the FE-SEM Σigma is to generate and focus a beam of electrons, which is then scanned across the surface of the sample, allowing for detailed analysis and imaging.
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Lab products found in correlation
4 protocols using fe sem σigma
1
FE-SEM Analysis of Metalized Samples
2
Morphological Analysis of TA-NC Samples
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Images of mTA, PM and dried TA-NC were taken with FE-SEM Σigma (ZEISS, Oberkochen, Germany). Powdered samples were deposited in an aluminum well and sprayed with chromium prior to morphological analysis. Magnification ranges between 500 and 10,000× were used.
3
Wheat Flour Microstructure Analysis
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The microstructure of wheat flour particles was studied using scanning electron microscopy (SEM). Samples were dehydrated with phosphate buffer (0.1 mol/L, pH=6.8), ethanol (30, 50, 70, 80 and 90%) and subjected to vacuum. The samples were sprinkled onto double-sided tape attached to the specimen stubs and coated with a thin layer of gold (30 nm thickness) through a cathodic spray coating system. For the observations, an electronic scanning microscope (FE-SEM Σigma, Carl Zeiss, Oberkochen, Germany) was used under high vacuum conditions (10-4 Pa) at an acceleration voltage of 3.00 kV. Images were obtained at 333× magnification.
4
Comprehensive Characterization of Cu2O@SDS Nanoparticles
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SEM images were obtained in LAMARX Laboratory, by using a FE-SEM Σigma analytical scanning electron microscope on a Carl Zeiss Sigma at an intensity of 5 kV, which was employed to observe the morphologies and distribution of the coated samples. The morphology of Cu2O@SDS NPs was observed by transmission electron microscopy (TEM) (Zeiss Leo 906-E electron microscope. Oberkochen, Germany). The crystal phases of Cu2O@SDS NPs were detected by X-ray diffraction (XRD, Philips-PW1800) and the surface elemental composition of the Cu2O@SDS NPs was investigated by X-ray photoelectron spectroscopy (XPS, Thermo Scientifics K-alfa).
Contact angles (CA) of the surface of fabrics were measured via the sessile drop method using a video contact angle (VCA) system. A 2 µL water droplet was placed on the fabric surface and stabilized for 0.6 s before the measurement. Four randomly selected spots were tested on each specimen, and the results from at least three similar specimens were averaged for each fabric sample.
The concentration of copper from Cu2O@SDS NPs incorporated into the chitosan matrix was determined by atomic absorption spectrophotometry (AAS, Thermo Fisher iCE 3000), according to the methods described previously by Turalija et al., 2015 (link).
Contact angles (CA) of the surface of fabrics were measured via the sessile drop method using a video contact angle (VCA) system. A 2 µL water droplet was placed on the fabric surface and stabilized for 0.6 s before the measurement. Four randomly selected spots were tested on each specimen, and the results from at least three similar specimens were averaged for each fabric sample.
The concentration of copper from Cu2O@SDS NPs incorporated into the chitosan matrix was determined by atomic absorption spectrophotometry (AAS, Thermo Fisher iCE 3000), according to the methods described previously by Turalija et al., 2015 (link).
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